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THN31 Secure Element version 1.0
2021-1-INF-4210
NXP Secure Smart Card Controller P60x080/052/040yVC(Y/Z/A)/yVG
NSCIB-CC-150453-CR2
name THN31 Secure Element version 1.0 NXP Secure Smart Card Controller P60x080/052/040yVC(Y/Z/A)/yVG
scheme ES NL
status active archived
not_valid_after 06.01.2029 21.02.2023
not_valid_before 06.01.2024 30.07.2019
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_Certificado.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC-19-150453.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_INF-4210.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CR]%20NSCIB-CC-150453-CR2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST-Lite]%20P60x080_052_040yVC-VG_v2_6.pdf
manufacturer Beijing TsingTeng MicroSystem Co.,Ltd. NXP Semiconductors Germany GmbH, Business Unit Security and Connectivity
manufacturer_web https://www.tsingtengms.com/sy https://www.nxp.com
security_level EAL5+, ALC_DVS.2, AVA_VAN.5 EAL6+, ALC_FLR.1, ASE_TSS.2
dgst 90e5b81740b63970 2b4c39283cbf3210
heuristics/cert_id 2021-1-INF-4210 NSCIB-CC-150453-CR2
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 1.0 052
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 06.01.2024
  • enhanced:
  • manufacturer: BEIJING TSINGTENG MICROSYSTEM CO.,LTD.
  • product: THN31 Secure Element version 1.0
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/1002-thn31-secure-element-version-1-0
heuristics/protection_profiles cf0f01bcd7be3e9c f6d23054061d72ba
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename 2021-01_Certificado.pdf CC-19-150453.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-19-150453: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-: 1
  • BSI:
    • BSI-PP-0035: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
  • EAL:
    • EAL6: 1
    • EAL6 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_FLR.1: 1
  • ASE:
    • ASE_TSS.2: 1
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
  • Riscure:
    • Riscure: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 894051
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
  • /CreationDate: D:20190730125036+01'00'
  • /Creator: C458-M
  • /ModDate: D:20190730125221+02'00'
  • /Producer: KONICA MINOLTA bizhub C458
  • /Title: C458-M&S19073012500
  • pdf_file_size_bytes: 198911
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2021-01_INF-4210.pdf [CR] NSCIB-CC-150453-CR2.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-150453-CR2
    • cert_item: NXP Secure Smart Card Controller P60x080/052/040yVC(Y/Z/A)/yVG
    • cert_lab: Riscure
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-S-0201-2022: 1
  • ES:
    • 2021-1-INF-4210- v2: 1
  • NL:
    • NSCIB-CC-150453-CR: 13
    • NSCIB-CC-150453-CR2: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL2: 2
    • EAL4: 2
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
  • ALC:
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_COP.1: 2
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ITT.1: 1
    • FDP_SDC.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 26
    • NXP Semiconductors: 17
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 6
  • Riscure:
    • Riscure: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 3
  • AES_competition:
    • AES:
      • AES: 3
  • DES:
    • 3DES:
      • Triple-DES: 2
    • DES:
      • DES: 1
pdf_data/report_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 4
pdf_data/report_keywords/hash_function
  • MD:
    • MD5:
      • MD5: 3
pdf_data/report_keywords/crypto_scheme
  • PKE:
    • PKE: 1
pdf_data/report_keywords/randomness
  • TRNG:
    • TRNG: 2
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 7
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • malfunction: 1
  • other:
    • JIL: 1
  • FI:
    • DFA: 1
    • fault injection: 2
  • SCA:
    • side channel: 2
  • other:
    • JIL: 2
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816: 4
  • PKCS:
    • PKCS #1: 1
  • ISO:
    • ISO/IEC 14443: 4
    • ISO/IEC 7816: 4
pdf_data/report_metadata
pdf_data/st_filename 2021-01_ST_lite.pdf [ST-Lite] P60x080_052_040yVC-VG_v2_6.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-17-150453: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL5: 4
    • EAL5 augmented: 2
    • EAL5+: 31
  • EAL:
    • EAL 6: 2
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL6: 36
    • EAL6 augmented: 3
    • EAL6+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 3
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 6
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.2: 4
    • ADV_INT.3: 1
    • ADV_SPM: 2
    • ADV_SPM.1: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 4
    • ALC_CMC.4: 3
    • ALC_CMC.5: 4
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.1: 5
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.3: 4
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 5
    • FCS_COP.1: 17
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 7
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_IFC.1: 5
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 7
    • FDP_SDC.1: 6
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
  • FPT:
    • FPT_FLS.1: 7
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 7
    • FPT_PHP.3: 7
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 8
  • FAU:
    • FAU_SAS.1: 7
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 3
    • FCS_COP.1: 23
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 9
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 35
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 32
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_FLS.1: 1
    • FDP_IFC.1: 10
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
    • FDP_SDI.1: 1
    • FDP_SDI.2: 7
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 4
    • FMT_MSA.1: 25
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 20
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 19
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 7
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
    • O.RSA-CRT: 6
    • O.TDES: 8
  • T:
    • T.RND: 2
  • O:
    • O.CUST_RECONFIG: 5
    • O.EEPROM_INTEGRITY: 5
    • O.FM_FW: 9
    • O.HW_AES: 7
    • O.MEM_ACCESS: 9
    • O.RND: 3
    • O.SFR_ACCESS: 9
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 132
    • NXP Semiconductors: 45
  • Philips:
    • Philips: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 29
      • Triple-DES: 4
    • DES:
      • DES: 1
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 16
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 30
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/crypto_scheme
  • PKE:
    • PKE: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 6
  • TRNG:
    • TRNG: 3
  • RNG:
    • RND: 5
    • RNG: 14
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 4
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 1
    • SmartMX2: 19
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 7
    • malfunction: 3
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 4
  • FI:
    • Malfunction: 10
    • fault injection: 3
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 13
    • Physical Probing: 2
    • physical probing: 1
    • side channel: 1
    • timing attacks: 2
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 7816: 6
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2012-09-004: 1
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 22
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 22
    • ISO/IEC 7816-3: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • on a single die. The THN31 secure element is in the scope of the TOE while the NFC controller is out of scope of the TOE. THN31 secure element (TOE) NFC controller The TOE is a secure element with two crypto: 1
    • out of scope: 1
pdf_data/st_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 754154
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 29
  • /Author: NXP Semiconductors
  • /CreationDate: D:20190723160236+01'00'
  • /Creator: Microsoft® Word for Office 365
  • /Keywords: CC Security Evaluation, Security Target, Functional Requirements, Security Functionality, Assurance Level EAL6+
  • /ModDate: D:20190723160236+01'00'
  • /Producer: Microsoft® Word for Office 365
  • /Subject: P60x080/052/040PVC(Y/Z/A)/PVG
  • /Title: Security Target
  • pdf_file_size_bytes: 1126827
  • pdf_hyperlinks: http://www.nxp.com/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 91
state/cert/convert_garbage False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different