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CEITEC ePassport Module, CTC21001, v1.0 (supporting EAC)
SERTIT-080 		NXP Secure PKI Smart Card Controllers P5CD128V0v/ V0B(s), P5CC128V0v/ V0B(s), P5CD145V0v/ V0B(s), P5CC145V0v/ V0B(s), P5CN145V0v/V0B(s), each including IC Dedicated Software
BSI-DSZ-CC-0858-2013
name CEITEC ePassport Module, CTC21001, v1.0 (supporting EAC) NXP Secure PKI Smart Card Controllers P5CD128V0v/ V0B(s), P5CC128V0v/ V0B(s), P5CD145V0v/ V0B(s), P5CC145V0v/ V0B(s), P5CN145V0v/V0B(s), each including IC Dedicated Software
scheme NO DE
not_valid_after 17.01.2022 01.09.2019
not_valid_before 17.01.2017 12.06.2013
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/20170117%20S-080%20CR%20Ceitec%20EAC.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0858a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[STlite-EAC]%20CEITECSA%205.410.052%20-%20ST-Lite%20ePassport%20Module%20EAC%202.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0858b_pdf.pdf
manufacturer CEITEC S.A. NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.ceitec-sa.com https://www.nxp.com
security_level EAL4+, ALC_DVS.2, AVA_VAN.5 ALC_DVS.2, EAL5+, ASE_TSS.2, AVA_VAN.5
dgst 8856518b423e12c4 599718493fd9fb1f
heuristics/cert_id SERTIT-080 BSI-DSZ-CC-0858-2013
heuristics/cert_lab [] BSI
heuristics/direct_transitive_cves {} CVE-2021-3011
heuristics/indirect_transitive_cves {} CVE-2021-3011
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ADV_FSP.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 1.0 -
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0858-V2-2015, BSI-DSZ-CC-0867-2014, BSI-DSZ-CC-0866-2013, BSI-DSZ-CC-0914-2014, BSI-DSZ-CC-0750-V2-2014, BSI-DSZ-CC-0913-2014, BSI-DSZ-CC-0912-2014, BSI-DSZ-CC-0866-V2-2014, NSCIB-CC-13-37760-CR2, BSI-DSZ-CC-0911-2014
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0645-2010
heuristics/report_references/indirectly_referenced_by {} BSI-DSZ-CC-0858-V2-2015, OCSI/CERT/CCL/09/2022/RC, BSI-DSZ-CC-0913-2014, NSCIB-CC-13-37760-CR2, OCSI/CERT/SYS/05/2016/RC, OCSI/CERT/CCL/05/2021/RC, OCSI/CERT/SYS/03/2016/RC, BSI-DSZ-CC-0914-2014, BSI-DSZ-CC-0750-V2-2014, BSI-DSZ-CC-0912-2014, OCSI/CERT/SYS/04/2015/RC, BSI-DSZ-CC-0911-2014, BSI-DSZ-CC-0867-2014, BSI-DSZ-CC-0866-2013, OCSI/CERT/SYS/02/2016/RC, BSI-DSZ-CC-0866-V2-2014, OCSI/CERT/SYS/05/2015/RC, OCSI/CERT/CCL/06/2021/RC, OCSI/CERT/SYS/06/2016/RC
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0645-2010
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 17.01.2017
  • developer: CEITEC S.A.
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-080
    • certification_date: 17.01.2017
    • description: The TOE is an electronic module for machine readable travel documents (MRTDs) based on the requirements of the International Civil Aviation Organization, as defined in ICAO Doc 9303. The TOE is developed and produced by CEITEC and delivered to the passport manufacturer as micro modules. The TOE contains at the physical level: Integrated circuit chip; IC Software; data necessary to enable the MRTD personalization; the associated guidance documentation. The TOE also provides the security functions: integrity and confidentiality of personal data; access control, identification and authentication; protection against abuse of functionality, information leakage, physical tampering, malfunctions.
    • developer: CEITEC S.A.
    • documents: frozendict({'cert': [frozendict({'href': 'https://sertit.no/getfile.php/135163-1607953148/SERTIT/Sertifikater/2017/80/20170117%20Sertit-080%20C.pdf'})], 'target': [frozendict({'href': 'https://sertit.no/getfile.php/135166-1607953151/SERTIT/Sertifikater/2017/80/%5BSTlite-EAC%5D%20CEITECSA%205.410.052%20-%20ST-Lite%20ePassport%20Module%20EAC%202.0.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/135160-1607953146/SERTIT/Sertifikater/2017/80/20170117%20S-080%20CR%20Ceitec%20EAC.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • level: EAL 4, ALC_DVS.2, AVA_VAN.5
    • mutual_recognition: CCRA, SOG-IS
    • product: 1.0
    • protection_profile: BSI-CC-PP-0056, "Machine Readable Travel Document with 'ICAO Application', Extended Access Control"
    • sponsor: CEITEC S.A.
  • product: CEITEC ePassport Module CTC21001
  • url: https://sertit.no/certified-products/product-archive/ceitec-epassport-module-ctc21001
heuristics/st_references/directly_referenced_by {} BSI-DSZ-CC-0867-2014, BSI-DSZ-CC-0866-2013, BSI-DSZ-CC-0914-2014, BSI-DSZ-CC-0913-2014, BSI-DSZ-CC-0912-2014, BSI-DSZ-CC-0866-V2-2014, BSI-DSZ-CC-0911-2014
heuristics/st_references/indirectly_referenced_by {} BSI-DSZ-CC-0867-2014, BSI-DSZ-CC-0866-2013, BSI-DSZ-CC-0914-2014, BSI-DSZ-CC-0913-2014, BSI-DSZ-CC-0912-2014, BSI-DSZ-CC-0866-V2-2014, BSI-DSZ-CC-0911-2014
heuristics/protection_profiles a33327d40f253f46 f6d23054061d72ba
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0056_V2b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename 20170117 S-080 CR Ceitec EAC.pdf 0858a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0858-2013
    • cert_item: NXP Secure PKI Smart Card Controllers P5CD128V0v/ V0B(s), P5CC128V0v/ V0B(s), P5CD145V0v/ V0B(s), P5CC145V0v/ V0B(s), P5CN145V0v/V0B(s), each including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-080: 19
  • DE:
    • BSI-DSZ-CC-0645-2010: 3
    • BSI-DSZ-CC-0858: 1
    • BSI-DSZ-CC-0858-2013: 23
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0056: 1
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 2
    • EAL 4+: 19
    • EAL1: 1
    • EAL4: 1
    • EAL7: 1
  • EAL:
    • EAL 4: 3
    • EAL 5: 7
    • EAL 5 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP: 4
    • FCS_RND.1: 4
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_UCT.1: 1
    • FDP_UIT.1: 1
  • FIA:
    • FIA_API.1: 4
    • FIA_UAU.1: 1
    • FIA_UAU.4: 1
    • FIA_UAU.5: 1
    • FIA_UAU.6: 1
    • FIA_UID.1: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
    • FMT_MTD: 8
    • FMT_MTD.3: 1
    • FMT_SMF.1: 1
    • FMT_SMR.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 4
  • R:
    • R.O: 4
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 21
    • NXP Semiconductors: 29
  • Philips:
    • Philips: 5
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • other:
    • JIL: 1
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
    • side channel: 2
  • other:
    • JIL: 4
    • reverse engineering: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ICAO:
    • ICAO: 4
  • ISO:
    • ISO/IEC 15408: 2
  • BSI:
    • AIS 25: 3
    • AIS 26: 1
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
    • AIS36: 1
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 2
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • Business Unit Identification, Rev. 2.0, April 26th, 2013 (confidential document) 8 specifically • AIS 25, Version 7, Anwendung der CC auf Integrierte Schaltungen including JIL: 1
    • P5Cx128/P5Cx145 V0v/ V0B(s) Security Target, NXP Semiconductors, Business Unit Identification (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • Report, Version 1.5, 10 May 2013, Evaluation Technical Report BSI-DSZ-CC-0858, T-Systems GEI GmbH, (confidential document) [10] ETR for composite evaluation according to AIS 36, Version 1.0, 22 April 2013, ETR for: 1
    • according to AIS36 as summary of the Evaluation Technical Report, T-Systems GEI GmbH (confidential document) [11] Configuration lists for the TOE: • Configuration List P5Cx128/P5Cx145 V0v/ V0B(s), NXP: 1
pdf_data/report_metadata
  • /AAPL:Keywords: ['ugradert']
  • /Author: Kjaertan
  • /CreationDate: D:20170118113117Z00'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: ugradert
  • /ModDate: D:20170118113117Z00'00'
  • /Producer: Mac OS X 10.12.2 Quartz PDFContext
  • /Title: tittel
  • pdf_file_size_bytes: 650258
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20130625154417+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Smartcard"
  • /ModDate: D:20130625154905+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0858-2013
  • pdf_file_size_bytes: 1023773
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
pdf_data/st_filename [STlite-EAC] CEITECSA 5.410.052 - ST-Lite ePassport Module EAC 2.0.pdf 0858b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0858: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0056: 7
    • BSI-PP-0056: 1
    • BSI-PP-CC-0056: 1
  • BSI:
    • BSI-PP- 0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 8
    • EAL4 augmented: 2
  • EAL:
    • EAL 5: 3
    • EAL 5 augmented: 1
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL5: 32
    • EAL5+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.2: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_DVS.2: 5
  • APE:
    • APE_SRE: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_SAS: 6
    • FAU_SAS.1: 11
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM.1: 26
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 2
    • FCS_CKM.4: 22
    • FCS_CKM.4.1: 1
    • FCS_COP: 36
    • FCS_COP.1: 7
    • FCS_RND: 7
    • FCS_RND.1: 11
    • FCS_RND.1.1: 2
  • FDP:
    • FDP_ACC.1: 20
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 13
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 4
    • FDP_ITC: 1
    • FDP_ITC.1: 10
    • FDP_ITC.2: 10
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 7
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FIA:
    • FIA_API: 6
    • FIA_API.1: 10
    • FIA_API.1.1: 2
    • FIA_SOS.2: 1
    • FIA_UAU.1: 9
    • FIA_UAU.1.1: 1
    • FIA_UAU.1.2: 1
    • FIA_UAU.4: 8
    • FIA_UAU.4.1: 1
    • FIA_UAU.5: 9
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UAU.6: 10
    • FIA_UAU.6.1: 1
    • FIA_UID.1: 15
    • FIA_UID.1.1: 1
    • FIA_UID.1.2: 1
  • FMT:
    • FMT_LIM: 7
    • FMT_LIM.1: 21
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 18
    • FMT_LIM.2.1: 2
    • FMT_MSA.1: 1
    • FMT_MSA.3: 3
    • FMT_MTD: 46
    • FMT_MTD.1: 11
    • FMT_MTD.3: 4
    • FMT_MTD.3.1: 1
    • FMT_SMF.1: 34
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 38
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_FLS.1: 9
    • FPT_FLS.1.1: 1
    • FPT_PHP.3: 10
    • FPT_PHP.3.1: 1
    • FPT_TST: 1
    • FPT_TST.1: 9
    • FPT_TST.1.1: 1
    • FPT_TST.1.2: 1
    • FPT_TST.1.3: 1
  • FTP:
    • FTP_ITC.1: 5
    • FTP_TRP.1: 5
  • FAU:
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 3
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 4
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 33
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 30
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 10
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 25
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 18
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 7
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • OE:
    • OE.BAC-PP: 2
    • OE.BAC_PP: 1
    • OE.MRTD_: 2
  • O:
    • O.HW_AES: 7
    • O.MEM_ACCESS: 9
    • O.MF_FW: 7
    • O.RND: 3
    • O.SFR_ACCESS: 7
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 100
    • NXP Semiconductors: 28
  • Philips:
    • Philips: 3
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • 3DES:
      • 3DES: 1
      • Triple-DES: 2
    • DES:
      • DES: 2
  • AES_competition:
    • AES:
      • AES: 33
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 26
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECDH:
      • ECDH: 1
  • FF:
    • DH:
      • Diffie-Hellman: 5
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 7
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
    • Physical Tampering: 7
    • Physical tampering: 1
    • fault injection: 1
    • malfunction: 6
    • physical tampering: 5
  • SCA:
    • DPA: 3
    • SPA: 2
    • physical probing: 3
    • timing attacks: 1
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 10
    • fault injection: 5
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 13
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI 1: 1
pdf_data/st_keywords/ic_data_group
  • EF:
    • EF.COM: 10
    • EF.DG1: 20
    • EF.DG13: 2
    • EF.DG14: 7
    • EF.DG16: 17
    • EF.DG2: 7
    • EF.DG3: 20
    • EF.DG4: 18
    • EF.DG5: 5
    • EF.SOD: 10
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 180-2: 1
    • FIPS 180-411: 1
  • ICAO:
    • ICAO: 9
  • PKCS:
    • PKCS#3: 2
    • PKCS#34: 1
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 14
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 10
pdf_data/st_metadata
  • /Author: Marcos Kordyas Dossa
  • /CreationDate: D:20161212160233-02'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20161212160233-02'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 1330959
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 71
  • /Author: NXP Semiconductors
  • /CreationDate: D:20121119165646+01'00'
  • /Creator: Acrobat PDFMaker 9.1 for Word
  • /Keywords: CC; Security Evaluation; Security Target Lite; Functional Requirements; Security Functionality; Assurance Level; P5Cx128/P5Cx145 V0v/ V0B(s); P5CD145; P5CD128; P5CC145; P5CC128; P5CN145; MIFARE MSO; MIFARE FleX™
  • /ModDate: D:20121119170042+01'00'
  • /Producer: Adobe PDF Library 9.0
  • /Subject: Security Target Lite
  • /Title: Security Target Lite P5Cx128/P5Cx145 V0v/ V0B(s)
  • pdf_file_size_bytes: 616053
  • pdf_hyperlinks: mailto:[email protected], https://extranet.nxp.com/, http://www.nxp.com/
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 74
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