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CEITEC ePassport Module, CTC21001, v1.0 (supporting EAC)
SERTIT-080 		S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
BSI-DSZ-CC-0910-2016
name CEITEC ePassport Module, CTC21001, v1.0 (supporting EAC) S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
scheme NO DE
not_valid_after 17.01.2022 30.11.2021
not_valid_before 17.01.2017 30.11.2016
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/20170117%20S-080%20CR%20Ceitec%20EAC.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[STlite-EAC]%20CEITECSA%205.410.052%20-%20ST-Lite%20ePassport%20Module%20EAC%202.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910b_pdf.pdf
manufacturer CEITEC S.A. Samsung Electronics Co., Ltd.
manufacturer_web https://www.ceitec-sa.com https://www.samsung.com
security_level EAL4+, ALC_DVS.2, AVA_VAN.5 ALC_DVS.2, EAL5+, AVA_VAN.5
dgst 8856518b423e12c4 444c4b57afd7eb38
heuristics/cert_id SERTIT-080 BSI-DSZ-CC-0910-2016
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ADV_FSP.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 1.0 1.01
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 17.01.2017
  • developer: CEITEC S.A.
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-080
    • certification_date: 17.01.2017
    • description: The TOE is an electronic module for machine readable travel documents (MRTDs) based on the requirements of the International Civil Aviation Organization, as defined in ICAO Doc 9303. The TOE is developed and produced by CEITEC and delivered to the passport manufacturer as micro modules. The TOE contains at the physical level: Integrated circuit chip; IC Software; data necessary to enable the MRTD personalization; the associated guidance documentation. The TOE also provides the security functions: integrity and confidentiality of personal data; access control, identification and authentication; protection against abuse of functionality, information leakage, physical tampering, malfunctions.
    • developer: CEITEC S.A.
    • documents: frozendict({'cert': [frozendict({'href': 'https://sertit.no/getfile.php/135163-1607953148/SERTIT/Sertifikater/2017/80/20170117%20Sertit-080%20C.pdf'})], 'target': [frozendict({'href': 'https://sertit.no/getfile.php/135166-1607953151/SERTIT/Sertifikater/2017/80/%5BSTlite-EAC%5D%20CEITECSA%205.410.052%20-%20ST-Lite%20ePassport%20Module%20EAC%202.0.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/135160-1607953146/SERTIT/Sertifikater/2017/80/20170117%20S-080%20CR%20Ceitec%20EAC.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • level: EAL 4, ALC_DVS.2, AVA_VAN.5
    • mutual_recognition: CCRA, SOG-IS
    • product: 1.0
    • protection_profile: BSI-CC-PP-0056, "Machine Readable Travel Document with 'ICAO Application', Extended Access Control"
    • sponsor: CEITEC S.A.
  • product: CEITEC ePassport Module CTC21001
  • url: https://sertit.no/certified-products/product-archive/ceitec-epassport-module-ctc21001
heuristics/protection_profiles a33327d40f253f46 f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0056_V2b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename 20170117 S-080 CR Ceitec EAC.pdf 0910a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cc_security_level: Common Criteria Part 3 conformant EAL 5 augmented by ALC_DVS.2 and AVA_VAN.5
    • cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended
    • cert_id: BSI-DSZ-CC-0910-2016
    • cert_item: S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
    • ref_protection_profiles: Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-080: 19
  • DE:
    • BSI-DSZ-CC-0910-2016: 22
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0056: 1
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 2
    • EAL 4+: 19
    • EAL1: 1
    • EAL4: 1
    • EAL7: 1
  • EAL:
    • EAL 1: 7
    • EAL 2: 4
    • EAL 3: 4
    • EAL 4: 9
    • EAL 5: 13
    • EAL 5 augmented: 3
    • EAL 5+: 1
    • EAL 6: 4
    • EAL 7: 4
    • EAL5: 1
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 3
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 2
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 2
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP: 4
    • FCS_RND.1: 4
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_UCT.1: 1
    • FDP_UIT.1: 1
  • FIA:
    • FIA_API.1: 4
    • FIA_UAU.1: 1
    • FIA_UAU.4: 1
    • FIA_UAU.5: 1
    • FIA_UAU.6: 1
    • FIA_UID.1: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
    • FMT_MTD: 8
    • FMT_MTD.3: 1
    • FMT_SMF.1: 1
    • FMT_SMR.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 1
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 20
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • TUV:
    • TÜV Informationstechnik: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 1
    • DES:
      • DES: 1
  • constructions:
    • MAC:
      • HMAC: 2
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 19
    • ECDH:
      • ECDH: 2
    • ECDSA:
      • ECDSA: 3
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
      • SHA1: 1
    • SHA2:
      • SHA-2: 2
      • SHA224: 1
      • SHA256: 1
      • SHA384: 1
      • SHA512: 1
pdf_data/report_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • DTRNG: 8
pdf_data/report_keywords/cipher_mode
  • ECB:
    • ECB: 2
pdf_data/report_keywords/ecc_curve
  • NIST:
    • P-192: 6
    • P-224: 6
    • P-256: 6
    • P-384: 6
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • other:
    • JIL: 1
  • SCA:
    • DPA: 2
    • SPA: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ICAO:
    • ICAO: 4
  • ISO:
    • ISO/IEC 15408: 2
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 4
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 37: 1
    • AIS31: 3
  • FIPS:
    • FIPS 180-3: 2
    • FIPS 186-4: 1
    • FIPS PUB 180-3: 1
    • FIPS PUB 186-4: 1
    • FIPS180-3: 4
    • FIPS186-4: 6
    • FIPS197: 3
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
  • RFC:
    • RFC5639: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • TÜV Informationstechnik GmbH, (confidential document) [8] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [9: 1
    • / S3FV5RK / S3FV5RJ / S3FV5RH Revision 0, version 6, 2016-11-21, TÜV Informationstechnik GmbH. (confidential document) [11] Tornado-E ECC Library API Manual, Version 0.21, 2015-10-13, Samsung Electronics [12] HW DTRNG: 1
    • ECC Library including specific IC Dedicated Software, Version 3.2, 2016-10-07, Samsung Electronics (confidential document) [7] Evaluation Technical Report, Version 6, 2016-11-21, Evaluation Ttechnical Report Summary (ETR: 1
    • being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1
pdf_data/report_metadata
  • /AAPL:Keywords: ['ugradert']
  • /Author: Kjaertan
  • /CreationDate: D:20170118113117Z00'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: ugradert
  • /ModDate: D:20170118113117Z00'00'
  • /Producer: Mac OS X 10.12.2 Quartz PDFContext
  • /Title: tittel
  • pdf_file_size_bytes: 650258
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
pdf_data/st_filename [STlite-EAC] CEITECSA 5.410.052 - ST-Lite ePassport Module EAC 2.0.pdf 0910b_pdf.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0056: 7
    • BSI-PP-0056: 1
    • BSI-PP-CC-0056: 1
  • BSI:
    • BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 8
    • EAL4 augmented: 2
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.2: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_DVS.2: 5
  • APE:
    • APE_SRE: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.4: 2
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 8
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_SAS: 6
    • FAU_SAS.1: 11
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM.1: 26
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 2
    • FCS_CKM.4: 22
    • FCS_CKM.4.1: 1
    • FCS_COP: 36
    • FCS_COP.1: 7
    • FCS_RND: 7
    • FCS_RND.1: 11
    • FCS_RND.1.1: 2
  • FDP:
    • FDP_ACC.1: 20
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 13
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 4
    • FDP_ITC: 1
    • FDP_ITC.1: 10
    • FDP_ITC.2: 10
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 7
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FIA:
    • FIA_API: 6
    • FIA_API.1: 10
    • FIA_API.1.1: 2
    • FIA_SOS.2: 1
    • FIA_UAU.1: 9
    • FIA_UAU.1.1: 1
    • FIA_UAU.1.2: 1
    • FIA_UAU.4: 8
    • FIA_UAU.4.1: 1
    • FIA_UAU.5: 9
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UAU.6: 10
    • FIA_UAU.6.1: 1
    • FIA_UID.1: 15
    • FIA_UID.1.1: 1
    • FIA_UID.1.2: 1
  • FMT:
    • FMT_LIM: 7
    • FMT_LIM.1: 21
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 18
    • FMT_LIM.2.1: 2
    • FMT_MSA.1: 1
    • FMT_MSA.3: 3
    • FMT_MTD: 46
    • FMT_MTD.1: 11
    • FMT_MTD.3: 4
    • FMT_MTD.3.1: 1
    • FMT_SMF.1: 34
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 38
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_FLS.1: 9
    • FPT_FLS.1.1: 1
    • FPT_PHP.3: 10
    • FPT_PHP.3.1: 1
    • FPT_TST: 1
    • FPT_TST.1: 9
    • FPT_TST.1.1: 1
    • FPT_TST.1.2: 1
    • FPT_TST.1.3: 1
  • FTP:
    • FTP_ITC.1: 5
    • FTP_TRP.1: 5
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM: 5
    • FCS_CKM.1: 23
    • FCS_CKM.2: 2
    • FCS_CKM.4: 11
    • FCS_COP: 27
    • FCS_COP.1: 22
    • FCS_RNG: 6
    • FCS_RNG.1: 12
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 10
    • FDP_ACC.1: 8
    • FDP_ACF: 8
    • FDP_ACF.1: 10
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 9
    • FDP_ITC.2: 9
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_CKM.4: 1
    • FMT_LIM: 20
    • FMT_LIM.1: 28
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 32
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 9
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • OE:
    • OE.BAC-PP: 2
    • OE.BAC_PP: 1
    • OE.MRTD_: 2
  • O:
    • O.MEM_ACCESS: 1
    • O.RND: 6
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 2
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • 3DES:
      • 3DES: 1
      • Triple-DES: 2
    • DES:
      • DES: 2
  • AES_competition:
    • AES:
      • AES: 16
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 9
  • LWC_competition:
    • ASCON:
      • ASCON: 1
  • constructions:
    • MAC:
      • HMAC: 7
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECDH:
      • ECDH: 1
  • FF:
    • DH:
      • Diffie-Hellman: 5
  • ECC:
    • ECC:
      • ECC: 58
    • ECDH:
      • ECDH: 7
    • ECDSA:
      • ECDSA: 14
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
  • SHA:
    • SHA1:
      • SHA-1: 5
      • SHA1: 3
    • SHA2:
      • SHA-2: 1
      • SHA-224: 3
      • SHA-256: 3
      • SHA-384: 2
      • SHA-512: 3
      • SHA224: 6
      • SHA256: 6
      • SHA384: 6
      • SHA512: 5
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
  • KA:
    • Key Agreement: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 11
    • RNG: 8
  • TRNG:
    • DTRNG: 28
    • TRNG: 4
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • CTR:
    • CTR: 5
  • ECB:
    • ECB: 11
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP192t1: 4
    • brainpoolP224r1: 4
    • brainpoolP224t1: 4
    • brainpoolP256r1: 4
    • brainpoolP256t1: 4
    • brainpoolP320r1: 4
    • brainpoolP320t1: 4
    • brainpoolP384r1: 4
    • brainpoolP384t1: 4
    • brainpoolP512r1: 4
    • brainpoolP512t1: 4
  • NIST:
    • P-192: 8
    • P-224: 8
    • P-256: 8
    • P-384: 8
    • P-521: 8
    • secp192k1: 4
    • secp192r1: 4
    • secp224k1: 4
    • secp224r1: 4
    • secp256k1: 4
    • secp256r1: 4
    • secp384r1: 4
    • secp521r1: 4
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
    • Physical Tampering: 7
    • Physical tampering: 1
    • fault injection: 1
    • malfunction: 6
    • physical tampering: 5
  • SCA:
    • DPA: 3
    • SPA: 2
    • physical probing: 3
    • timing attacks: 1
  • other:
    • reverse engineering: 1
  • FI:
    • DFA: 2
    • Malfunction: 27
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 7
    • Leak-Inherent: 23
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 5
    • physical probing: 9
    • side channel: 2
    • side-channel: 1
    • timing attack: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 2
pdf_data/st_keywords/ic_data_group
  • EF:
    • EF.COM: 10
    • EF.DG1: 20
    • EF.DG13: 2
    • EF.DG14: 7
    • EF.DG16: 17
    • EF.DG2: 7
    • EF.DG3: 20
    • EF.DG4: 18
    • EF.DG5: 5
    • EF.SOD: 10
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 180-2: 1
    • FIPS 180-411: 1
  • ICAO:
    • ICAO: 9
  • PKCS:
    • PKCS#3: 2
    • PKCS#34: 1
  • BSI:
    • AIS 31: 1
    • AIS31: 1
  • CC:
    • CCMB-2012-09-001: 3
    • CCMB-2012-09-002: 3
    • CCMB-2012-09-003: 3
    • CCMB-2012-09-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS PUB 180-3: 6
    • FIPS197: 1
pdf_data/st_metadata
  • /Author: Marcos Kordyas Dossa
  • /CreationDate: D:20161212160233-02'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20161212160233-02'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 1330959
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 71
  • /Author: Sunggeun Park
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Company: SAMSUNG
  • /CreationDate: D:20161122184902+09'00'
  • /Creator: Word용 Acrobat PDFMaker 10.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /Keywords: ST Lite; S3FV5RP; S3FV5RK; S3FV5RJ; S3FV5RH
  • /ModDate: D:20170201195503+09'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Adobe PDF Library 10.0
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20161122094808
  • /Subject: ST Lite of S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Technologie: 0,22 µm
  • /Title: Security Target of Samsung S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_file_size_bytes: 1425901
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 71
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