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BMC Atrium® Discovery and Dependency Mapping 10.0 383-4-259 |
ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 CSA_CC_21006 |
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name | BMC Atrium® Discovery and Dependency Mapping 10.0 | ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 |
category | Other Devices and Systems | Boundary Protection Devices and Systems |
scheme | CA | SG |
status | archived | active |
not_valid_after | 10.02.2020 | 08.07.2027 |
not_valid_before | 10.02.2015 | 08.07.2022 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/383-4-259CT%20v1.0e.docx | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/383-4-259%20CR%20v1.1.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/383-4-259%20ST%20v12.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf |
manufacturer | BMC Software, Inc. | ST Engineering Electronics |
manufacturer_web | https://www.bmc.com/ | https://www.stengg.com |
security_level | EAL2+, ALC_FLR.2 | EAL4+, AVA_VAN.5 |
dgst | 86e19de07e49d48a | 1dab1c190f3b92d2 |
heuristics/cert_id | 383-4-259 | CSA_CC_21006 |
heuristics/cert_lab | CANADA | [] |
heuristics/extracted_sars | ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ALC_FLR.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1 | ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 |
heuristics/extracted_versions | 10.0 | 2.2.1055 |
pdf_data/cert_filename | 383-4-259CT v1.0e.docx | [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf |
pdf_data/cert_keywords/cc_cert_id |
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pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
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pdf_data/cert_keywords/cc_sar |
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pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
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pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
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pdf_data/report_filename | 383-4-259 CR v1.1.pdf | [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf |
pdf_data/report_frontpage |
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pdf_data/report_keywords/cc_cert_id |
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pdf_data/report_keywords/cc_security_level |
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pdf_data/report_keywords/cc_sar |
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pdf_data/report_keywords/cc_claims |
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pdf_data/report_keywords/eval_facility |
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pdf_data/report_keywords/crypto_library |
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pdf_data/report_keywords/side_channel_analysis |
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pdf_data/report_keywords/standard_id |
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pdf_data/report_metadata |
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pdf_data/st_filename | 383-4-259 ST v12.pdf | [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf |
pdf_data/st_keywords/cc_security_level |
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pdf_data/st_keywords/cc_sar |
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pdf_data/st_keywords/cc_sfr |
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pdf_data/st_keywords/cc_claims |
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pdf_data/st_keywords/vendor |
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pdf_data/st_keywords/symmetric_crypto |
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pdf_data/st_keywords/asymmetric_crypto |
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pdf_data/st_keywords/hash_function |
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pdf_data/st_keywords/crypto_scheme |
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pdf_data/st_keywords/crypto_protocol |
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pdf_data/st_keywords/randomness |
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pdf_data/st_keywords/cipher_mode |
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pdf_data/st_keywords/tls_cipher_suite |
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pdf_data/st_keywords/crypto_library |
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pdf_data/st_keywords/standard_id |
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pdf_data/st_metadata |
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state/cert/convert_ok | False | True |
state/cert/extract_ok | False | True |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |