This page was not yet optimized for use on mobile devices.
Comparing certificates Experimental feature
You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.
Huawei 3900 Series LTE eNodeB Access Control Software version V100R008C01SPC820 2014-45-INF-1417 |
ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 CSA_CC_21006 |
|
---|---|---|
name | Huawei 3900 Series LTE eNodeB Access Control Software version V100R008C01SPC820 | ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 |
category | Network and Network-Related Devices and Systems | Boundary Protection Devices and Systems |
scheme | ES | SG |
status | archived | active |
not_valid_after | 06.03.2020 | 08.07.2027 |
not_valid_before | 06.03.2015 | 08.07.2022 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf | |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2014-45-INF-1417.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Security%20Target%20of%20Huawei%203900%20Series%20LTE%20eNodeB%20Access%20Control%20Software%20v3.0.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf |
manufacturer | Huawei Technologies Co. Ltd. | ST Engineering Electronics |
manufacturer_web | https://www.huawei.com | https://www.stengg.com |
security_level | EAL4+, ALC_FLR.1 | EAL4+, AVA_VAN.5 |
dgst | 83c9168e8eee79d3 | 1dab1c190f3b92d2 |
heuristics/cert_id | 2014-45-INF-1417 | CSA_CC_21006 |
heuristics/extracted_sars | ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ALC_FLR.1, ALC_TAT.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 | ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 |
heuristics/extracted_versions | 3900 | 2.2.1055 |
pdf_data/cert_filename | [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf | |
pdf_data/cert_keywords/cc_cert_id |
|
|
pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
|
|
pdf_data/cert_keywords/cc_sar |
|
|
pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
|
|
pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
|
|
pdf_data/report_filename | 2014-45-INF-1417.pdf | [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf |
pdf_data/report_keywords/cc_cert_id |
|
|
pdf_data/report_keywords/cc_security_level |
|
|
pdf_data/report_keywords/cc_sar |
|
|
pdf_data/report_keywords/cc_sfr |
|
|
pdf_data/report_keywords/cc_claims |
|
|
pdf_data/report_keywords/vendor |
|
|
pdf_data/report_keywords/eval_facility |
|
|
pdf_data/report_keywords/hash_function |
|
|
pdf_data/report_keywords/standard_id |
|
|
pdf_data/report_metadata |
|
|
pdf_data/st_filename | Security Target of Huawei 3900 Series LTE eNodeB Access Control Software v3.0.pdf | [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf |
pdf_data/st_keywords/cc_security_level |
|
|
pdf_data/st_keywords/cc_sar |
|
|
pdf_data/st_keywords/cc_sfr |
|
|
pdf_data/st_keywords/cc_claims |
|
|
pdf_data/st_keywords/vendor |
|
|
pdf_data/st_keywords/crypto_scheme |
|
|
pdf_data/st_keywords/crypto_protocol |
|
|
pdf_data/st_metadata |
|
|
state/cert/convert_garbage | False | True |
state/cert/convert_ok | False | True |
state/cert/download_ok | False | True |
state/cert/extract_ok | False | True |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/extract_ok | False | True |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |