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System Software for e-STUDIO202L/232/282 V1.0
JISEC-CC-CRP-C0043
NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
BSI-DSZ-CC-0855-2013
name System Software for e-STUDIO202L/232/282 V1.0 NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 10.12.2010 01.09.2019
not_valid_before 29.03.2006 04.04.2013
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0043_erpt.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0855a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0043_est.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0855b_pdf.pdf
manufacturer Toshiba TEC Corporation NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.toshibatec.co.jp/en/ https://www.nxp.com
security_level EAL3 EAL5+, ALC_DVS.1, ASE_TSS.2, AVA_VAN.5
dgst 79cf3cf36c8217af 4a2d9278fc67ffec
heuristics/cert_id JISEC-CC-CRP-C0043 BSI-DSZ-CC-0855-2013
heuristics/cert_lab [] BSI
heuristics/extracted_sars ALC_DVS.1, ATE_COV.2, ADV_RCR.1, ADV_FSP.1, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_VLA.1, ATE_IND.2, AGD_ADM.1, AVA_MSU.1, ATE_DPT.1, AVA_SOF.1 ASE_INT.1, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ALC_DVS.1, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 1.0 -
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0043
  • certification_date: 01.03.2006
  • claim: EAL3
  • enhanced:
    • assurance_level: EAL3
    • cert_link: https://www.ipa.go.jp/en/security/c0043_eimg.pdf
    • description: PRODUCT DESCRIPTION The TOE is the system software of the digital multi function device “ e-STUDIO202L/232/282 ” manufactured by TOSHIBA TEC CORPORATION. The system software provides general functions as a digital multifunction device as well as the function of data overwrite and complete deletion on the user document data deleted from the e-STUDIO202L/232/282 HDD. The function of data overwrite and complete deletion includes the function to collectively and completely delete all user document data from the HDD before the HDD is disposed or replaced. This function also prevents unauthorized restore of data.
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc.
    • product: System Software for e-STUDIO202L/232/282
    • product_type: IT Product ( data protection function in Multi Function Device )
    • report_link: https://www.ipa.go.jp/en/security/c0043_erpt.pdf
    • target_link: https://www.ipa.go.jp/en/security/c0043_est.pdf
    • toe_version: V1.0
    • vendor: TOSHIBA TEC CORPORATION
  • expiration_date: 01.01.2011
  • supplier: TOSHIBA TEC CORPORATION
  • toe_japan_name: System Software for e-STUDIO202L/232/282 V1.0
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0043_it5057.html
  • toe_overseas_name: System Software for e-STUDIO 202L/232/282 V1.0
heuristics/protection_profiles {} f6d23054061d72ba
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0043_erpt.pdf 0855a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0855-2013
    • cert_item: NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • CRP-C0043-01: 1
    • Certification No. C0043: 1
  • DE:
    • BSI-DSZ-CC-0771-2011: 3
    • BSI-DSZ-CC-0855-2013: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL3: 3
  • EAL:
    • EAL 4: 3
    • EAL 5: 7
    • EAL 5 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/cc_claims
  • T:
    • T.STOREDATA_ACCESS: 1
    • T.TEMPDATA_ACCESS: 1
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 18
    • NXP Semiconductors: 22
  • Philips:
    • Philips: 3
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 4
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 1
      • Triple-DES: 4
    • DES:
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 3
pdf_data/report_keywords/side_channel_analysis
  • other:
    • reverse engineering: 1
  • FI:
    • physical tampering: 2
  • SCA:
    • DPA: 3
    • SPA: 2
    • physical probing: 1
    • side channel: 1
    • timing attack: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 2
    • CCIMB-99-033: 2
  • ISO:
    • ISO/IEC 15408:1999: 1
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • November 2012 (confidential document) [12] P5CC008V1A and P5CC012V1A, Guidance, Delivery and Operation Manual, NXP Semiconductors: 1
    • November 2012, NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s), NXP Semiconductors (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • P5CC012 V1A/V1A(s) each including IC Dedicated Software, v1.1, Brightsight, 6 February 2013 (confidential document) [10] ETR for composite evaluation according to AIS 36, NXP Secure Smart Card Controllers P5CC008: 1
    • V1A/V1A(s) each including IC Dedicated Software, v1.1, Brightsight, 6 February 2013 (confidential document) [11] NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s), Configuration List, Rev. 1.0: 1
pdf_data/report_metadata
  • /Author:
  • /CreationDate: D:20060515142139+09'00'
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  • /ModDate: D:20060515142342+09'00'
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  • /Title:
  • pdf_file_size_bytes: 546561
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20130412100319+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Smart Card"
  • /ModDate: D:20130412101415+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0855-2013
  • pdf_file_size_bytes: 1019142
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename c0043_est.pdf 0855b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0855: 62
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 3: 1
    • EAL3: 4
  • EAL:
    • EAL 5: 3
    • EAL 5 augmented: 1
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL5: 32
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_CAP.3: 3
    • ACM_SCP.1: 1
  • ADO:
    • ADO_DEL.1: 3
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP.1: 3
    • ADV_HLD.2: 1
    • ADV_RCR.1: 3
  • AGD:
    • AGD_ADM.1: 3
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS.1: 3
  • ATE:
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_FUN.1: 3
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU.1: 3
    • AVA_SOF.1: 2
    • AVA_VLA.1: 3
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 4
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_RIP.1: 11
    • FDP_RIP.1.1: 1
    • FDP_RIP.2: 8
  • FPT:
    • FPT_RVM.1: 12
    • FPT_RVM.1.1: 1
  • FAU:
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 2
    • FCS_COP.1: 11
    • FCS_COP.1.1: 1
    • FCS_RNG.1: 4
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 30
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 28
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 8
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 6
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 12
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 4
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • O:
    • O.STOREDATA_OVERWRITE: 4
    • O.TEMPDATA_OVERWRITE: 6
  • OE:
    • OE.HDD_ERASE: 3
    • OE.OVERWRITE_COMPLETE: 3
  • T:
    • T.STOREDATA_ACCESS: 3
    • T.TEMPDATA_ACCESS: 4
  • O:
    • O.CUST_RECONFIG: 5
    • O.MEM_ACCESS: 6
    • O.MF_FW: 7
    • O.RND: 3
    • O.SFR_ACCESS: 8
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 70
    • NXP Semiconductors: 39
  • Philips:
    • Philips: 4
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 26
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 8
pdf_data/st_keywords/side_channel_analysis
  • other:
    • reverse engineering: 2
  • FI:
    • Malfunction: 10
    • fault injection: 4
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 12
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 7816: 8
pdf_data/st_metadata
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  • /Subject: 2006/7/31 update
  • pdf_file_size_bytes: 741778
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  • pdf_is_encrypted: False
  • pdf_number_of_pages: 23
  • /Author: NXP Semiconductors
  • /CreationDate: D:20121129111746+01'00'
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  • /Keywords: CC; Security Evaluation; Security Target Lite; Functional Requirements; Security Functionality; Assurance Level; P5CC008; P5CC012 V1A/ V1A(s)
  • /ModDate: D:20121129112750+01'00'
  • /Producer: Adobe PDF Library 9.0
  • /Subject: Security Target Lite
  • /Title: Security Target Lite P5CC008, P5CC012 V1A/ V1A(s
  • pdf_file_size_bytes: 450431
  • pdf_hyperlinks: mailto:[email protected], http://www.nxp.com/
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 61
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