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System Software for e-STUDIO202L/232/282 V1.0
JISEC-CC-CRP-C0043 		S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
BSI-DSZ-CC-0910-2016
name System Software for e-STUDIO202L/232/282 V1.0 S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 10.12.2010 30.11.2021
not_valid_before 29.03.2006 30.11.2016
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0043_erpt.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0043_est.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910b_pdf.pdf
manufacturer Toshiba TEC Corporation Samsung Electronics Co., Ltd.
manufacturer_web https://www.toshibatec.co.jp/en/ https://www.samsung.com
security_level EAL3 ALC_DVS.2, EAL5+, AVA_VAN.5
dgst 79cf3cf36c8217af 444c4b57afd7eb38
heuristics/cert_id JISEC-CC-CRP-C0043 BSI-DSZ-CC-0910-2016
heuristics/cert_lab [] BSI
heuristics/extracted_sars ALC_DVS.1, ATE_COV.2, ADV_RCR.1, ADV_FSP.1, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_VLA.1, ATE_IND.2, AGD_ADM.1, AVA_MSU.1, ATE_DPT.1, AVA_SOF.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 1.0 1.01
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0043
  • certification_date: 01.03.2006
  • claim: EAL3
  • enhanced:
    • assurance_level: EAL3
    • cert_link: https://www.ipa.go.jp/en/security/c0043_eimg.pdf
    • description: PRODUCT DESCRIPTION The TOE is the system software of the digital multi function device “ e-STUDIO202L/232/282 ” manufactured by TOSHIBA TEC CORPORATION. The system software provides general functions as a digital multifunction device as well as the function of data overwrite and complete deletion on the user document data deleted from the e-STUDIO202L/232/282 HDD. The function of data overwrite and complete deletion includes the function to collectively and completely delete all user document data from the HDD before the HDD is disposed or replaced. This function also prevents unauthorized restore of data.
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc.
    • product: System Software for e-STUDIO202L/232/282
    • product_type: IT Product ( data protection function in Multi Function Device )
    • report_link: https://www.ipa.go.jp/en/security/c0043_erpt.pdf
    • target_link: https://www.ipa.go.jp/en/security/c0043_est.pdf
    • toe_version: V1.0
    • vendor: TOSHIBA TEC CORPORATION
  • expiration_date: 01.01.2011
  • supplier: TOSHIBA TEC CORPORATION
  • toe_japan_name: System Software for e-STUDIO202L/232/282 V1.0
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0043_it5057.html
  • toe_overseas_name: System Software for e-STUDIO 202L/232/282 V1.0
heuristics/protection_profiles {} f6d23054061d72ba
maintenance_updates
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0043_erpt.pdf 0910a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cc_security_level: Common Criteria Part 3 conformant EAL 5 augmented by ALC_DVS.2 and AVA_VAN.5
    • cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended
    • cert_id: BSI-DSZ-CC-0910-2016
    • cert_item: S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
    • ref_protection_profiles: Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007
pdf_data/report_keywords/cc_cert_id
  • JP:
    • CRP-C0043-01: 1
    • Certification No. C0043: 1
  • DE:
    • BSI-DSZ-CC-0910-2016: 22
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL3: 3
  • EAL:
    • EAL 1: 7
    • EAL 2: 4
    • EAL 3: 4
    • EAL 4: 9
    • EAL 5: 13
    • EAL 5 augmented: 3
    • EAL 5+: 1
    • EAL 6: 4
    • EAL 7: 4
    • EAL5: 1
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 3
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 2
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 2
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/cc_claims
  • T:
    • T.STOREDATA_ACCESS: 1
    • T.TEMPDATA_ACCESS: 1
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 20
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 1
    • DES:
      • DES: 1
  • constructions:
    • MAC:
      • HMAC: 2
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 19
    • ECDH:
      • ECDH: 2
    • ECDSA:
      • ECDSA: 3
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
      • SHA1: 1
    • SHA2:
      • SHA-2: 2
      • SHA224: 1
      • SHA256: 1
      • SHA384: 1
      • SHA512: 1
pdf_data/report_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • DTRNG: 8
pdf_data/report_keywords/cipher_mode
  • ECB:
    • ECB: 2
pdf_data/report_keywords/ecc_curve
  • NIST:
    • P-192: 6
    • P-224: 6
    • P-256: 6
    • P-384: 6
pdf_data/report_keywords/side_channel_analysis
  • other:
    • reverse engineering: 1
  • SCA:
    • DPA: 2
    • SPA: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 2
    • CCIMB-99-033: 2
  • ISO:
    • ISO/IEC 15408:1999: 1
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 4
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 37: 1
    • AIS31: 3
  • FIPS:
    • FIPS 180-3: 2
    • FIPS 186-4: 1
    • FIPS PUB 180-3: 1
    • FIPS PUB 186-4: 1
    • FIPS180-3: 4
    • FIPS186-4: 6
    • FIPS197: 3
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
  • RFC:
    • RFC5639: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • TÜV Informationstechnik GmbH, (confidential document) [8] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [9: 1
    • / S3FV5RK / S3FV5RJ / S3FV5RH Revision 0, version 6, 2016-11-21, TÜV Informationstechnik GmbH. (confidential document) [11] Tornado-E ECC Library API Manual, Version 0.21, 2015-10-13, Samsung Electronics [12] HW DTRNG: 1
    • ECC Library including specific IC Dedicated Software, Version 3.2, 2016-10-07, Samsung Electronics (confidential document) [7] Evaluation Technical Report, Version 6, 2016-11-21, Evaluation Ttechnical Report Summary (ETR: 1
    • being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1
pdf_data/report_metadata
  • /Author:
  • /CreationDate: D:20060515142139+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /ModDate: D:20060515142342+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title:
  • pdf_file_size_bytes: 546561
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
pdf_data/st_filename c0043_est.pdf 0910b_pdf.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 3: 1
    • EAL3: 4
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_CAP.3: 3
    • ACM_SCP.1: 1
  • ADO:
    • ADO_DEL.1: 3
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP.1: 3
    • ADV_HLD.2: 1
    • ADV_RCR.1: 3
  • AGD:
    • AGD_ADM.1: 3
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS.1: 3
  • ATE:
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_FUN.1: 3
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU.1: 3
    • AVA_SOF.1: 2
    • AVA_VLA.1: 3
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.4: 2
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 8
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_RIP.1: 11
    • FDP_RIP.1.1: 1
    • FDP_RIP.2: 8
  • FPT:
    • FPT_RVM.1: 12
    • FPT_RVM.1.1: 1
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM: 5
    • FCS_CKM.1: 23
    • FCS_CKM.2: 2
    • FCS_CKM.4: 11
    • FCS_COP: 27
    • FCS_COP.1: 22
    • FCS_RNG: 6
    • FCS_RNG.1: 12
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 10
    • FDP_ACC.1: 8
    • FDP_ACF: 8
    • FDP_ACF.1: 10
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 9
    • FDP_ITC.2: 9
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_CKM.4: 1
    • FMT_LIM: 20
    • FMT_LIM.1: 28
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 32
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 9
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.STOREDATA_OVERWRITE: 4
    • O.TEMPDATA_OVERWRITE: 6
  • OE:
    • OE.HDD_ERASE: 3
    • OE.OVERWRITE_COMPLETE: 3
  • T:
    • T.STOREDATA_ACCESS: 3
    • T.TEMPDATA_ACCESS: 4
  • O:
    • O.MEM_ACCESS: 1
    • O.RND: 6
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 2
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 16
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 9
  • LWC_competition:
    • ASCON:
      • ASCON: 1
  • constructions:
    • MAC:
      • HMAC: 7
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 58
    • ECDH:
      • ECDH: 7
    • ECDSA:
      • ECDSA: 14
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 5
      • SHA1: 3
    • SHA2:
      • SHA-2: 1
      • SHA-224: 3
      • SHA-256: 3
      • SHA-384: 2
      • SHA-512: 3
      • SHA224: 6
      • SHA256: 6
      • SHA384: 6
      • SHA512: 5
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 11
    • RNG: 8
  • TRNG:
    • DTRNG: 28
    • TRNG: 4
pdf_data/st_keywords/cipher_mode
  • CTR:
    • CTR: 5
  • ECB:
    • ECB: 11
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP192t1: 4
    • brainpoolP224r1: 4
    • brainpoolP224t1: 4
    • brainpoolP256r1: 4
    • brainpoolP256t1: 4
    • brainpoolP320r1: 4
    • brainpoolP320t1: 4
    • brainpoolP384r1: 4
    • brainpoolP384t1: 4
    • brainpoolP512r1: 4
    • brainpoolP512t1: 4
  • NIST:
    • P-192: 8
    • P-224: 8
    • P-256: 8
    • P-384: 8
    • P-521: 8
    • secp192k1: 4
    • secp192r1: 4
    • secp224k1: 4
    • secp224r1: 4
    • secp256k1: 4
    • secp256r1: 4
    • secp384r1: 4
    • secp521r1: 4
pdf_data/st_keywords/side_channel_analysis
  • other:
    • reverse engineering: 2
  • FI:
    • DFA: 2
    • Malfunction: 27
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 7
    • Leak-Inherent: 23
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 5
    • physical probing: 9
    • side channel: 2
    • side-channel: 1
    • timing attack: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 2
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 31: 1
    • AIS31: 1
  • CC:
    • CCMB-2012-09-001: 3
    • CCMB-2012-09-002: 3
    • CCMB-2012-09-003: 3
    • CCMB-2012-09-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS PUB 180-3: 6
    • FIPS197: 1
pdf_data/st_metadata
  • /CreationDate: D:20060512044538Z
  • /ModDate: D:20060731114807+09'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: 2006/7/31 update
  • pdf_file_size_bytes: 741778
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 23
  • /Author: Sunggeun Park
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Company: SAMSUNG
  • /CreationDate: D:20161122184902+09'00'
  • /Creator: Word용 Acrobat PDFMaker 10.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /Keywords: ST Lite; S3FV5RP; S3FV5RK; S3FV5RJ; S3FV5RH
  • /ModDate: D:20170201195503+09'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Adobe PDF Library 10.0
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20161122094808
  • /Subject: ST Lite of S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Technologie: 0,22 µm
  • /Title: Security Target of Samsung S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_file_size_bytes: 1425901
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 71
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