Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Toshiba T6NE1 HW version 4
SERTIT-045 		NXP MIFARE DESFire EV1 MF3ICD81
BSI-DSZ-CC-0712-2011
name Toshiba T6NE1 HW version 4 NXP MIFARE DESFire EV1 MF3ICD81
scheme NO DE
not_valid_before 21.08.2013 12.07.2011
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-045-T6NE1-CR_v.1.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20CC-T6NE1-ST-ENG-001.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf
manufacturer Toshiba Corporation Semiconductor Company, Japan NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.semicon.toshiba.co.jp/eng/ https://www.nxp.com
security_level ALC_DVS.2, EAL5+, AVA_VAN.5 ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2
dgst 798cb05d007ed5f6 76f792d08ecf5f58
heuristics/cert_id SERTIT-045 BSI-DSZ-CC-0712-2011
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3
heuristics/extracted_versions 4 -
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0487-2009
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0487-2009
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 21.08.2013
  • developer: TOSHIBA CORPORATION Semiconductors Company
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-045
    • certification_date: 21.08.2013
    • description: SERTIT-045 C
    • developer: TOSHIBA CORPORATION Semiconductors Company
    • documents: frozendict({'target': [frozendict({'href': 'https://sertit.no/getfile.php/134839-1607951312/SERTIT/Sertifikater/2013/45/%5BST%5D%20CC-T6NE1-ST-ENG-001.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/134842-1607951316/SERTIT/Sertifikater/2013/45/SERTIT-045-T6NE1-CR_v.1.0.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • level: EAL 5, ALC_DVS.2, AVA_VAN.5
    • mutual_recognition: CCRA
    • product: HW Version 4
    • protection_profile: Security IC Platform Protection Profile, Version 1.0
    • sponsor: TOSHIBA CORPORATION Semiconductors Company
  • product: Toshiba T6NE1
  • url: https://sertit.no/certified-products/product-archive/toshiba-t6ne1
heuristics/protection_profiles f6d23054061d72ba 62c62b4b4210800e
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf
pdf_data/report_filename SERTIT-045-T6NE1-CR_v.1.0.pdf 0712a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0712-2011
    • cert_item: NXP MIFARE DESFire EV1 MF3ICD81
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-045: 16
  • DE:
    • BSI-DSZ-CC-0487-2009: 3
    • BSI-DSZ-CC-0712-2011: 19
  • NL:
    • CC-0487-2009: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 1
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 5: 2
    • EAL 5+: 18
    • EAL1: 1
    • EAL5+: 1
    • EAL7: 1
  • EAL:
    • EAL 4: 9
    • EAL 4 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP.1: 1
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_ITC.1: 1
    • FDP_ITT.1: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 1
    • FMT_MSA.2: 1
    • FMT_MSA.3: 1
    • FMT_SMF.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 17
    • NXP Semiconductors: 17
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • DES:
      • DES: 4
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
  • SCA:
    • Physical Probing: 1
    • Template Attack: 2
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 1
    • CCMB-2009-07-003: 1
    • CCMB-2009-07-004: 1
  • BSI:
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 4
    • AIS 35: 3
    • AIS 36: 1
    • AIS 37: 1
    • AIS 38: 1
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1
    • DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1
    • DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
pdf_data/report_metadata
  • /Author: Kjartan Jæger Kvassnes
  • /CreationDate: D:20130821143318+02'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: ugradert
  • /ModDate: D:20130821143434+02'00'
  • /Producer: Microsoft® Word 2010
  • /Title: tittel
  • pdf_file_size_bytes: 1357376
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110812112628+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH"
  • /ModDate: D:20110812115539+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0712-2011
  • pdf_file_size_bytes: 871412
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename [ST] CC-T6NE1-ST-ENG-001.pdf 0712b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 3
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 2
    • EAL5 augmented: 1
  • EAL:
    • EAL 4: 4
    • EAL 4 augmented: 2
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL4+: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 2
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 2
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_MSU.3: 2
    • AVA_SOF.1: 2
    • AVA_VLA.4: 4
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 3
    • FCS_COP.1: 9
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 6
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 10
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 11
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 8
    • FDP_ITC.1: 3
    • FDP_ITC.2: 1
    • FDP_ITT.1: 7
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
    • FMT_MSA.1: 8
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 3
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 5
  • FPT:
    • FPT_FLS.1: 9
    • FPT_ITT.1: 7
    • FPT_PHP.3: 6
  • FRU:
    • FRU_FLT.2: 8
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 6
    • FDP_ITC.2: 15
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 6
    • FDP_ROL.1: 6
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 7
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 4
    • FIA_UID.2: 8
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 6
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 16
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 6
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 12
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 6
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_RPL.1: 8
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_SEP.1: 6
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 3
pdf_data/st_keywords/cc_claims
  • O:
    • O.HW_AES: 5
    • O.HW_DES: 5
    • O.MEM_ACCESS: 4
    • O.RNG: 3
  • T:
    • T.RNG: 2
  • O:
    • O.RND: 3
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 71
    • NXP Semiconductors: 14
pdf_data/st_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 36
  • DES:
    • 3DES:
      • 3DES: 1
      • Triple-DES: 8
    • DES:
      • DES: 27
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 24
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 5
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA2:
      • SHA256: 1
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RNG: 14
  • TRNG:
    • TRNG: 1
  • RNG:
    • RND: 5
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 5
  • ECB:
    • ECB: 5
  • OFB:
    • OFB: 1
pdf_data/st_keywords/crypto_library
  • NSS:
    • NSS: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 7
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 2
    • side-channel: 2
  • FI:
    • Malfunction: 9
    • fault injection: 2
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 1
  • FIPS:
    • FIPS PUB 197: 2
    • FIPS PUB 46-3: 3
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46-3: 3
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2
    • out of scope: 2
pdf_data/st_metadata
  • /Author: System User
  • /CreationDate: D:20130824225932+02'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20130824225932+02'00'
  • /Producer: Microsoft® Word 2010
  • /Title: T6NC9 Design
  • pdf_file_size_bytes: 627128
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
  • /Author: NXP Semiconductors
  • /CreationDate: D:20110512120932+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4
  • /ModDate: D:20110512134152+02'00'
  • /Producer: Acrobat Distiller 9.4.0 (Windows)
  • /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller
  • /Title: Security Target Lite - MF3ICD81
  • pdf_file_size_bytes: 279896
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 63
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different