This page was not yet optimized for use on mobile devices.

Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.

	NXP MIFARE DESFire EV1 MF3ICD81 BSI-DSZ-CC-0712-2011	S3FV9VH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 including specific IC Dedicated Software BSI-DSZ-CC-1026-2017
name	NXP MIFARE DESFire EV1 MF3ICD81	S3FV9VH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 including specific IC Dedicated Software
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	DE	DE
status	archived	archived
not_valid_after	01.09.2019	08.12.2022
not_valid_before	12.07.2011	08.12.2017
cert_link	None	None
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/1026a_pdf.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/1026b_pdf.pdf
manufacturer	NXP Semiconductors Germany GmbH Business Line Identification	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.nxp.com	https://www.samsung.com
security_level	ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2	EAL6+, ASE_TSS.2
dgst	76f792d08ecf5f58	fbbd023618bad95b
heuristics/cert_id	BSI-DSZ-CC-0712-2011	BSI-DSZ-CC-1026-2017
heuristics/cert_lab	BSI	BSI
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3	ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions	-	0, 32
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	BSI-DSZ-CC-0487-2009	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	BSI-DSZ-CC-0487-2009	{}
heuristics/scheme_data
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	62c62b4b4210800e	cf0f01bcd7be3e9c
maintenance_updates		maintenance_date: 14.12.2022 maintenance_report_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/1026ma1a_pdf.pdf maintenance_st_link: None maintenance_title: S3FV9VH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 including specific IC Dedicated Software
protection_profiles
protection_profile_links	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename	None	None
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
pdf_data/cert_keywords/cc_sar
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
pdf_data/report_filename	0712a_pdf.pdf	1026a_pdf.pdf
pdf_data/report_frontpage	DE: cert_id: BSI-DSZ-CC-0712-2011 cert_item: NXP MIFARE DESFire EV1 MF3ICD81 cert_lab: BSI developer: NXP Semiconductors Germany GmbH match_rules: ['(BSI-DSZ-CC-.+?) (?:for\|For) (.+?) from (.*)']	DE: cc_security_level: Common Criteria Part 3 conformant EAL 6 augmented by ASE_TSS.2 cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended cert_id: BSI-DSZ-CC-1026-2017 cert_item: S3FV9VH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 including specific IC Dedicated Software cert_lab: BSI developer: Samsung Electronics match_rules: ['(BSI-DSZ-CC-.+?) (?:for\|For) (.+?) from (.)'] ref_protection_profiles: Security IC Platform Protection Profile with Augmentation Packages Version 1.0, 13 January 2014, BSI-CC-PP-0084-2014*
pdf_data/report_keywords/cc_cert_id	DE: BSI-DSZ-CC-0487-2009: 3 BSI-DSZ-CC-0712-2011: 19 NL: CC-0487-2009: 1	DE: BSI-DSZ-CC-1026-2017: 18
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-PP-0002-2001: 3	BSI: BSI-CC-PP-0084-2014: 4
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 9 EAL 4 augmented: 3 EAL1: 6 EAL2: 3 EAL3: 4 EAL4: 9 EAL5: 6 EAL5+: 1 EAL6: 4 EAL7: 4 ITSEC: ITSEC Evaluation: 1	EAL: EAL 1: 1 EAL 2: 2 EAL 2+: 1 EAL 4: 1 EAL 5: 4 EAL 5+: 1 EAL 6: 5 EAL 6 augmented: 3
pdf_data/report_keywords/cc_sar	ACM: ACM_AUT: 2 ACM_AUT.1: 1 ACM_CAP: 2 ACM_CAP.4: 1 ACM_SCP: 2 ACM_SCP.2: 1 ADO: ADO_DEL: 2 ADO_DEL.2: 1 ADO_IGS: 2 ADO_IGS.1: 1 ADV: ADV_FSP: 2 ADV_HLD: 2 ADV_IMP: 2 ADV_IMP.2: 5 ADV_INT: 2 ADV_LLD: 2 ADV_RCR: 2 ADV_SPM: 2 AGD: AGD_ADM: 2 AGD_USR: 2 ALC: ALC_DVS: 2 ALC_DVS.2: 6 ALC_FLR: 2 ALC_LCD: 1 ALC_LCD.1: 1 ALC_TAT: 2 ALC_TAT.1: 1 APE: APE_DES: 1 APE_ENV: 1 APE_INT: 1 APE_OBJ: 1 APE_REQ: 1 APE_SRE: 1 ASE: ASE_DES: 1 ASE_ENV: 1 ASE_INT: 1 ASE_OBJ: 1 ASE_PPC: 1 ASE_REQ: 1 ASE_SRE: 1 ASE_TSS: 1 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 2 AVA: AVA_CCA: 2 AVA_MSU: 2 AVA_MSU.3: 5 AVA_SOF: 3 AVA_VLA: 3 AVA_VLA.2: 1 AVA_VLA.3: 1 AVA_VLA.4: 6	ALC: ALC_CMC: 1 ALC_CMC.5: 1 ALC_CMS.5: 1 ALC_DEL.1: 1 ALC_DVS.2: 1 ALC_FLR: 3 ALC_LCD.1: 1 ALC_TAT.3: 1 ASE: ASE_TSS.2: 4
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims	O: O.C: 2 R: R.O: 2
pdf_data/report_keywords/vendor	NXP: NXP: 17 NXP Semiconductors: 17	Samsung: Samsung: 21
pdf_data/report_keywords/eval_facility		TUV: TÜV Informationstechnik: 4
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 6 DES: 3DES: Triple-DES: 3 DES: DES: 3	AES_competition: AES: AES: 5 DES: 3DES: TDEA: 1 TDES: 2 DES: DES: 1 constructions: MAC: CBC-MAC: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness	RNG: RNG: 1	RNG: RNG: 1 TRNG: DTRNG: 7
pdf_data/report_keywords/cipher_mode		ECB: ECB: 4
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: physical tampering: 1 SCA: physical probing: 1 other: JIL: 4	FI: physical tampering: 1 other: JIL: 4
pdf_data/report_keywords/technical_report_id	BSI: BSI 7125: 2 BSI 7148: 1 BSI 7149: 1 BSI TR-02102: 1	BSI: BSI 7148: 1 BSI TR-02102: 1
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	BSI: AIS 25: 3 AIS 26: 3 AIS 31: 3 AIS 32: 1 AIS 34: 4 AIS 35: 3 AIS 36: 1 AIS 37: 1 AIS 38: 1 FIPS: FIPS PUB 197: 1 FIPS PUB 46-3: 1 ISO: ISO/IEC 15408:2005: 3	BSI: AIS 1: 1 AIS 25: 2 AIS 26: 2 AIS 31: 4 AIS 32: 1 AIS 34: 2 AIS 35: 2 AIS 36: 2 AIS 37: 1 AIS 38: 1 AIS 46: 1 AIS 47: 1 AIS31: 4 FIPS: FIPS197: 3 ICAO: ICAO: 1 ISO: ISO/IEC 15408: 4 ISO/IEC 17065: 2 ISO/IEC 18045: 4 ISO/IEC 9797-1: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process	ConfidentialDocument: 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1 DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1 DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1	ConfidentialDocument: TÜV Informationstechnik GmbH, (confidential document) [8] Security IC Platform Protection Profile with Augmentation Packages Version 1.0, 13 January: 1 ETR COMP) for the S3FV9VH Revision 0, version 2, 2017-09-29, TÜV Informationstechnik GmbH. (confidential document) [11] S3FV9VH HW DTRNG FRO M and DTRNG FRO M Library Application Note, Version 1.2, 2016-10-07: 1 being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1 for Smart Card with specific IC Dedicated Software, Version 2.0, 2017-08-31, Samsung Electronics (confidential document) [7] Evaluation Technical Report, Version 2, 2017-09-29, Evaluation Technical Report Summary (ETR: 1
pdf_data/report_metadata	/Author: Bundesamt für Sicherheit in der Informationstechnik /CreationDate: D:20110812112628+02'00' /Creator: Writer /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH" /ModDate: D:20110812115539+02'00' /Producer: OpenOffice.org 3.2 /Subject: Common Criteria Certification /Title: Certification Report BSI-DSZ-CC-0712-2011 pdf_file_size_bytes: 871412 pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/ pdf_is_encrypted: False pdf_number_of_pages: 36	/Author: Bundesamt für Sicherheit in der Informationstechnik /CreationDate: D:20171219151816+01'00' /Creator: Writer /Keywords: "Common Criteria, Certification, Zertifizierung, BSI-DSZ-CC-1026-2017, Samsung, Kiowa 2, Smart Card" /ModDate: D:20171220100211+01'00' /Producer: LibreOffice 5.2 /Subject: S3FV9VH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 including specific IC Dedicated Software from Samsung Electronics /Title: Certification Report BSI-DSZ-CC-1026-2017 pdf_file_size_bytes: 778469 pdf_hyperlinks: http://www.commoncriteriaportal.org/cc/, https://www.bsi.bund.de/AIS, http://www.sogisportal.eu/, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/zertifizierung, https://www.bsi.bund.de/zertifizierungsreporte, https://www.bsi.bund.de/ pdf_is_encrypted: False pdf_number_of_pages: 28
pdf_data/st_filename	0712b_pdf.pdf	1026b_pdf.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id	DE: BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-PP-0002-2001: 3	BSI: BSI-CC-PP- 0084-2014: 2 BSI-CC-PP-0084: 1 BSI-PP-0084: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL 4: 4 EAL 4 augmented: 2 EAL4: 6 EAL4 augmented: 1 EAL4+: 2	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL 5: 2 EAL 5 augmented: 2 EAL6: 30 EAL6 augmented: 1
pdf_data/st_keywords/cc_sar	ACM: ACM_AUT: 1 ACM_AUT.1: 1 ACM_CAP: 1 ACM_CAP.4: 2 ACM_SCP: 1 ACM_SCP.2: 2 ADO: ADO_DEL: 2 ADO_DEL.2: 2 ADO_IGS: 2 ADO_IGS.1: 2 ADV: ADV_FSP: 1 ADV_FSP.2: 2 ADV_HLD: 1 ADV_HLD.2: 1 ADV_IMP: 1 ADV_IMP.2: 2 ADV_LLD: 1 ADV_LLD.1: 1 ADV_RCR: 4 ADV_RCR.1: 1 ADV_SPM: 1 ADV_SPM.1: 1 AGD: AGD_ADM: 2 AGD_ADM.1: 2 AGD_USR: 2 AGD_USR.1: 2 ALC: ALC_DVS: 1 ALC_DVS.2: 3 ALC_LCD: 1 ALC_LCD.1: 1 ALC_TAT: 1 ALC_TAT.1: 1 ATE: ATE_COV.2: 2 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_MSU: 2 AVA_MSU.3: 2 AVA_SOF.1: 2 AVA_VLA.4: 4	ADV: ADV_ARC: 1 ADV_ARC.1: 5 ADV_FSP: 2 ADV_FSP.4: 2 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.2: 1 ADV_INT.3: 1 ADV_SPM: 1 ADV_SPM.1: 7 ADV_TDS.5: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 1 AGD_PRE: 1 AGD_PRE.1: 1 ALC: ALC_CMC: 1 ALC_CMC.5: 1 ALC_CMS: 2 ALC_CMS.4: 1 ALC_CMS.5: 3 ALC_DEL: 1 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.2: 2 ALC_LCD.1: 1 ALC_TAT.3: 1 APE: APE_ECD: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 2 ASE_OBJ.2: 1 ASE_REQ.1: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.2: 11 ATE: ATE_COV: 1 ATE_COV.3: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 7
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAS.1: 4 FCS: FCS_CKM.1: 6 FCS_CKM.4: 11 FCS_CKM.4.1: 1 FCS_COP.1: 22 FCS_COP.1.1: 2 FCS_RND.1: 5 FCS_RND.1.1: 1 FDP: FDP_ACC.1: 11 FDP_ACC.1.1: 1 FDP_ACF.1: 6 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC: 1 FDP_IFC.1: 11 FDP_ITC.1: 6 FDP_ITC.2: 15 FDP_ITC.2.1: 1 FDP_ITC.2.2: 1 FDP_ITC.2.3: 1 FDP_ITC.2.4: 1 FDP_ITC.2.5: 1 FDP_ITT.1: 6 FDP_ROL.1: 6 FDP_ROL.1.1: 1 FDP_ROL.1.2: 1 FDP_SDI.1: 1 FIA: FIA_UAU.1: 1 FIA_UAU.2: 5 FIA_UAU.2.1: 1 FIA_UAU.5: 7 FIA_UAU.5.1: 1 FIA_UAU.5.2: 1 FIA_UID.1: 4 FIA_UID.2: 8 FMT: FMT_LIM.1: 3 FMT_LIM.2: 3 FMT_MSA.1: 6 FMT_MSA.1.1: 1 FMT_MSA.2: 16 FMT_MSA.3: 8 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_MTD.1: 6 FMT_MTD.1.1: 1 FMT_SMF.1: 8 FMT_SMF.1.1: 1 FMT_SMR.1: 12 FMT_SMR.1.1: 2 FMT_SMR.1.2: 1 FPR: FPR_UNL.1: 6 FPR_UNL.1.1: 1 FPT: FPT_AMT.1: 1 FPT_FLS.1: 7 FPT_ITT.1: 6 FPT_PHP.3: 7 FPT_RPL.1: 8 FPT_RPL.1.1: 1 FPT_RPL.1.2: 1 FPT_SEP.1: 6 FPT_TDC.1: 8 FPT_TDC.1.1: 1 FPT_TDC.1.2: 1 FRU: FRU_FLT.2: 7 FTP: FTP_ITC.1: 2 FTP_TRP.1: 11 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 3	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 8 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM: 28 FCS_CKM.1: 8 FCS_CKM.4: 4 FCS_COP: 24 FCS_COP.1: 5 FCS_RNG: 14 FCS_RNG.1: 7 FDP: FDP_ACC: 27 FDP_ACC.1: 3 FDP_ACF: 28 FDP_ACF.1: 9 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_IFC: 1 FDP_IFC.1: 15 FDP_IFC.1.1: 1 FDP_IFF.1: 3 FDP_ITC.1: 8 FDP_ITC.2: 8 FDP_ITT: 1 FDP_ITT.1: 18 FDP_ITT.1.1: 1 FDP_MSA.1: 1 FDP_SDC: 6 FDP_SDC.1: 15 FDP_SDC.1.1: 2 FDP_SDI: 2 FDP_SDI.1: 1 FDP_SDI.2: 11 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FIA: FIA_API: 7 FIA_API.1: 12 FIA_API.1.1: 2 FMT: FMT_LIM: 26 FMT_LIM.1: 29 FMT_LIM.1.1: 2 FMT_LIM.2: 33 FMT_LIM.2.1: 2 FMT_MSA: 2 FMT_MSA.1: 14 FMT_MSA.1.1: 1 FMT_MSA.3: 17 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF: 1 FMT_SMF.1: 11 FMT_SMF.1.1: 1 FMT_SMR.1: 6 FPT: FPT_FLS: 1 FPT_FLS.1: 21 FPT_FLS.1.1: 1 FPT_ITT: 1 FPT_ITT.1: 16 FPT_ITT.1.1: 1 FPT_PHP: 3 FPT_PHP.3: 21 FPT_PHP.3.1: 1 FRU: FRU_FLT: 1 FRU_FLT.1: 1 FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims	O: O.RND: 3 T: T.RND: 2	O: O.AES: 5 O.RND: 6 O.TDES: 6 T: T.RND: 6
pdf_data/st_keywords/vendor	NXP: NXP: 71 NXP Semiconductors: 14	Samsung: Samsung: 12
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 32 DES: 3DES: TDEA: 1 Triple-DES: 8 DES: DEA: 1 DES: 24	AES_competition: AES: AES: 36 DES: 3DES: TDEA: 1 TDES: 16 Triple-DES: 10 DES: DES: 8 constructions: MAC: CBC-MAC: 1
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	MAC: MAC: 4
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 5 TRNG: TRNG: 1	RNG: RND: 12 RNG: 8 TRNG: DTRNG: 18 TRNG: 1
pdf_data/st_keywords/cipher_mode		ECB: ECB: 14
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 9 fault injection: 2 malfunction: 2 SCA: Leak-Inherent: 8 Physical Probing: 2 physical probing: 1 timing attacks: 1	FI: Malfunction: 26 malfunction: 11 physical tampering: 3 SCA: DPA: 3 Leak-Inherent: 21 Physical Probing: 4 Physical probing: 2 SPA: 2 physical probing: 9 side-channel: 1 timing attacks: 1 other: JIL: 1 reverse engineering: 3
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS31: 2 CC: CCMB-2005-08-001: 2 CCMB-2005-08-002: 2 CCMB-2005-08-003: 2 CCMB-2005-08-004: 2 FIPS: FIPS PUB 197: 3 FIPS PUB 46-3: 3	BSI: AIS31: 3 CC: CCMB-2012-09-001: 3 CCMB-2012-09-002: 3 CCMB-2012-09-003: 3 CCMB-2012-09-004: 3 FIPS: FIPS197: 2 ICAO: ICAO: 1 ISO: ISO/IEC 9797-1: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2 out of scope: 2	OutOfScope: operational environment and SFRs related to the TOE authentication are regarded as not applicable (out of scope of the intended use-case), as the authentication functionality is no longer available. Composite: 4 out of scope: 4
pdf_data/st_metadata	/Author: NXP Semiconductors /CreationDate: D:20110512120932+02'00' /Creator: PScript5.dll Version 5.2.2 /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4 /ModDate: D:20110512134152+02'00' /Producer: Acrobat Distiller 9.4.0 (Windows) /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller /Title: Security Target Lite - MF3ICD81 pdf_file_size_bytes: 279896 pdf_hyperlinks: {} pdf_is_encrypted: True pdf_number_of_pages: 63	/Author: Sunggeun Park /CreationDate: D:20171208161554+09'00' /Creator: Microsoft® Word 2010 /Keywords: ST Lite; S3FV9VH /ModDate: D:20171208162325+09'00' /Producer: Microsoft® Word 2010 /Subject: Security Target Lite Samsung S3FV9VH 32-bit RISC Microcontroller for Smart Card with ST Lite Samsung S3FV9VH 32-bit RISC Microcontroller for Smart Card with specific IC Dedicated Software /Title: Security Target Lite Samsung S3FV9VH 32-bit RISC Microcontroller for Smart Card with specific IC Dedicated Software pdf_file_size_bytes: 1016457 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 72
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	False
state/cert/download_ok	False	False
state/cert/extract_ok	False	False
state/cert/pdf_hash	Equal	Equal
state/cert/txt_hash	Equal	Equal
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different