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NXP MIFARE DESFire EV1 MF3ICD81
BSI-DSZ-CC-0712-2011 		S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
BSI-DSZ-CC-0882-V2-2019
name NXP MIFARE DESFire EV1 MF3ICD81 S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
not_valid_after 01.09.2019 11.12.2024
not_valid_before 12.07.2011 11.12.2019
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2c_pdf.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2b_pdf.pdf
manufacturer NXP Semiconductors Germany GmbH Business Line Identification Samsung Electronics Co., Ltd.
manufacturer_web https://www.nxp.com https://www.samsung.com
security_level ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2 ALC_DVS.2, EAL5+, AVA_VAN.5
dgst 76f792d08ecf5f58 f97de67112a8125c
heuristics/cert_id BSI-DSZ-CC-0712-2011 BSI-DSZ-CC-0882-V2-2019
heuristics/extracted_sars ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions - 0, 32
heuristics/report_references/directly_referencing BSI-DSZ-CC-0487-2009 BSI-DSZ-CC-0882-2013
heuristics/report_references/indirectly_referencing BSI-DSZ-CC-0487-2009 BSI-DSZ-CC-0720-2011, BSI-DSZ-CC-0639-2010, BSI-DSZ-CC-0547-2009, BSI-DSZ-CC-0882-2013, BSI-DSZ-CC-0719-2011, BSI-DSZ-CC-0801-2012
heuristics/protection_profiles 62c62b4b4210800e f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename 0882V2c_pdf.pdf
pdf_data/cert_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0882-V2-2019: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 5: 2
    • EAL 5 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20191216114820+01'00'
  • /Creator: Writer
  • /Keywords: S3CS9AB, 32-Bit, RISC, Microcontroller, Smart Cards, Samsung
  • /ModDate: D:20191216143837+01'00'
  • /Producer: LibreOffice 6.2
  • /Subject: S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated SoftwarefromSamsung Electronics
  • /Title: Certification Report BSI-DSZ-CC-0882-V2-2019
  • pdf_file_size_bytes: 289486
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 0712a_pdf.pdf 0882V2a_pdf.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0712-2011
    • cert_item: NXP MIFARE DESFire EV1 MF3ICD81
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • DE:
    • cc_security_level: Common Criteria Part 3 conformant EAL 5 augmented by AVA_VAN.5 and ALC_DVS.2
    • cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended
    • cert_id: BSI-DSZ-CC-0882-V2-2019
    • cert_item: S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
    • ref_protection_profiles: Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0487-2009: 3
    • BSI-DSZ-CC-0712-2011: 19
  • NL:
    • CC-0487-2009: 1
  • DE:
    • BSI-DSZ-CC-0882-2013: 3
    • BSI-DSZ-CC-0882-V2-2019: 15
  • NL:
    • CC-0882-2013: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
  • BSI:
    • BSI-CC-PP- 0035-2007: 1
    • BSI-CC-PP-0035-2007: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 9
    • EAL 4 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 1: 1
    • EAL 2: 2
    • EAL 2+: 1
    • EAL 4: 1
    • EAL 5: 7
    • EAL 5 augmented: 3
    • EAL 5+: 1
    • EAL 6: 1
    • EAL5: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • AVA:
    • AVA_VAN.5: 4
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 17
    • NXP Semiconductors: 17
  • Samsung:
    • Samsung: 20
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • RNG:
    • RNG: 2
  • TRNG:
    • DTRNG: 9
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 3
  • OFB:
    • OFB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
  • FI:
    • DFA: 1
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • SPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
    • BSI TR-02102: 1
  • BSI:
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 4
    • AIS 35: 3
    • AIS 36: 1
    • AIS 37: 1
    • AIS 38: 1
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
  • BSI:
    • AIS 25: 2
    • AIS 26: 1
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
    • AIS 47: 1
    • AIS31: 3
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1
    • DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1
    • DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
  • ConfidentialDocument:
    • 16] SITE TECHNICAL AUDIT REPORT (STAR), PKL Co., Ltd., Cheonan, Version 4, 02- 12-2019, TÜViT (confidential document) [17] SITE TECHNICAL AUDIT REPORT (STAR), Toppan Photomasks Korea Ltd., Korea Icheon, Version 1: 1
    • IC Dedicated Software, BSI-DSZ-CC-0882-V2-2019, Version 2.2, 14-10- 2019, Samsung Electronics (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP- 0035-2007 [8: 1
    • Report Summary (ETR Summary), BSI-DSZ-CC-0882-V2, S3CS9AB Revision 0, Version 3, 02-12-2019, TÜViT (confidential document) [9] Security Target Lite of S3CS9AB 32-Bit RISC Microcontroller for Smart Cards with specific IC: 1
    • TÜViT (confidential document) 21 / 25 Certification Report BSI-DSZ-CC-0882-V2-2019 C. Excerpts from the Criteria For the: 1
    • being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1
    • evaluation according to AIS 36 for the Product S3CS9AB Revision 0, Version 3, 02-12-2019, TÜViT (confidential document) [11] SC100 Reference Manual, Version 0.0, 15-07-2013, Samsung Electronics [12] S3CS9AB 32-Bit CMOS: 1
pdf_data/report_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110812112628+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH"
  • /ModDate: D:20110812115539+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0712-2011
  • pdf_file_size_bytes: 871412
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename 0712b_pdf.pdf 0882V2b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
  • BSI:
    • BSI-PP-0035: 4
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 4
    • EAL 4 augmented: 2
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL4+: 2
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 2
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 2
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_MSU.3: 2
    • AVA_SOF.1: 2
    • AVA_VLA.4: 4
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.2: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 6
    • FDP_ITC.2: 15
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 6
    • FDP_ROL.1: 6
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 7
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 4
    • FIA_UID.2: 8
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 6
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 16
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 6
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 12
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 6
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_RPL.1: 8
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_SEP.1: 6
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 3
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 4
    • FCS_COP: 8
    • FCS_COP.1: 9
    • FCS_RNG: 6
    • FCS_RNG.1: 15
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 13
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 9
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 4
    • FDP_ITC.2: 4
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM: 8
    • FMT_LIM.1: 24
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 28
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 9
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 6
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
  • T:
    • T.RND: 2
  • O:
    • O.RND: 5
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 71
    • NXP Semiconductors: 14
  • Samsung:
    • Samsung: 2
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 24
  • AES_competition:
    • AES:
      • AES: 13
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 2
    • DES:
      • DES: 8
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
  • TRNG:
    • TRNG: 1
  • RNG:
    • RND: 10
  • TRNG:
    • DTRNG: 19
    • TRNG: 2
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • ECB:
    • ECB: 4
  • OFB:
    • OFB: 2
pdf_data/st_keywords/crypto_library
  • NSS:
    • NSS: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 9
    • fault injection: 2
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 1
  • FI:
    • Malfunction: 24
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 3
    • Leak-Inherent: 21
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 2
    • physical probing: 9
    • side-channel: 3
    • timing attacks: 1
  • other:
    • reverse engineering: 5
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI TR-02102: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46-3: 3
  • BSI:
    • AIS 31: 2
    • AIS31: 1
    • BSI-AIS31: 3
  • CC:
    • CCMB-2017-04-001: 3
    • CCMB-2017-04-002: 3
    • CCMB-2017-04-003: 3
    • CCMB-2017-04-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS197: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2
    • out of scope: 2
pdf_data/st_metadata
  • /Author: NXP Semiconductors
  • /CreationDate: D:20110512120932+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4
  • /ModDate: D:20110512134152+02'00'
  • /Producer: Acrobat Distiller 9.4.0 (Windows)
  • /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller
  • /Title: Security Target Lite - MF3ICD81
  • pdf_file_size_bytes: 279896
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 63
  • /Author: Junghyun KIM
  • /CreationDate: D:20191210200347+09'00'
  • /Creator: Microsoft® Word 2016
  • /Keywords: Security Lite Target of S3CS9AB
  • /ModDate: D:20191210200715+09'00'
  • /Producer: Microsoft® Word 2016
  • /Subject: Security Lite Target of S3CS9AB
  • /Title: Security Lite Target
  • pdf_file_size_bytes: 785729
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 57
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