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NXP MIFARE DESFire EV1 MF3ICD81
BSI-DSZ-CC-0712-2011
Sharp Data Security Kit (AR-FR1/AR-FR2/AR-FR3) for Sharp Imager Family (FR-287, AR-337, AR-407, and AR-507)
CCEVS-VR-0001
name NXP MIFARE DESFire EV1 MF3ICD81 Sharp Data Security Kit (AR-FR1/AR-FR2/AR-FR3) for Sharp Imager Family (FR-287, AR-337, AR-407, and AR-507)
category ICs, Smart Cards and Smart Card-Related Devices and Systems Other Devices and Systems
scheme DE US
not_valid_after 01.09.2019 07.09.2012
not_valid_before 12.07.2011 01.04.2001
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid2001-vr.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid2001-st.pdf
manufacturer NXP Semiconductors Germany GmbH Business Line Identification Sharp Electronics Corporation
manufacturer_web https://www.nxp.com https://www.sharpusa.com/
security_level ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2 EAL2
dgst 76f792d08ecf5f58 c87d9c3b490b122f
heuristics/cert_id BSI-DSZ-CC-0712-2011 CCEVS-VR-0001
heuristics/cert_lab BSI []
heuristics/extracted_sars ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3 ASE_ENV.1, ATE_HLD.1, ADV_RCR.1, ASE_INT.1, AGD_USR.1, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, AVA_SOF.1, ASE_TSS.1, AGD_ADM.1, ADV_HLD.1, ATE_FUN.1, ATE_COV.1, ADV_FSP.1, ASE_SRE.1, ASE_OBJ.1, AVA_VLA.1, ATE_IND.2
heuristics/extracted_versions - 337, 287, 507, 407
heuristics/report_references/directly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/report_references/indirectly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/scheme_data
  • category: Multiple Domain Solution
  • certification_date: 18.04.2001
  • evaluation_facility: DXC.technology
  • expiration_date:
  • id: CCEVS-VR-VID2001
  • product: Sharp Data Security Kit (AR-FR1/AR-FR2/AR-FR3) for the Sharp Imager Family (AR-287, AR-337, AR-407, and AR-507)
  • scheme: US
  • url: https://www.niap-ccevs.org/product/2001
  • vendor: Sharp Electronics Corporation
heuristics/protection_profiles 62c62b4b4210800e {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf {}
pdf_data/report_filename 0712a_pdf.pdf st_vid2001-vr.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0712-2011
    • cert_item: NXP MIFARE DESFire EV1 MF3ICD81
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • US:
  • DE:
  • US:
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0487-2009: 3
    • BSI-DSZ-CC-0712-2011: 19
  • NL:
    • CC-0487-2009: 1
  • US:
    • CCEVS-VR-0001: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 9
    • EAL 4 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 2: 2
    • EAL 4: 1
    • EAL2: 7
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
  • ACM:
    • ACM_CAP.2: 8
  • ADO:
    • ADO_DEL.1: 10
    • ADO_IGS: 1
    • ADO_IGS.1: 7
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 8
    • ADV_HLD.1: 7
    • ADV_RCR.1: 7
  • AGD:
    • AGD_ADM.1: 7
    • AGD_USR.1: 6
  • ASE:
    • ASE_DES.1: 6
    • ASE_ENV.1: 7
    • ASE_INT.1: 8
    • ASE_OBJ.1: 7
    • ASE_PPC.1: 5
    • ASE_REQ: 1
    • ASE_REQ.1: 7
    • ASE_SRE.1: 5
    • ASE_TSS: 1
    • ASE_TSS.1: 7
  • ATE:
    • ATE_COV.1: 7
    • ATE_FUN.1: 6
    • ATE_IND.1: 1
    • ATE_IND.2: 12
  • AVA:
    • AVA_SOF.1: 8
    • AVA_VLA.1: 8
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_RIP.1: 5
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 17
    • NXP Semiconductors: 17
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 4
    • AIS 35: 3
    • AIS 36: 1
    • AIS 37: 1
    • AIS 38: 1
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1
    • DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1
    • DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
pdf_data/report_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110812112628+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH"
  • /ModDate: D:20110812115539+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0712-2011
  • pdf_file_size_bytes: 871412
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
  • /Author: NIAP
  • /CreationDate: Monday, July 16, 2001 2:48:12 PM
  • /Creator: Microsoft Word
  • /Keywords:
  • /Producer: Acrobat PDFWriter 3.02 for Windows
  • /Subject:
  • /Title:
  • pdf_file_size_bytes: 358978
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename 0712b_pdf.pdf st_vid2001-st.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 4
    • EAL 4 augmented: 2
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL4+: 2
  • EAL:
    • EAL2: 13
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 2
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 2
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_MSU.3: 2
    • AVA_SOF.1: 2
    • AVA_VLA.4: 4
  • ACM:
    • ACM_CAP.2: 15
  • ADO:
    • ADO_DEL.1: 9
    • ADO_IGS.1: 9
  • ADV:
    • ADV_FSP.1: 26
    • ADV_HLD.1: 16
    • ADV_RCR.1: 11
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 20
    • AGD_USR.1: 17
  • ATE:
    • ATE_COV.1: 8
    • ATE_FUN.1: 17
    • ATE_HLD.1: 2
    • ATE_IND.2: 11
  • AVA:
    • AVA_SOF.1: 10
    • AVA_VLA.1: 10
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 6
    • FDP_ITC.2: 15
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 6
    • FDP_ROL.1: 6
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 7
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 4
    • FIA_UID.2: 8
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 6
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 16
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 6
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 12
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 6
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_RPL.1: 8
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_SEP.1: 6
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 3
  • FDP:
    • FDP_RIP.1: 8
    • FDP_RIP.1.1: 1
  • FIA:
    • FIA_UAU: 1
    • FIA_UAU.1: 3
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.7: 5
    • FIA_UAU.7.1: 1
    • FIA_UID.1: 5
  • FMT:
    • FMT_MOF.1: 10
    • FMT_MOF.1.1: 2
    • FMT_MTD.1.1: 2
    • FMT_SMR.1: 8
  • FPT:
    • FPT_RVM.1: 8
    • FPT_RVM.1.1: 1
    • FPT_SEP.1: 9
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
  • T:
    • T.RND: 2
  • A:
    • A.CHANGE: 1
    • A.CHANGE_KOC: 2
    • A.HW_CORRECT: 3
    • A.INSTALL: 3
    • A.MANAGE: 3
    • A.NO_EVIL_ADM: 3
    • A.PROCEDURE: 3
  • O:
    • O.NO_TAMPER: 6
    • O.RESIDUAL: 5
  • OE:
    • OE.CORRECT: 3
    • OE.MANAGE: 8
    • OE.RESIDUAL: 1
  • T:
    • T.RESIDUAL: 3
    • T.TAMPER: 4
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 71
    • NXP Semiconductors: 14
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 24
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 9
    • fault injection: 2
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46-3: 3
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2
    • out of scope: 2
pdf_data/st_metadata
  • /Author: NXP Semiconductors
  • /CreationDate: D:20110512120932+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4
  • /ModDate: D:20110512134152+02'00'
  • /Producer: Acrobat Distiller 9.4.0 (Windows)
  • /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller
  • /Title: Security Target Lite - MF3ICD81
  • pdf_file_size_bytes: 279896
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 63
  • /Author: Unknown
  • /CreationDate: Monday, June 25, 2001 6:36:43 AM
  • /Creator: Microsoft Word
  • /Keywords:
  • /Producer: Acrobat PDFWriter 3.02 for Windows
  • /Subject:
  • /Title: CCEVS-ST-VID201.PDF
  • pdf_file_size_bytes: 270679
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 50
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