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NXP MIFARE DESFire EV1 MF3ICD81
BSI-DSZ-CC-0712-2011 		Samsung SP of S3B512C revision 3
2021-23-INF-4038
name NXP MIFARE DESFire EV1 MF3ICD81 Samsung SP of S3B512C revision 3
scheme DE ES
status archived active
not_valid_after 01.09.2019 08.04.2028
not_valid_before 12.07.2011 08.04.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23_Certificado.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20INF-4038.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20ST_Lite.pdf
manufacturer NXP Semiconductors Germany GmbH Business Line Identification Samsung Electronics Co., Ltd.
manufacturer_web https://www.nxp.com https://www.samsung.com
security_level ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2 EAL2
dgst 76f792d08ecf5f58 95f760528ffedd31
heuristics/cert_id BSI-DSZ-CC-0712-2011 2021-23-INF-4038
heuristics/cert_lab BSI []
heuristics/extracted_sars ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3 ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions - 3
heuristics/report_references/directly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/report_references/indirectly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/scheme_data
  • category: Biometric Devices
  • certification_date: 08.04.2023
  • enhanced:
    • category: Biometric Devices
    • cc_version: Common Criteria 3.1 release 5
    • cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1701
    • certification_date: 08.04.2023
    • description: The SP of S3B512C single-chip CMOS micro-controller is designed and packaged specifically for "Biometric Smart Card" applications. The Cortex-M33 CPU architecture of the SP of S3B512C microcontrollerfollows the Harvard style, that is, it has separate program memory and data memory. Both instruction and data can be fetched simultaneously without causing a stall, using separate paths for memory access. The main security features of the SP of S3B512C integrated circuit are: Secure fingerprint image capture and feature extraction provided by TOE SP firmware, integrity protected. Access control of Users to Flash memory positions where SP firmware is executed. TOE Unique Identification Countermeasures to avoid attackers reproduction of fingerprint data. An AES hardware block supporting AES encryption and decryption with 128-bit, 192-bit and 256-bit keys in ECB mode. The AES block supports encryption of fingerprint features to be sent to SE of S3B512C. Note SE (Secure Element) is not TOE.
    • evaluation_facility: Applus Laboratories
    • level: EAL2
    • manufacturer: Samsung Electronics Co., Ltd
    • report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1702
    • status: Certified
    • target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1700
    • type: Product
  • manufacturer: Samsung Electronics Co., Ltd
  • product: Samsung SP of S3B512C revision 3
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/974-samsung-sp-of-s3b512c-revision-3
heuristics/protection_profiles 62c62b4b4210800e {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf {}
pdf_data/cert_filename 2021-23_Certificado.pdf
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
    • EAL2: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 2
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
  • T:
    • T.I: 1
pdf_data/cert_keywords/vendor
  • Samsung:
    • Samsung: 3
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 913137
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
pdf_data/report_filename 0712a_pdf.pdf 2021-23 INF-4038.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0712-2011
    • cert_item: NXP MIFARE DESFire EV1 MF3ICD81
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • DE:
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0487-2009: 3
    • BSI-DSZ-CC-0712-2011: 19
  • NL:
    • CC-0487-2009: 1
  • ES:
    • 2021-23-INF-4038- v1: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 9
    • EAL 4 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2: 8
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
  • ADV:
    • ADV_ARC.1: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_DEL.1: 1
    • ALC_FLR: 2
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_SPD.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 17
    • NXP Semiconductors: 17
  • Samsung:
    • Samsung: 14
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 7
pdf_data/report_keywords/crypto_protocol
  • PGP:
    • PGP: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • ECB:
    • ECB: 2
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 5
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 4
    • AIS 35: 3
    • AIS 36: 1
    • AIS 37: 1
    • AIS 38: 1
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1
    • DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1
    • DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
pdf_data/report_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110812112628+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH"
  • /ModDate: D:20110812115539+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0712-2011
  • pdf_file_size_bytes: 871412
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename 0712b_pdf.pdf 2021-23 ST_Lite.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 4
    • EAL 4 augmented: 2
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL4+: 2
  • EAL:
    • EAL2: 5
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 2
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 2
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_MSU.3: 2
    • AVA_SOF.1: 2
    • AVA_VLA.4: 4
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP.2: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_CMS.2: 1
    • ALC_DEL.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 6
    • FDP_ITC.2: 15
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 6
    • FDP_ROL.1: 6
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 7
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 4
    • FIA_UID.2: 8
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 6
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 16
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 6
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 12
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 6
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_RPL.1: 8
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_SEP.1: 6
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 3
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 9
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM: 1
    • FCS_CKM.1: 4
    • FCS_CKM.4: 7
    • FCS_CKM.4.1: 1
    • FCS_COP: 1
    • FCS_COP.1: 6
    • FCS_COP.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 15
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 7
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 10
    • FDP_ITC: 2
    • FDP_ITC.1: 10
    • FDP_ITC.1.1: 1
    • FDP_ITC.1.2: 1
    • FDP_ITC.1.3: 1
    • FDP_ITC.2: 4
    • FDP_ITT: 1
    • FDP_ITT.1: 6
    • FDP_ITT.1.1: 1
    • FDP_RIP: 1
    • FDP_RIP.1: 1
    • FDP_RIP.2: 6
    • FDP_RIP.2.1: 1
    • FDP_SDI: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT: 1
    • FDP_UCT.1: 6
    • FDP_UCT.1.1: 1
    • FDP_UIT: 1
    • FDP_UIT.1: 6
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FMT:
    • FMT_MSA: 2
    • FMT_MSA.1: 9
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 11
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 3
    • FMT_SMR.1: 6
  • FPT:
    • FPT_ITT: 1
    • FPT_ITT.1: 6
    • FPT_ITT.1.1: 1
  • FTP:
    • FTP_ITC.1: 4
    • FTP_TRP: 1
    • FTP_TRP.1: 10
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
  • T:
    • T.RND: 2
  • O:
    • O.AES: 10
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 71
    • NXP Semiconductors: 14
  • Samsung:
    • Samsung: 20
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 24
  • AES_competition:
    • AES:
      • AES: 36
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 4
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
  • MAC:
    • MAC: 2
pdf_data/st_keywords/crypto_protocol
  • PGP:
    • PGP: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
  • TRNG:
    • TRNG: 1
  • RNG:
    • RNG: 1
pdf_data/st_keywords/cipher_mode
  • ECB:
    • ECB: 3
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 9
    • fault injection: 2
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 1
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 70
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46-3: 3
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
    • CCMB-2017-04-004: 1
  • FIPS:
    • FIPS 197: 1
    • FIPS197: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2
    • out of scope: 2
pdf_data/st_metadata
  • /Author: NXP Semiconductors
  • /CreationDate: D:20110512120932+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4
  • /ModDate: D:20110512134152+02'00'
  • /Producer: Acrobat Distiller 9.4.0 (Windows)
  • /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller
  • /Title: Security Target Lite - MF3ICD81
  • pdf_file_size_bytes: 279896
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 63
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 1418253
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 51
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different