Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
NXP MIFARE DESFire EV1 MF3ICD81
BSI-DSZ-CC-0712-2011 		Toshiba T6NE1 HW version 4
SERTIT-045
name NXP MIFARE DESFire EV1 MF3ICD81 Toshiba T6NE1 HW version 4
scheme DE NO
not_valid_before 12.07.2011 21.08.2013
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-045-T6NE1-CR_v.1.0.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20CC-T6NE1-ST-ENG-001.pdf
manufacturer NXP Semiconductors Germany GmbH Business Line Identification Toshiba Corporation Semiconductor Company, Japan
manufacturer_web https://www.nxp.com https://www.semicon.toshiba.co.jp/eng/
security_level ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2 ALC_DVS.2, EAL5+, AVA_VAN.5
dgst 76f792d08ecf5f58 798cb05d007ed5f6
heuristics/cert_id BSI-DSZ-CC-0712-2011 SERTIT-045
heuristics/cert_lab BSI []
heuristics/extracted_sars ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions - 4
heuristics/report_references/directly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/report_references/indirectly_referencing BSI-DSZ-CC-0487-2009 {}
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 21.08.2013
  • developer: TOSHIBA CORPORATION Semiconductors Company
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-045
    • certification_date: 21.08.2013
    • description: SERTIT-045 C
    • developer: TOSHIBA CORPORATION Semiconductors Company
    • documents: frozendict({'target': [frozendict({'href': 'https://sertit.no/getfile.php/134839-1607951312/SERTIT/Sertifikater/2013/45/%5BST%5D%20CC-T6NE1-ST-ENG-001.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/134842-1607951316/SERTIT/Sertifikater/2013/45/SERTIT-045-T6NE1-CR_v.1.0.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • level: EAL 5, ALC_DVS.2, AVA_VAN.5
    • mutual_recognition: CCRA
    • product: HW Version 4
    • protection_profile: Security IC Platform Protection Profile, Version 1.0
    • sponsor: TOSHIBA CORPORATION Semiconductors Company
  • product: Toshiba T6NE1
  • url: https://sertit.no/certified-products/product-archive/toshiba-t6ne1
heuristics/protection_profiles 62c62b4b4210800e f6d23054061d72ba
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename 0712a_pdf.pdf SERTIT-045-T6NE1-CR_v.1.0.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0712-2011
    • cert_item: NXP MIFARE DESFire EV1 MF3ICD81
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • DE:
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0487-2009: 3
    • BSI-DSZ-CC-0712-2011: 19
  • NL:
    • CC-0487-2009: 1
  • NO:
    • SERTIT-045: 16
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
  • BSI:
    • BSI-PP-0035: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 9
    • EAL 4 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 4: 1
    • EAL 5: 2
    • EAL 5+: 18
    • EAL1: 1
    • EAL5+: 1
    • EAL7: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP.1: 1
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_ITC.1: 1
    • FDP_ITT.1: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 1
    • FMT_MSA.2: 1
    • FMT_MSA.3: 1
    • FMT_SMF.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 17
    • NXP Semiconductors: 17
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • DES:
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • RNG:
    • RNG: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
  • FI:
    • Malfunction: 3
  • SCA:
    • Physical Probing: 1
    • Template Attack: 2
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 4
    • AIS 35: 3
    • AIS 36: 1
    • AIS 37: 1
    • AIS 38: 1
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 1
    • CCMB-2009-07-003: 1
    • CCMB-2009-07-004: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1
    • DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1
    • DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
pdf_data/report_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110812112628+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH"
  • /ModDate: D:20110812115539+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0712-2011
  • pdf_file_size_bytes: 871412
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
  • /Author: Kjartan Jæger Kvassnes
  • /CreationDate: D:20130821143318+02'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: ugradert
  • /ModDate: D:20130821143434+02'00'
  • /Producer: Microsoft® Word 2010
  • /Title: tittel
  • pdf_file_size_bytes: 1357376
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
pdf_data/st_filename 0712b_pdf.pdf [ST] CC-T6NE1-ST-ENG-001.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 3
  • BSI:
    • BSI-PP-0035: 3
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 4
    • EAL 4 augmented: 2
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL4+: 2
  • EAL:
    • EAL5: 2
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 2
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 2
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_MSU.3: 2
    • AVA_SOF.1: 2
    • AVA_VLA.4: 4
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 6
    • FDP_ITC.2: 15
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 6
    • FDP_ROL.1: 6
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 7
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 4
    • FIA_UID.2: 8
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 6
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 16
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 6
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 12
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 6
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_RPL.1: 8
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_SEP.1: 6
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 3
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 3
    • FCS_COP.1: 9
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 6
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 10
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 11
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 8
    • FDP_ITC.1: 3
    • FDP_ITC.2: 1
    • FDP_ITT.1: 7
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
    • FMT_MSA.1: 8
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 3
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 8
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 5
  • FPT:
    • FPT_FLS.1: 9
    • FPT_ITT.1: 7
    • FPT_PHP.3: 6
  • FRU:
    • FRU_FLT.2: 8
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
  • T:
    • T.RND: 2
  • O:
    • O.HW_AES: 5
    • O.HW_DES: 5
    • O.MEM_ACCESS: 4
    • O.RNG: 3
  • T:
    • T.RNG: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 71
    • NXP Semiconductors: 14
pdf_data/st_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 32
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 24
  • AES_competition:
    • AES:
      • AES: 36
  • DES:
    • 3DES:
      • 3DES: 1
      • Triple-DES: 8
    • DES:
      • DES: 27
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 5
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA2:
      • SHA256: 1
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
  • TRNG:
    • TRNG: 1
  • RNG:
    • RNG: 14
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 5
  • ECB:
    • ECB: 5
  • OFB:
    • OFB: 1
pdf_data/st_keywords/crypto_library
  • NSS:
    • NSS: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 9
    • fault injection: 2
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 1
  • FI:
    • Malfunction: 7
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 8
    • Physical Probing: 2
    • physical probing: 2
    • side-channel: 2
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46-3: 3
  • BSI:
    • AIS20: 1
  • FIPS:
    • FIPS PUB 197: 2
    • FIPS PUB 46-3: 3
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2
    • out of scope: 2
pdf_data/st_metadata
  • /Author: NXP Semiconductors
  • /CreationDate: D:20110512120932+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4
  • /ModDate: D:20110512134152+02'00'
  • /Producer: Acrobat Distiller 9.4.0 (Windows)
  • /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller
  • /Title: Security Target Lite - MF3ICD81
  • pdf_file_size_bytes: 279896
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 63
  • /Author: System User
  • /CreationDate: D:20130824225932+02'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20130824225932+02'00'
  • /Producer: Microsoft® Word 2010
  • /Title: T6NC9 Design
  • pdf_file_size_bytes: 627128
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different