This page was not yet optimized for use on mobile devices.

Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.

	NXP MIFARE DESFire EV1 MF3ICD81 BSI-DSZ-CC-0712-2011	STMicroelectronics ST54L A02 NSCIB-CC-2300182-01-CR
name	NXP MIFARE DESFire EV1 MF3ICD81	STMicroelectronics ST54L A02
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	DE	NL
status	archived	active
not_valid_after	01.09.2019	19.04.2029
not_valid_before	12.07.2011	19.04.2024
cert_link		https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-2300182-01-CERT.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712a_pdf.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-CR2.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0712b_pdf.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-ST.pdf
manufacturer	NXP Semiconductors Germany GmbH Business Line Identification	STMicroelectronics
manufacturer_web	https://www.nxp.com	https://www.st.com/
security_level	ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2	EAL6+, ALC_FLR.2
dgst	76f792d08ecf5f58	2bd2cc8a67ea9a19
heuristics/cert_id	BSI-DSZ-CC-0712-2011	NSCIB-CC-2300182-01-CR
heuristics/cert_lab	BSI
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ATE_COV.2, ADV_RCR.1, ALC_TAT.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, AVA_SOF.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.2, ADV_SPM.1, AVA_MSU.3	ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ATE_FUN.2, ALC_TAT.3, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ALC_CMC.5, ALC_FLR.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions	-	-
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	ANSSI-CC-2025/04, ANSSI-CC-2024/33
heuristics/report_references/directly_referencing	BSI-DSZ-CC-0487-2009	{}
heuristics/report_references/indirectly_referenced_by	{}	ANSSI-CC-2025/04, ANSSI-CC-2024/33
heuristics/report_references/indirectly_referencing	BSI-DSZ-CC-0487-2009	{}
heuristics/scheme_data		cert_id: NSCIB-CC-2300182-01-CR cert_link: https://trustcb.com/download/?wpdmdl=4061 certification_date: 19.04.2024 developer: STMicroelectronics evaluation_facility: SGS Brightsight level: EAL6+ALC_FLR.2 product: ST54L A02 report_link: https://trustcb.com/download/?wpdmdl=4062 status: Issued target_link: https://trustcb.com/download/?wpdmdl=4063
heuristics/st_references/directly_referenced_by	{}	ANSSI-CC-2025/04, ANSSI-CC-2024/33
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	ANSSI-CC-2025/04, ANSSI-CC-2024/33
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	62c62b4b4210800e	cf0f01bcd7be3e9c
maintenance_updates
protection_profiles
protection_profile_links	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/ssvgpp01.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename		NSCIB-2300182-01-CERT.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id		NL: CC-23-0638980: 1 NSCIB-2300182-01: 1 NSCIB-CC-2300182-01: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level		EAL: EAL 6: 1 EAL 6 augmented: 1 EAL2: 1 EAL7: 1
pdf_data/cert_keywords/cc_sar		ALC: ALC_FLR: 1 ALC_FLR.2: 1 ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor		STMicroelectronics: STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility		BrightSight: Brightsight: 1 SGS: SGS: 1 SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id		ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata		/Author: JM2 /CreationDate: D:20240424204220+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240424204220+01'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 91592 pdf_hyperlinks: https://www.tuv-nederland.nl/ pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	0712a_pdf.pdf	NSCIB-CC-2300182-01-CR2.pdf
pdf_data/report_frontpage	DE: cert_id: BSI-DSZ-CC-0712-2011 cert_item: NXP MIFARE DESFire EV1 MF3ICD81 cert_lab: BSI developer: NXP Semiconductors Germany GmbH match_rules: *['(BSI-DSZ-CC-.+?) (?:for\|For) (.+?) from (.)']** NL:	DE: NL: cert_id: NSCIB-CC-2300182-01-CR cert_item: ST54L A02 cert_lab: SGS Brightsight B.V. developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id	DE: BSI-DSZ-CC-0487-2009: 3 BSI-DSZ-CC-0712-2011: 19 NL: CC-0487-2009: 1	NL: CC-23-0638980: 1 NSCIB-2300182-01: 1 NSCIB-CC-2300182-01-CR: 1 NSCIB-CC-2300182-01-CR2: 10
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-PP-0002-2001: 3	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 9 EAL 4 augmented: 3 EAL1: 6 EAL2: 3 EAL3: 4 EAL4: 9 EAL5: 6 EAL5+: 1 EAL6: 4 EAL7: 4 ITSEC: ITSEC Evaluation: 1	EAL: EAL 6: 1 EAL 6 augmented: 1 EAL4: 1 EAL6: 2 EAL6 augmented: 1 EAL6+: 2
pdf_data/report_keywords/cc_sar	ACM: ACM_AUT: 2 ACM_AUT.1: 1 ACM_CAP: 2 ACM_CAP.4: 1 ACM_SCP: 2 ACM_SCP.2: 1 ADO: ADO_DEL: 2 ADO_DEL.2: 1 ADO_IGS: 2 ADO_IGS.1: 1 ADV: ADV_FSP: 2 ADV_HLD: 2 ADV_IMP: 2 ADV_IMP.2: 5 ADV_INT: 2 ADV_LLD: 2 ADV_RCR: 2 ADV_SPM: 2 AGD: AGD_ADM: 2 AGD_USR: 2 ALC: ALC_DVS: 2 ALC_DVS.2: 6 ALC_FLR: 2 ALC_LCD: 1 ALC_LCD.1: 1 ALC_TAT: 2 ALC_TAT.1: 1 APE: APE_DES: 1 APE_ENV: 1 APE_INT: 1 APE_OBJ: 1 APE_REQ: 1 APE_SRE: 1 ASE: ASE_DES: 1 ASE_ENV: 1 ASE_INT: 1 ASE_OBJ: 1 ASE_PPC: 1 ASE_REQ: 1 ASE_SRE: 1 ASE_TSS: 1 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 2 AVA: AVA_CCA: 2 AVA_MSU: 2 AVA_MSU.3: 5 AVA_SOF: 3 AVA_VLA: 3 AVA_VLA.2: 1 AVA_VLA.3: 1 AVA_VLA.4: 6	ADV: ADV_IMP: 1 ALC: ALC_FLR.1: 1 ALC_FLR.2: 3 AVA: AVA_VAN: 1 AVA_VAN.5: 1
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims	O: O.C: 2 R: R.O: 2
pdf_data/report_keywords/vendor	NXP: NXP: 17 NXP Semiconductors: 17	STMicroelectronics: STMicroelectronics: 3
pdf_data/report_keywords/eval_facility		BrightSight: Brightsight: 3 SGS: SGS: 3 SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 6 DES: 3DES: Triple-DES: 3 DES: DES: 3	AES_competition: AES: AES: 2 DES: DES: DES: 2 constructions: MAC: CBC-MAC: 1 miscellaneous: SM4: SM4: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness	RNG: RNG: 1	RNG: RNG: 1 TRNG: TRNG: 1
pdf_data/report_keywords/cipher_mode		CBC: CBC: 1
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine		NesCrypt: Nescrypt: 3
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: physical tampering: 1 SCA: physical probing: 1 other: JIL: 4	FI: DFA: 1 SCA: side-channel: 1 other: JIL: 2 JIL-AAPS: 2 JIL-AM: 2
pdf_data/report_keywords/technical_report_id	BSI: BSI 7125: 2 BSI 7148: 1 BSI 7149: 1 BSI TR-02102: 1
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name		IBM: SE: 1
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	BSI: AIS 25: 3 AIS 26: 3 AIS 31: 3 AIS 32: 1 AIS 34: 4 AIS 35: 3 AIS 36: 1 AIS 37: 1 AIS 38: 1 FIPS: FIPS PUB 197: 1 FIPS PUB 46-3: 1 ISO: ISO/IEC 15408:2005: 3
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process	ConfidentialDocument: 2011, T-Systems GEI GmbH (confidential document) [8] MIFARE DESFire EV1 MF3ICD81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011: 1 DESFire EV1 MF3ICD81 Secure Smart Card Controller, NXP Semiconductors, Rev. 2.1, 10 May 2011 (confidential document) [7] Evaluation Technical Report, NXP MIFARE DESFire EV1 MF3ICD81, BSI-DSZ-CC- 0712 Version 1.5, 24: 1 DESFire EV1 MF3ICDH81 Configuration List, NXP Semiconductors, Rev. 1.6, 10. May 2011 (confidential documents) [9] Security Target Lite, MIFARE DESFire EV 1 MF3ICD81, NXP Semiconductors, Rev. 1.5, 10 May 2011: 1
pdf_data/report_metadata	/Author: Bundesamt für Sicherheit in der Informationstechnik /CreationDate: D:20110812112628+02'00' /Creator: Writer /Keywords: "Common Criteria, Certification, Zertifizierung, Secure Smart Card Controller with Smartcard Embedded SoftwareNXP MIFARE DESFire EV1 MF3ICD81, NXP Semiconductors Germany GmbH" /ModDate: D:20110812115539+02'00' /Producer: OpenOffice.org 3.2 /Subject: Common Criteria Certification /Title: Certification Report BSI-DSZ-CC-0712-2011 pdf_file_size_bytes: 871412 pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/ pdf_is_encrypted: False pdf_number_of_pages: 36	/Author: sjon /CreationDate: D:20240425091636+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240425091636+01'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 200258 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/, https://trustcb.com/common-criteria/nscib/, https://nscib.nl/, mailto:[email protected], https://www.tuv-nederland.nl/common-criteria/certificates.html pdf_is_encrypted: False pdf_number_of_pages: 11
pdf_data/st_filename	0712b_pdf.pdf	NSCIB-CC-2300182-01-ST.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id	DE: BSI-DSZ-CC-0712: 1
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-PP-0002-2001: 3	BSI: BSI-CC-PP- 0084-2014: 10 BSI-CC-PP-0084-: 1 BSI-CC-PP-0084-2014: 64
pdf_data/st_keywords/cc_security_level	EAL: EAL 4: 4 EAL 4 augmented: 2 EAL4: 6 EAL4 augmented: 1 EAL4+: 2	EAL: EAL4: 1 EAL6: 23 EAL6 augmented: 2 EAL6+: 1
pdf_data/st_keywords/cc_sar	ACM: ACM_AUT: 1 ACM_AUT.1: 1 ACM_CAP: 1 ACM_CAP.4: 2 ACM_SCP: 1 ACM_SCP.2: 2 ADO: ADO_DEL: 2 ADO_DEL.2: 2 ADO_IGS: 2 ADO_IGS.1: 2 ADV: ADV_FSP: 1 ADV_FSP.2: 2 ADV_HLD: 1 ADV_HLD.2: 1 ADV_IMP: 1 ADV_IMP.2: 2 ADV_LLD: 1 ADV_LLD.1: 1 ADV_RCR: 4 ADV_RCR.1: 1 ADV_SPM: 1 ADV_SPM.1: 1 AGD: AGD_ADM: 2 AGD_ADM.1: 2 AGD_USR: 2 AGD_USR.1: 2 ALC: ALC_DVS: 1 ALC_DVS.2: 3 ALC_LCD: 1 ALC_LCD.1: 1 ALC_TAT: 1 ALC_TAT.1: 1 ATE: ATE_COV.2: 2 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_MSU: 2 AVA_MSU.3: 2 AVA_SOF.1: 2 AVA_VLA.4: 4	ADV: ADV_ARC: 2 ADV_ARC.1: 1 ADV_FSP: 4 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.2: 1 ADV_INT.3: 1 ADV_SPM: 3 ADV_SPM.1: 3 ADV_TDS.5: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 1 AGD_PRE: 3 AGD_PRE.1: 1 ALC: ALC_CMC: 1 ALC_CMC.5: 1 ALC_CMS: 1 ALC_CMS.5: 1 ALC_DEL: 3 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.2: 1 ALC_FLR.2: 6 ALC_LCD.1: 1 ALC_TAT.3: 1 ASE: ASE_CCL: 4 ASE_CCL.1: 1 ASE_ECD: 4 ASE_ECD.1: 1 ASE_INT: 2 ASE_INT.1: 1 ASE_OBJ: 12 ASE_OBJ.2: 1 ASE_REQ: 31 ASE_REQ.2: 1 ASE_SPD: 9 ASE_SPD.1: 1 ASE_TSS: 7 ASE_TSS.1: 1 ATE: ATE_COV: 3 ATE_COV.3: 1 ATE_DPT.3: 1 ATE_FUN.2: 1 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 1
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAS.1: 4 FCS: FCS_CKM.1: 6 FCS_CKM.4: 11 FCS_CKM.4.1: 1 FCS_COP.1: 22 FCS_COP.1.1: 2 FCS_RND.1: 5 FCS_RND.1.1: 1 FDP: FDP_ACC.1: 11 FDP_ACC.1.1: 1 FDP_ACF.1: 6 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC: 1 FDP_IFC.1: 11 FDP_ITC.1: 6 FDP_ITC.2: 15 FDP_ITC.2.1: 1 FDP_ITC.2.2: 1 FDP_ITC.2.3: 1 FDP_ITC.2.4: 1 FDP_ITC.2.5: 1 FDP_ITT.1: 6 FDP_ROL.1: 6 FDP_ROL.1.1: 1 FDP_ROL.1.2: 1 FDP_SDI.1: 1 FIA: FIA_UAU.1: 1 FIA_UAU.2: 5 FIA_UAU.2.1: 1 FIA_UAU.5: 7 FIA_UAU.5.1: 1 FIA_UAU.5.2: 1 FIA_UID.1: 4 FIA_UID.2: 8 FMT: FMT_LIM.1: 3 FMT_LIM.2: 3 FMT_MSA.1: 6 FMT_MSA.1.1: 1 FMT_MSA.2: 16 FMT_MSA.3: 8 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_MTD.1: 6 FMT_MTD.1.1: 1 FMT_SMF.1: 8 FMT_SMF.1.1: 1 FMT_SMR.1: 12 FMT_SMR.1.1: 2 FMT_SMR.1.2: 1 FPR: FPR_UNL.1: 6 FPR_UNL.1.1: 1 FPT: FPT_AMT.1: 1 FPT_FLS.1: 7 FPT_ITT.1: 6 FPT_PHP.3: 7 FPT_RPL.1: 8 FPT_RPL.1.1: 1 FPT_RPL.1.2: 1 FPT_SEP.1: 6 FPT_TDC.1: 8 FPT_TDC.1.1: 1 FPT_TDC.1.2: 1 FRU: FRU_FLT.2: 7 FTP: FTP_ITC.1: 2 FTP_TRP.1: 11 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 3	FAU: FAU_GEN.1: 8 FAU_SAR.1: 25 FAU_SAS: 2 FAU_SAS.1: 28 FCS: FCS_CKM.1: 2 FCS_CKM.4: 4 FCS_COP.1: 17 FCS_RNG: 2 FCS_RNG.1: 6 FDP: FDP_ACC.1: 23 FDP_ACC.2: 14 FDP_ACF: 1 FDP_ACF.1: 30 FDP_IFC.1: 16 FDP_ITC.1: 2 FDP_ITC.2: 2 FDP_ITT.1: 10 FDP_SDC: 2 FDP_SDC.1: 8 FDP_SDI.2: 14 FDP_SMF.1: 2 FDP_SMR.1: 1 FDP_UCT.1: 16 FDP_UIT.1: 16 FIA: FIA_API: 2 FIA_API.1: 6 FIA_UAU.1: 14 FIA_UID.1: 16 FMT: FMT_LIM: 2 FMT_LIM.1: 29 FMT_LIM.2: 30 FMT_MSA.1: 28 FMT_MSA.3: 28 FMT_SMF.1: 23 FMT_SMR.1: 17 FPT: FPT_FLS.1: 22 FPT_ITT.1: 9 FPT_PHP.3: 11 FRU: FRU_FLT.2: 11 FTP: FTP_ITC.1: 27 FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims	O: O.RND: 3 T: T.RND: 2	O: O.C: 1 O.RND: 4 O.TOE-: 1 R: R.O: 1 T: T.RND: 3
pdf_data/st_keywords/vendor	NXP: NXP: 71 NXP Semiconductors: 14	Infineon: Infineon Technologies: 1 NXP: NXP: 1 Philips: Philips: 1 STMicroelectronics: STMicroelectronics: 26
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 32 DES: 3DES: TDEA: 1 Triple-DES: 8 DES: DEA: 1 DES: 24	AES_competition: AES: AES: 13 AES-128: 1 AES-192: 1 AES-256: 1 DES: 3DES: TDEA: 1 TDES: 7 DES: DES: 18 miscellaneous: SM4: SM4: 3
pdf_data/st_keywords/asymmetric_crypto		ECC: ECC: ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	MAC: MAC: 4
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 5 TRNG: TRNG: 1	RNG: RND: 7 RNG: 6 TRNG: TRNG: 3
pdf_data/st_keywords/cipher_mode		CBC: CBC: 8 ECB: ECB: 7
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine		NesCrypt: NESCRYPT: 1 Nescrypt: 4
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 9 fault injection: 2 malfunction: 2 SCA: Leak-Inherent: 8 Physical Probing: 2 physical probing: 1 timing attacks: 1	FI: Malfunction: 13 malfunction: 2 physical tampering: 1 SCA: Leak-Inherent: 14 Physical Probing: 4 physical probing: 3 side channel: 2 other: JIL: 53
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name		IBM: SE: 2
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS31: 2 CC: CCMB-2005-08-001: 2 CCMB-2005-08-002: 2 CCMB-2005-08-003: 2 CCMB-2005-08-004: 2 FIPS: FIPS PUB 197: 3 FIPS PUB 46-3: 3	CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 23 CCMB-2017-04-003: 2 FIPS: FIPS PUB 197: 3 ISO: ISO/IEC 14888: 2 ISO/IEC 7816-3: 1 ISO/IEC 9796: 1 ISO/IEC 9796-2: 1 NIST: NIST SP 800-38A: 2 NIST SP 800-67: 3 SP 800-38A: 2 SP 800-67: 1 PKCS: PKCS #1: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: TSF shall ensure that only secure values are accepted for security attributes.” This is clearly out of scope for the TOE. The design concept of the TOE and the systems in which the TOE is used is based on the: 2 out of scope: 2	OutOfScope: The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation: 1 ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1 Features Possible values NVM size 3.3 Mbytes, 2.5 Mbytes or 2 Mbytes MIFARE accelerator (out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1 Security IC Embedded Software (ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 47 The user guidance documentation, part of the TOE: 1 out of scope: 5 out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1 to as the ST54L_SE). The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation. 19 Furthermore, the ST54L_SE features a MIFARE(a) Classic® cryptographic: 1
pdf_data/st_metadata	/Author: NXP Semiconductors /CreationDate: D:20110512120932+02'00' /Creator: PScript5.dll Version 5.2.2 /Keywords: Security Target Lite; MF3ICD81; NXP; DES; AES; EAL4+;AVA_VLA.4 /ModDate: D:20110512134152+02'00' /Producer: Acrobat Distiller 9.4.0 (Windows) /Subject: Common Criteria Evaluation of MF3ICD81 Smart Card Controller /Title: Security Target Lite - MF3ICD81 pdf_file_size_bytes: 279896 pdf_hyperlinks: {} pdf_is_encrypted: True pdf_number_of_pages: 63	/Author: Christiane DROULERS /CreationDate: D:20240222122049Z /Creator: FrameMaker 11.0.2 /ModDate: D:20240223170819+01'00' /Producer: Acrobat Distiller 11.0 (Windows) /Title: SMD_ST54L_VA02_1P.book pdf_file_size_bytes: 719927 pdf_hyperlinks: http://www.st.com pdf_is_encrypted: False pdf_number_of_pages: 82
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	True
state/cert/download_ok	False	True
state/cert/extract_ok	False	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different