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NXP MF3E(c)x3
NSCIB-CC-2300018-01-CR 		Samsung S3CC9FB microcontroller
ANSSI-CC-2004/08
name NXP MF3E(c)x3 Samsung S3CC9FB microcontroller
scheme NL FR
status active archived
not_valid_after 26.10.2029 01.09.2019
not_valid_before 26.10.2024 11.05.2004
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300018-01-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300018-01-CR.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_08.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300018-01-%20ST_lite_v10.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_08.pdf
manufacturer NXP Semiconductors Germany GmbH Samsung Electronics Co., Ltd.
manufacturer_web https://www.nxp.com https://www.samsung.com
security_level EAL6+, ASE_TSS.2 ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4
dgst 6d44581e6084406f cb87424f533f753c
heuristics/cert_id NSCIB-CC-2300018-01-CR ANSSI-CC-2004/08
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ADV_CMC.5, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1 ASE_ENV.1, ADV_RCR.1, ASE_INT.1, ADV_HLD.2, AGD_USR.1, ALC_DVS.2, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, AVA_SOF.1, ADV_FSP.2, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, AVA_MSU.2, AGD_ADM.1, ALC_LCD.1, ATE_FUN.1, ADV_IMP.2, ATE_DPT.1, AVA_VLA.4, ASE_SRE.1, ASE_OBJ.1, ATE_IND.2, ADV_LLD.1, ADV_SPM.1
heuristics/report_references/directly_referencing {} ANSSI-CC-2002/25
heuristics/report_references/indirectly_referencing {} ANSSI-CC-2002/25
heuristics/scheme_data
heuristics/protection_profiles cf0f01bcd7be3e9c {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/cert_filename NSCIB-CC-2300018-01-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300018-01: 1
    • NSCIB-CC-2300018-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Microsoft Office User
  • /CreationDate: D:20241107121940+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20241107121940+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 88449
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-2300018-01-CR.pdf 2004_08.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300018-01-CR
    • cert_item: MF3E(c)x3
    • cert_lab: SGS Brightsight B.V.
    • developer: NXP Semiconductors Germany GmbH
  • FR:
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-2300018-01: 1
    • NSCIB-CC-2300018-01-CR: 12
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/08: 13
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 2
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_IMP: 1
  • ASE:
    • ASE_TSS.2: 2
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 3
  • Samsung:
    • Samsung: 10
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
  • SGS:
    • SGS: 2
    • SGS Brightsight: 2
  • Serma:
    • SERMA: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 3
  • constructions:
    • MAC:
      • CMAC: 2
  • DES:
    • DES:
      • DES: 4
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 4
    • ECDSA:
      • ECDSA: 3
pdf_data/report_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/ecc_curve
  • Brainpool:
    • brainpoolP256r1: 1
  • NIST:
    • NIST P-256: 1
    • P-256: 1
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.4.2: 1
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
    • JIL-AM: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150918+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150925+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9FB
  • /Title: Rapport de certification 2004/08
  • pdf_file_size_bytes: 657323
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
pdf_data/st_filename NSCIB-CC-2300018-01- ST_lite_v10.pdf cible2004_08.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2300018-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0056-V2-2012: 1
    • BSI-CC-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 2
    • EAL6: 11
    • EAL6 augmented: 4
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_CMC.4: 1
    • ADV_CMC.5: 1
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 2
    • ADV_FSP.4: 3
    • ADV_FSP.5: 8
    • ADV_IMP: 2
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM.1: 7
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 2
    • ALC_CMC.4: 1
    • ALC_CMC.5: 2
    • ALC_CMS: 3
    • ALC_CMS.4: 2
    • ALC_CMS.5: 2
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 4
  • ATE:
    • ATE_COV: 2
    • ATE_COV.2: 1
    • ATE_COV.3: 2
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 2
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 1
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 7
    • FAU_SAS.1.1: 1
  • FCO:
    • FCO_NRO.1: 8
    • FCO_NRO.1.1: 1
    • FCO_NRO.1.2: 1
    • FCO_NRO.1.3: 1
  • FCS:
    • FCS_CKM: 35
    • FCS_CKM.1: 13
    • FCS_CKM.2: 6
    • FCS_CKM.4: 31
    • FCS_CKM.4.1: 1
    • FCS_COP: 54
    • FCS_COP.1: 8
    • FCS_RNG: 12
    • FCS_RNG.1: 5
  • FDP:
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 10
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_ETC: 6
    • FDP_ETC.1: 1
    • FDP_ETC.2: 1
    • FDP_ETC.3: 18
    • FDP_ETC.3.1: 2
    • FDP_ETC.3.2: 2
    • FDP_ETC.3.3: 2
    • FDP_IFC.1: 9
    • FDP_ITC.1: 10
    • FDP_ITC.2: 23
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 3
    • FDP_ROL.1: 8
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDC.1: 7
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FIA:
    • FIA_API: 18
    • FIA_API.1: 7
    • FIA_API.1.1: 1
    • FIA_UAU.1: 1
    • FIA_UAU.2: 7
    • FIA_UAU.2.1: 1
    • FIA_UAU.3: 8
    • FIA_UAU.3.1: 1
    • FIA_UAU.3.2: 1
    • FIA_UAU.5: 8
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 6
    • FIA_UID.2: 11
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 9
    • FMT_MTD.1.1: 1
    • FMT_REV.1: 9
    • FMT_REV.1.1: 1
    • FMT_REV.1.2: 1
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR: 1
    • FMT_SMR.1: 19
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 8
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_FLS.1: 6
    • FPT_ITT.1: 3
    • FPT_PHP.3: 3
    • FPT_RPL.1: 11
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_TDC.1: 11
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 3
  • FTP:
    • FTP_ITC.1: 1
    • FTP_TRP.1: 16
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 4
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_IFF.1: 2
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A: 4
  • O:
    • O.RND: 1
  • T:
    • T.RND: 1
  • A:
    • A.DEV_ORG: 1
    • A.DLV: 1
    • A.DLV_AUDIT: 1
    • A.DLV_PROTECT: 1
    • A.DLV_RESP: 1
    • A.KEY_DEST: 2
    • A.SOFT_ARCHI: 1
    • A.USE_DIAG: 1
    • A.USE_PROD: 1
    • A.USE_SYS: 1
    • A.USE_TEST: 1
  • O:
    • O.CLON: 1
    • O.CRYPTO: 2
    • O.DESIGN_ACS: 1
    • O.DEV_DIS: 1
    • O.DEV_TOOLS: 1
    • O.DIS_MECHANISM: 1
    • O.DIS_MEMORY: 1
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 1
    • O.DLV_RESP: 1
    • O.DSOFT_ACS: 1
    • O.FLAW: 1
    • O.IC_DLV: 1
    • O.KEY_DEST: 2
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.SOFT_ACS: 1
    • O.SOFT_DLV: 1
    • O.SOFT_MECH: 1
    • O.TAMPER: 1
    • O.TEST_OPERATE: 1
    • O.TOE_PRT: 1
    • O.USE_DIAG: 1
    • O.USE_SYS: 1
  • T:
    • T.CLON: 2
    • T.DIS_DEL: 2
    • T.DIS_DESIGN: 2
    • T.DIS_DSOFT: 2
    • T.DIS_INFO: 1
    • T.DIS_PHOTOMAS: 1
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TEST: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DEL: 2
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_PHOTOMA: 1
    • T.MOD_SOFT: 2
    • T.T_DEL: 2
    • T.T_PHOTOMASK: 2
    • T.T_PRODUCT: 2
    • T.T_SAMPLE: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 93
    • NXP Semiconductors: 28
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 24
      • AES-128: 1
      • AES-256: 1
  • constructions:
    • MAC:
      • CMAC: 8
  • DES:
    • DES:
      • DES: 6
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 29
    • ECDH:
      • ECDH: 4
    • ECDSA:
      • ECDSA: 16
  • FF:
    • DH:
      • Diffie-Hellman: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA2:
      • SHA-256: 2
pdf_data/st_keywords/crypto_scheme
  • KEX:
    • Key Exchange: 1
  • MAC:
    • MAC: 17
pdf_data/st_keywords/crypto_protocol
  • PACE:
    • PACE: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 19
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP256r1: 4
  • NIST:
    • NIST P-256: 4
    • P-256: 4
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.4.2: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
    • fault injection: 3
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 3
    • Physical Probing: 2
  • FI:
    • physical tampering: 6
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 180-4: 1
    • FIPS PUB 186-5: 2
    • FIPS PUB 197: 1
  • ICAO:
    • ICAO: 1
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-38B: 1
    • NIST SP 800-56A: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1
    • out of scope: 1
pdf_data/st_metadata
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  • /ModDate: D:20041001095815+03'00'
  • /Producer: Acrobat Distiller 4.0 for Windows
  • pdf_file_size_bytes: 219561
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
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