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Firmware Libraries V1.1 on P40C012/040/072 VD
NSCIB-CC-13-37968-CR 		ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055
CSA_CC_21006
name Firmware Libraries V1.1 on P40C012/040/072 VD ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055
category ICs, Smart Cards and Smart Card-Related Devices and Systems Boundary Protection Devices and Systems
scheme NL SG
status archived active
not_valid_after 12.03.2020 08.07.2027
not_valid_before 12.03.2015 08.07.2022
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CR]%20NSCIB-CC-13-37968-CR.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20P40_9511CL_CryptoLib_SecurityTargetLite_v1.1.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf
manufacturer NXP Semiconductors Germany GmbH Business Line Identification ST Engineering Electronics
manufacturer_web https://www.nxp.com https://www.stengg.com
security_level ALC_DVS.2, EAL5+, ASE_TSS.2, AVA_VAN.5 EAL4+, AVA_VAN.5
dgst 675622bebaadcecb 1dab1c190f3b92d2
heuristics/cert_id NSCIB-CC-13-37968-CR CSA_CC_21006
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 1.1 2.2.1055
heuristics/protection_profiles f6d23054061d72ba {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf {}
pdf_data/cert_filename [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
    • EAL 4 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20220708024530+08'00'
  • /ModDate: D:20220711181729+08'00'
  • pdf_file_size_bytes: 495889
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename [CR] NSCIB-CC-13-37968-CR.pdf [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf
pdf_data/report_frontpage
  • NL:
    • cert_id: NSCIB-CC-13-37968-CR
    • cert_item: Firmware Libraries V1.1 on P40C012/040/072 VD
    • cert_lab: Brightsight
    • developer: NXP Semiconductors Germany GmbH
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-13-37968: 1
    • NSCIB-CC-13-37968-CR: 15
  • SG:
    • CSA_CC_21006: 2
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL5: 2
    • EAL5 augmented: 2
    • EAL5+: 4
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_TDS: 1
  • ALC:
    • ALC_DVS.2: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN.5: 2
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.5: 4
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 9
    • NXP Semiconductors: 16
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
  • An:
    • An Security: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • 3DES:
      • 3DES: 2
      • Triple-DES: 2
    • DES:
      • DES: 3
  • constructions:
    • MAC:
      • CBC-MAC: 2
      • CMAC: 1
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 1
    • SHA2:
      • SHA-224: 2
      • SHA-256: 4
      • SHA-384: 2
      • SHA-512: 2
pdf_data/report_keywords/randomness
  • PRNG:
    • PRNG: 1
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • ECB:
    • ECB: 2
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 18
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 1.4: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 2
  • SCA:
    • DPA: 1
    • SPA: 1
    • timing attacks: 2
  • other:
    • JIL: 6
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816-3: 1
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 18045: 4
pdf_data/report_metadata
pdf_data/st_filename [ST] P40_9511CL_CryptoLib_SecurityTargetLite_v1.1.pdf [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-13-37968: 2
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 5: 2
    • EAL4: 2
    • EAL4+: 2
    • EAL5: 15
    • EAL5 augmented: 2
  • EAL:
    • EAL4+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 5
    • ADV_FSP.5: 2
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 2
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 3
  • FCS:
    • FCS_CKM.1: 16
    • FCS_CKM.4: 18
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 54
    • FCS_COP.1.1: 6
    • FCS_RNG.1: 14
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 6
    • FDP_ACF.1: 6
    • FDP_IFC: 1
    • FDP_IFC.1: 8
    • FDP_ITC.1: 15
    • FDP_ITC.2: 15
    • FDP_ITT: 1
    • FDP_ITT.1: 10
    • FDP_RIP.1: 8
    • FDP_RIP.1.1: 1
    • FDP_SDI.2: 3
    • FDP_SOP: 7
    • FDP_SOP.1: 18
    • FDP_SOP.1.1: 3
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 5
    • FMT_MSA.1: 6
    • FMT_MSA.3: 6
    • FMT_SMF.1: 11
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT: 1
    • FPT_ITT.1: 10
    • FPT_PHP.3: 5
    • FPT_TST.1: 3
  • FRU:
    • FRU_FLT.2: 8
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
pdf_data/st_keywords/cc_claims
  • O:
    • O.AES: 4
    • O.CUST_RECONFIG: 4
    • O.DES: 4
    • O.HW_AES: 4
    • O.INTEGRITY_CHK: 3
    • O.MEM_ACCESS: 4
    • O.NVM_INTEGRITY: 3
    • O.REUSE: 5
    • O.RND: 10
    • O.RSA: 3
    • O.SFR_ACCESS: 3
    • O.SHA: 4
  • T:
    • T.RND: 5
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 21
    • NXP Semiconductors: 28
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 38
  • DES:
    • 3DES:
      • 3DES: 4
      • TDEA: 1
      • TDES: 6
      • Triple-DEA: 1
      • Triple-DES: 8
    • DES:
      • DEA: 1
      • DES: 30
  • constructions:
    • MAC:
      • CBC-MAC: 6
      • CMAC: 10
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 1
    • RSA-OAEP: 1
    • RSA-PSS: 1
pdf_data/st_keywords/pq_crypto
  • HQC:
    • HQC: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 14
    • SHA2:
      • SHA-224: 10
      • SHA-256: 11
      • SHA-384: 10
      • SHA-512: 10
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 15
    • RNG: 30
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • CCM:
    • CCM: 3
  • ECB:
    • ECB: 8
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 103
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library : 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 5
    • Malfunction: 6
    • malfunction: 2
  • SCA:
    • DPA: 4
    • Leak-Inherent: 6
    • Physical Probing: 2
    • SPA: 1
    • Timing attacks: 1
    • side channel: 8
    • side-channel: 1
    • timing attack: 1
    • timing attacks: 4
  • other:
    • JIL: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2012-09-001: 2
    • CCMB-2012-09-002: 2
    • CCMB-2012-09-003: 2
    • CCMB-2012-09-004: 2
  • FIPS:
    • FIPS 180-3: 2
    • FIPS PUB 197: 2
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 7816: 4
    • ISO/IEC 7816-3: 3
  • NIST:
    • NIST SP 800-90: 1
  • PKCS:
    • PKCS #1: 3
    • PKCS#1: 2
pdf_data/st_metadata
  • /Author: Tan Kok Kheng
  • /CreationDate: D:20220526092514+08'00'
  • /Creator: Microsoft® Word for Microsoft 365
  • /ModDate: D:20220708070046+08'00'
  • /Producer: Microsoft® Word for Microsoft 365
  • /Title: Technical Manual Template
  • pdf_file_size_bytes: 516888
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
state/cert/convert_garbage False True
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
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state/report/pdf_hash Different Different
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