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ST Engineering Data Diode Model 328X CSA_CC_20002 |
Taiwan eID Applet EAC with AA on ID-one V8.1 - Standard LDS Platform on NXP P6021M VB and on ID-One Cosmo v8.1-N -Large Platform on NXP P6022M VB (version 03 00 00 00) ANSSI-CC-2017/70 |
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name | ST Engineering Data Diode Model 328X | Taiwan eID Applet EAC with AA on ID-one V8.1 - Standard LDS Platform on NXP P6021M VB and on ID-One Cosmo v8.1-N -Large Platform on NXP P6022M VB (version 03 00 00 00) |
category | Boundary Protection Devices and Systems | ICs, Smart Cards and Smart Card-Related Devices and Systems |
scheme | SG | FR |
status | active | archived |
not_valid_after | 09.06.2025 | 14.02.2023 |
not_valid_before | 10.06.2020 | 14.02.2018 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC%20Certificate%20ST%20Data%20Diode%20328X.pdf | |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Data%20Diode%20328X%20Certification%20Report%20v1.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cc-2017_70_idemia.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/STEng%20Data%20Diode%20328X%20Security%20Target_v2.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st-2017_70.pdf |
manufacturer | ST Engineering Electronics | Oberthur Technologies / NXP Semiconductors GmbH |
manufacturer_web | https://www.stengg.com | https://www.oberthur.com/ |
security_level | AVA_VAN.5, EAL4+ | EAL5+, AVA_VAN.5, ALC_DVS.2 |
dgst | 5ccf6e9e3b708da3 | b00b7af7d8b32990 |
heuristics/cert_id | CSA_CC_20002 | ANSSI-CC-2017/70 |
heuristics/cert_lab | [] | CEA |
heuristics/extracted_sars | ADV_IMP.1, AVA_VAN.5, ADV_ARC.1, ADV_FSP.4, ATE_IND.2, AGD_PRE.1, ALC_CMC.4, AGD_OPE.1, ASE_REQ.2, ASE_ECD.1, ATE_COV.2, ASE_OBJ.2, ASE_SPD.1, ADV_TDS.3, ASE_INT.1, ASE_TSS.1, ALC_DEL.1, ATE_DPT.1, ALC_DVS.1, ALC_TAT.1, ASE_CCL.1, ALC_LCD.1, ATE_FUN.1, ALC_CMS.4 | ALC_DVS.2, ADV_IMP.1, AGD_OPE.1, AVA_VAN.5, ASE_TSS.2, ADV_ARC.1, ATE_DPT.1, ADV_FSP.4, ADV_TDS.3, AGD_PRE.1 |
heuristics/extracted_versions | - | 8.1 |
heuristics/report_references/directly_referencing | {} | ANSSI-CC-2017/49, ANSSI-CC-2010/03, BSI-DSZ-CC-0973-V2-2016, BSI-DSZ-CC-0955-V2-2016, ANSSI-CC-2017/47 |
heuristics/report_references/indirectly_referencing | {} | ANSSI-CC-2017/49, ANSSI-CC-2009/05, ANSSI-CC-2010/03, BSI-DSZ-CC-0973-V2-2016, BSI-DSZ-CC-0955-V2-2016, ANSSI-CC-2017/47, ANSSI-CC-2009/26, ANSSI-CC-2009/06, BSI-DSZ-CC-0955-2016, BSI-DSZ-CC-0973-2016 |
heuristics/st_references/directly_referencing | {} | ANSSI-CC-2017/48 |
heuristics/st_references/indirectly_referencing | {} | BSI-DSZ-CC-0955-V2-2016, ANSSI-CC-2017/48 |
pdf_data/cert_filename | CC Certificate ST Data Diode 328X.pdf | |
pdf_data/cert_keywords/cc_cert_id |
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pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
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pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
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pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
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pdf_data/report_filename | ST Data Diode 328X Certification Report v1.pdf | anssi-cc-2017_70_idemia.pdf |
pdf_data/report_frontpage |
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pdf_data/report_keywords/cc_cert_id |
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pdf_data/report_keywords/cc_protection_profile_id |
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pdf_data/report_keywords/cc_security_level |
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pdf_data/report_keywords/cc_sar |
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pdf_data/report_keywords/cc_claims |
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pdf_data/report_keywords/vendor |
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pdf_data/report_keywords/eval_facility |
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pdf_data/report_keywords/symmetric_crypto |
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pdf_data/report_keywords/crypto_protocol |
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pdf_data/report_keywords/standard_id |
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pdf_data/report_metadata |
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pdf_data/st_filename | STEng Data Diode 328X Security Target_v2.pdf | st-2017_70.pdf |
pdf_data/st_keywords/cc_cert_id |
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pdf_data/st_keywords/cc_protection_profile_id |
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pdf_data/st_keywords/cc_security_level |
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pdf_data/st_keywords/cc_sar |
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pdf_data/st_keywords/cc_sfr |
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pdf_data/st_keywords/cc_claims |
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pdf_data/st_keywords/vendor |
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pdf_data/st_keywords/symmetric_crypto |
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pdf_data/st_keywords/asymmetric_crypto |
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pdf_data/st_keywords/hash_function |
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pdf_data/st_keywords/crypto_scheme |
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pdf_data/st_keywords/crypto_protocol |
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pdf_data/st_keywords/cipher_mode |
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pdf_data/st_keywords/side_channel_analysis |
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pdf_data/st_keywords/ic_data_group |
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pdf_data/st_keywords/standard_id |
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pdf_data/st_metadata |
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state/cert/convert_garbage | True | False |
state/cert/convert_ok | True | False |
state/cert/download_ok | True | False |
state/cert/extract_ok | True | False |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |