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PostgreSQL Certified Version V8.1.5 for Linux
JISEC-CC-CRP-C0089 		Samsung S3CT9KA / S3CT9K7 / S3CT9K3 16-bit RISC Microcontroller for Smart Card, Revision 0 with optional Secure RSA/ECC Library Version 1.0 including specific IC Dedicated Software
BSI-DSZ-CC-0719-2011
name PostgreSQL Certified Version V8.1.5 for Linux Samsung S3CT9KA / S3CT9K7 / S3CT9K3 16-bit RISC Microcontroller for Smart Card, Revision 0 with optional Secure RSA/ECC Library Version 1.0 including specific IC Dedicated Software
category Databases ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 07.10.2013 01.09.2019
not_valid_before 22.03.2007 19.05.2011
report_link https://www.commoncriteriaportal.org/files/epfiles/c0089_ecvr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0719a_pdf.pdf
st_link https://www.commoncriteriaportal.org/files/epfiles/ https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0719b_pdf.pdf
manufacturer NTT Data Corporation Samsung Electronics Co., Ltd.
manufacturer_web https://www.samsung.com
security_level EAL1 ALC_DVS.2, EAL5+, AVA_VAN.5
dgst 5646aebd043d2630 200fa846782ecbb5
heuristics/cert_id JISEC-CC-CRP-C0089 BSI-DSZ-CC-0719-2011
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 8.1.5 1.0
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0720-2011, KECS-ISIS-0468-2013, BSI-DSZ-CC-0719-V2-2016
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0639-2010
heuristics/report_references/indirectly_referenced_by {} BSI-DSZ-CC-0720-2011, BSI-DSZ-CC-0720-V2-2016, BSI-DSZ-CC-0882-2013, BSI-DSZ-CC-0802-2012, KECS-ISIS-0468-2013, BSI-DSZ-CC-0882-V2-2019, BSI-DSZ-CC-0719-V2-2016, BSI-DSZ-CC-0801-2012
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0639-2010, BSI-DSZ-CC-0547-2009
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0089
  • certification_date: 01.03.2007
  • claim: EAL1
  • enhanced:
    • assurance_level: EAL1
    • description: PRODUCT DESCRIPTION PostgreSQL Certified Version is a relational database management system, which is applicable to enterprise business. It is an enhanced version of the open source PostgreSQL and delivered from NTT Data Corp. PostgreSQL Certified Version runs on Red Hat Enterprise Linux AS v.4 for x86.
    • evaluation_facility: Japan Electronics and Information Technology Industries Association, Information Technology Security Center (JEITA ITSEC)
    • product: PostgreSQL Certified Version
    • product_type: IT Product (Database management system)
    • toe_version: V8.1.5 for Linux
    • vendor: NTT DATA CORPORATION
  • expiration_date: 01.10.2013
  • supplier: NTT DATA CORPORA TION
  • toe_japan_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0089_it6109.html
  • toe_japan_name: PostgreSQL Certified Version V8.1.5 for Linux
  • toe_overseas_link: None
  • toe_overseas_name: -----
heuristics/st_references/directly_referenced_by {} KECS-ISIS-0468-2013
heuristics/st_references/indirectly_referenced_by {} KECS-ISIS-0468-2013
heuristics/protection_profiles {} f6d23054061d72ba
maintenance_updates
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0089_ecvr.pdf 0719a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0719-2011
    • cert_item: Samsung S3CT9KA / S3CT9K7 / S3CT9K3 16-bit RISC Microcontroller for Smart Card, Revision 0 with optional Secure RSA/ECC Library Version 1.0 including specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0639-2010: 3
    • BSI-DSZ-CC-0719: 2
    • BSI-DSZ-CC-0719-2011: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0035-2007: 1
    • BSI-CC-PP-0035-2007: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
  • EAL:
    • EAL 4: 2
    • EAL 5: 6
    • EAL 5 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 8
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 2
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 31
pdf_data/report_keywords/eval_facility
  • ITSC:
    • Information Technology Security Center: 1
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • 3DES:
      • 3DES: 2
      • Triple-DES: 2
    • DES:
      • DES: 5
  • constructions:
    • MAC:
      • HMAC: 2
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 4
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA1: 1
    • SHA2:
      • SHA-224: 1
      • SHA-256: 1
      • SHA-384: 1
      • SHA-512: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 9
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • physical tampering: 1
  • SCA:
    • DPA: 3
    • SPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 20: 1
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 38: 1
    • AIS20: 2
    • AIS31: 2
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • Electronics (confidential document) [9] Security Target Lite of S3CT9KA / S3CT9K7 / S3CT9K3 16-bit RISC Microcontroller for Smart: 1
    • Evaluation (ETR-COMP), BSI-DSZ-CC-0719, S3CT9KA / S3CT9K7 / S3CT9K3, Version 1, 2011-04-29, TÜViT (confidential document) 8 specifically • AIS 20, Version 1, 2. December 1999, Funktionalitätsklassen und: 1
    • Secure RSA and ECC Library – Project Crow II, Version 1.3, 2011-04-20, Samsung Electronics (confidential document) [7] Evaluation Technical Report Summary (ETR SUMMARY), BSI-DSZ-CC-0719, S3CT9KA / S3CT9K7 : 1
    • Version 1, 2011-04-29, TÜViT (confidential document) [8] Life Cycle Definition (Class ALC_CMC.4/CMS.5) – Project Crow II, Version 1.0, 2011-03-21: 1
pdf_data/report_metadata
  • /Author: IPA/JISEC
  • /Company: IPA/ISEC
  • /CreationDate: D:20070406181635+09'00'
  • /Creator: Word 用 Acrobat PDFMaker 6.0
  • /ModDate: D:20070406181648+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /SourceModified: D:20070404120340
  • /Title: TOE List
  • pdf_file_size_bytes: 20755
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20110715095208+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Samsung S3CT9KA / S3CT9K7 / S3CT9K3 16-bit RISC Microcontroller for Smart Card, Revision 0 with optional Secure RSA/ECC Library Version 1.0 including specific IC Dedicated Software, Samsung Electronics"
  • /ModDate: D:20110715095543+02'00'
  • /Producer: OpenOffice.org 3.2
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0719-2011
  • pdf_file_size_bytes: 972498
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
pdf_data/st_filename 0719b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.2: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM: 4
    • FCS_CKM.1: 21
    • FCS_CKM.2: 2
    • FCS_CKM.4: 11
    • FCS_COP: 19
    • FCS_COP.1: 23
    • FCS_RNG: 11
    • FCS_RNG.1: 19
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 2
    • FDP_ACC.1: 13
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 9
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 10
    • FDP_ITC.2: 10
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM: 8
    • FMT_LIM.1: 24
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 28
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 9
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 3
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 6
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 5
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 3
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 14
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 9
  • constructions:
    • MAC:
      • HMAC: 2
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 27
    • ECDH:
      • ECDH: 9
    • ECDSA:
      • ECDSA: 15
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
  • RSA:
    • RSA-CRT: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 1
      • SHA1: 2
    • SHA2:
      • SHA-224: 2
      • SHA-256: 2
      • SHA-384: 2
      • SHA-512: 2
      • SHA224: 6
      • SHA256: 6
      • SHA384: 6
      • SHA512: 2
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 1
  • TRNG:
    • DTRNG: 2
    • TRNG: 16
pdf_data/st_keywords/cipher_mode
  • ECB:
    • ECB: 3
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP192t1: 4
    • brainpoolP224r1: 4
    • brainpoolP224t1: 4
    • brainpoolP256r1: 4
    • brainpoolP256t1: 4
    • brainpoolP320r1: 4
    • brainpoolP320t1: 4
    • brainpoolP384r1: 4
    • brainpoolP384t1: 4
    • brainpoolP512r1: 4
    • brainpoolP512t1: 4
  • NIST:
    • P-192: 8
    • P-224: 8
    • P-256: 8
    • P-384: 8
    • secp192k1: 4
    • secp192r1: 4
    • secp224k1: 4
    • secp224r1: 4
    • secp256k1: 4
    • secp256r1: 4
    • secp384r1: 4
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 1
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 4
    • Malfunction: 24
    • fault injection: 2
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 12
    • Leak-Inherent: 21
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 10
    • physical probing: 9
    • side channel: 2
    • side-channel: 4
    • timing attack: 5
    • timing attacks: 1
  • other:
    • reverse engineering: 5
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 1
    • AIS 31: 2
    • AIS20: 3
    • AIS31: 2
  • CC:
    • CCMB-2009-07-001: 3
    • CCMB-2009-07-002: 3
    • CCMB-2009-07-003: 3
    • CCMB-2009-07-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS PUB 180-3: 6
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: SungGeun Park
  • /CreationDate: D:20110516173531+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target of S3CT9KA/K7/K3 16-bit Secure RISC Microcontroller For Smart Card with optional Secure RSA and ECC Library including specific IC Dedicated Software, CC EAL5+, Samsung Electroncis, SmartCard IC, Common Criteria version 3.1
  • /ModDate: D:20110516174952+09'00'
  • /Producer: Acrobat Distiller 9.0.0 (Windows)
  • /Subject: S3CT9KA/K7/K3 Common Criteria(version 3.1) EAL5+ Evaluation
  • /Title: Security Target Lite of S3CT9KA/K7/K3 16-bit RISC Microcontroller For Smart Cards
  • pdf_file_size_bytes: 753587
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 67
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