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	Rambus PKE4 Core version 4.1 NSCIB-CC-0503107-CR	Samsung SP of S3B512C revision 3 2021-23-INF-4038
name	Rambus PKE4 Core version 4.1	Samsung SP of S3B512C revision 3
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	NL	ES
status	active	active
not_valid_after	11.12.2028	08.04.2028
not_valid_before	11.12.2023	08.04.2023
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0503107-CERT.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23_Certificado.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0503107-CR.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20INF-4038.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST-LITE]%20Rambus_PKE4_Core_version_4.1_Security_Target_Lite_RevD.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20ST_Lite.pdf
manufacturer	Rambus Inc.	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.rambus.com/	https://www.samsung.com
security_level	EAL4+, ATE_DPT.2, ALC_DVS.2, AVA_VAN.5	EAL2
dgst	505cf4bb7f73e46d	95f760528ffedd31
heuristics/cert_id	NSCIB-CC-0503107-CR	2021-23-INF-4038
heuristics/cert_lab		[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ATE_DPT.2, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ASE_REQ.2, ADV_FSP.4, ATE_IND.2, ASE_CCL.1	ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions	4.1	3
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	cert_id: NSCIB-CC-23-0503107-CR cert_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/12/nscib-cc-0503107-cert.pdf level: EAL4 augmented with AVA_VAN.5, ALC_DVS.2 and ATE_DPT.2 manufacturer: Rambus Inc. manufacturer_link: https://www.rambus.com product: PKE4 Core version 4.1 report_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/12/nscib-cc-0503107-cr.pdf scheme: NSCIB target_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/12/st-lite-rambus_pke4_core_version_4.1_security_target_lite_revd.pdf	category: Biometric Devices certification_date: 08.04.2023 enhanced: category: Biometric Devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1701 certification_date: 08.04.2023 description: The SP of S3B512C single-chip CMOS micro-controller is designed and packaged specifically for "Biometric Smart Card" applications. The Cortex-M33 CPU architecture of the SP of S3B512C microcontrollerfollows the Harvard style, that is, it has separate program memory and data memory. Both instruction and data can be fetched simultaneously without causing a stall, using separate paths for memory access. The main security features of the SP of S3B512C integrated circuit are: Secure fingerprint image capture and feature extraction provided by TOE SP firmware, integrity protected. Access control of Users to Flash memory positions where SP firmware is executed. TOE Unique Identification Countermeasures to avoid attackers reproduction of fingerprint data. An AES hardware block supporting AES encryption and decryption with 128-bit, 192-bit and 256-bit keys in ECB mode. The AES block supports encryption of fingerprint features to be sent to SE of S3B512C. Note SE (Secure Element) is not TOE. evaluation_facility: Applus Laboratories level: EAL2 manufacturer: Samsung Electronics Co., Ltd report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1702 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1700 type: Product manufacturer: Samsung Electronics Co., Ltd product: Samsung SP of S3B512C revision 3 product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/974-samsung-sp-of-s3b512c-revision-3
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	NSCIB-CC-0503107-CERT.pdf	2021-23_Certificado.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id	NL: CC-23-0503107: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level	EAL: EAL2: 1 EAL4: 1 EAL4 augmented: 1 EAL7: 1	EAL: EAL 2: 1 EAL 4: 1 EAL2: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_DVS.2: 1 ALC_FLR.3: 2 ATE: ATE_DPT.2: 1 AVA: AVA_VAN.5: 1	ALC: ALC_FLR: 2
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims	R: R.L: 1	O: O.E: 1 T: T.I: 1
pdf_data/cert_keywords/vendor		Samsung: Samsung: 3
pdf_data/cert_keywords/eval_facility	BrightSight: Brightsight: 1 SGS: SGS: 1 SGS Brightsight: 1	Applus: Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id	ISO: ISO/IEC 15408-1: 1 ISO/IEC 15408-2: 1 ISO/IEC 15408-3: 1 ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: kruitr /CreationDate: D:20231220083238+01'00' /Creator: Bullzip PDF Printer (11.10.0.2761) /ModDate: D:20231220083308+01'00' /Producer: PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH /Title: Microsoft Word - NSCIB-CC-0503107-CERT.doc pdf_file_size_bytes: 266966 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 913137 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2
pdf_data/report_filename	NSCIB-CC-0503107-CR.pdf	2021-23 INF-4038.pdf
pdf_data/report_frontpage	NL: cert_id: NSCIB-CC-0503107-CR cert_item: PKE4 Core version 4.1 cert_lab: SGS Brightsight B.V. developer: Rambus Inc	NL:
pdf_data/report_keywords/cc_cert_id	NL: NSCIB-CC-0503107-CR: 12	ES: 2021-23-INF-4038- v1: 1
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL4: 6 EAL4 augmented: 3 EAL4+: 7	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 8 ITSEC: ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_IMP: 1 ALC: ALC_DVS.2: 2 ATE: ATE_DPT.2: 2 ATE_FUN: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 6	ADV: ADV_ARC.1: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.2: 1 ALC_DEL.1: 1 ALC_FLR: 2 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_SPD.1: 1 ATE: ATE_COV.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		Samsung: Samsung: 14
pdf_data/report_keywords/eval_facility	BrightSight: Brightsight: 2 SGS: SGS: 2 SGS Brightsight: 2	Applus: Applus Laboratories: 4
pdf_data/report_keywords/symmetric_crypto		AES_competition: AES: AES: 7
pdf_data/report_keywords/asymmetric_crypto	ECC: ECC: ECC: 1 ECDH: ECDH: 3 ECDSA: ECDSA: 2 EdDSA: EdDSA: 1 FF: DH: Diffie-Hellman: 1
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme	PKE: PKE: 4
pdf_data/report_keywords/crypto_protocol		PGP: PGP: 1
pdf_data/report_keywords/randomness	RNG: RNG: 1 TRNG: TRNG: 1
pdf_data/report_keywords/cipher_mode	ECB: ECB: 1	ECB: ECB: 2
pdf_data/report_keywords/ecc_curve	Curve: Curve25519: 1 Edwards: Ed25519: 1 Ed448: 1 NIST: NIST P-192: 2 NIST P-224: 2 NIST P-256: 2 NIST P-384: 2 NIST P-521: 2 P-192: 2 P-224: 2 P-256: 2 P-384: 2 P-521: 2
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: DFA: 1 Fault Injection: 1 SCA: DPA: 1 side-channel: 1 other: JIL: 2 JIL-AAPS: 2 JIL-AM: 2
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name		IBM: SE: 5
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const	curves: SM2: 1 X25519: 1 X448: 1
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: JM2 /CreationDate: D:20231214140509+01'00' /Creator: Microsoft® Word 2019 /ModDate: D:20231214140509+01'00' /Producer: Microsoft® Word 2019 /Title: Certification Report pdf_file_size_bytes: 228518 pdf_hyperlinks: https://www.sogis.eu/, mailto:[email protected], http://www.tuv.com/nl, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 12	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 394885 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 13
pdf_data/st_filename	[ST-LITE] Rambus_PKE4_Core_version_4.1_Security_Target_Lite_RevD.pdf	2021-23 ST_Lite.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 10 EAL4 augmented: 2	EAL: EAL2: 5
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC: 1 ADV_ARC.1: 3 ADV_FSP: 1 ADV_FSP.4: 2 ADV_IMP: 1 ADV_IMP.1: 2 ADV_TDS.3: 3 AGD: AGD_OPE: 1 AGD_OPE.1: 2 AGD_PRE: 2 AGD_PRE.1: 2 ALC: ALC_CMC.4: 1 ALC_CMS: 1 ALC_CMS.4: 1 ALC_DEL: 1 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.1: 1 ALC_DVS.2: 9 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT.1: 2 ATE_DPT.2: 7 ATE_FUN.1: 2 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 11	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_FSP.2: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.2: 1 ALC_CMS.2: 1 ALC_DEL.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/st_keywords/cc_sfr	FCS: FCS_CKM: 34 FCS_CKM.1: 17 FCS_CKM.1.1: 1 FCS_CKM.2: 4 FCS_CKM.4: 28 FCS_CKM.4.1: 1 FCS_COP: 37 FCS_COP.1: 16 FCS_COP.1.1: 1 FDP: FDP_ACC.1: 2 FDP_IFC.1: 15 FDP_IFC.1.1: 1 FDP_IFF.1: 1 FDP_ITC.1: 30 FDP_ITC.1.1: 1 FDP_ITC.1.2: 1 FDP_ITC.1.3: 1 FDP_ITC.2: 6 FDP_ITT.1: 10 FDP_ITT.1.1: 1 FMT: FMT_MSA.3: 2 FPT: FPT_FLS.1: 13 FPT_FLS.1.1: 1 FPT_ITT.1: 10 FPT_ITT.1.1: 1 FRU: FRU_FLT.2: 11 FRU_FLT.2.1: 1	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 9 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM: 1 FCS_CKM.1: 4 FCS_CKM.4: 7 FCS_CKM.4.1: 1 FCS_COP: 1 FCS_COP.1: 6 FCS_COP.1.1: 1 FDP: FDP_ACC: 1 FDP_ACC.1: 15 FDP_ACC.1.1: 1 FDP_ACF: 2 FDP_ACF.1: 7 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC.1: 10 FDP_ITC: 2 FDP_ITC.1: 10 FDP_ITC.1.1: 1 FDP_ITC.1.2: 1 FDP_ITC.1.3: 1 FDP_ITC.2: 4 FDP_ITT: 1 FDP_ITT.1: 6 FDP_ITT.1.1: 1 FDP_RIP: 1 FDP_RIP.1: 1 FDP_RIP.2: 6 FDP_RIP.2.1: 1 FDP_SDI: 1 FDP_SDI.1: 1 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_UCT: 1 FDP_UCT.1: 6 FDP_UCT.1.1: 1 FDP_UIT: 1 FDP_UIT.1: 6 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FMT: FMT_MSA: 2 FMT_MSA.1: 9 FMT_MSA.1.1: 1 FMT_MSA.3: 11 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF.1: 3 FMT_SMR.1: 6 FPT: FPT_ITT: 1 FPT_ITT.1: 6 FPT_ITT.1.1: 1 FTP: FTP_ITC.1: 4 FTP_TRP: 1 FTP_TRP.1: 10 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims	A: A.RNG: 5 D: D.J: 1 O: O.ECC: 8 O.RSA: 7 OE: OE.RNG: 4	O: O.AES: 10
pdf_data/st_keywords/vendor		Samsung: Samsung: 20
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto		AES_competition: AES: AES: 36
pdf_data/st_keywords/asymmetric_crypto	ECC: ECC: ECC: 38 ECDH: ECDH: 11 ECDSA: ECDSA: 8 EdDSA: EdDSA: 9 FF: DH: Diffie-Hellman: 6 DSA: DSA: 2	ECC: ECC: ECC: 4
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	KA: Key Agreement: 1 KEX: Key exchange: 1 PKE: PKE: 36	MAC: MAC: 2
pdf_data/st_keywords/crypto_protocol	PGP: PGP: 1	PGP: PGP: 1
pdf_data/st_keywords/randomness	PRNG: PRNG: 7 RNG: RNG: 9 TRNG: TRNG: 5	RNG: RNG: 1
pdf_data/st_keywords/cipher_mode		ECB: ECB: 3
pdf_data/st_keywords/ecc_curve	Curve: Curve25519: 1 Edwards: Ed25519: 3 Ed448: 5 NIST: NIST P-192: 6 NIST P-224: 5 NIST P-256: 6 NIST P-384: 6 NIST P-521: 6 P-192: 6 P-224: 5 P-256: 6 P-384: 6 P-521: 6
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Fault Injection: 1 fault injection: 1 malfunction: 1 SCA: DPA: 3 SPA: 1 side channel: 1 side-channel: 6 template attacks: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name		IBM: SE: 70
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS 20: 1 CC: CCMB-2017-04-0004: 1 CCMB-2017-04-001: 1 CCMB-2017-04-002: 1 CCMB-2017-04-003: 1 FIPS: FIPS 140-2: 1 FIPS 186-4: 6 FIPS PUB 140-2: 1 NIST: NIST SP 800-186: 4 PKCS: PKCS#1: 4 RFC: RFC 5639: 5 RFC 7748: 4 RFC 8032: 5	CC: CCMB-2017-04-001: 1 CCMB-2017-04-002: 1 CCMB-2017-04-003: 1 CCMB-2017-04-004: 1 FIPS: FIPS 197: 1 FIPS197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const	curves: SM2: 16 X25519: 1 X448: 1
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: 240 in [PP] This refinement refers to configuration in Phase 2 or Phase 7. This refinement is out of scope for the TOE 241 in [PP] This refinement refers to downloading of embedded software. This refinement: 1 This refinement relates to requirements concerting embedded software. This requirement is regarded out of scope for the TOE. 235 in [PP] This refinement is applicable without any adjustments. Guidance documents: 1 contribute to SFRs. This refinement is regarded out of scope for the TOE. 217 in [PP] The ST redefines this refinement as follows. The Functional Specification: 1 in [PP] This refinement is out of scope for the TOE because it refers to the CMS refinement. 206 in [PP] This refinement is out of scope: 1 mechanisms. 218 in [PP] This refinement refers to operating conditions. This refinement is regarded out of scope for the TOE. ADV_IMP 223 in [PP] This refinement is applicable without any adjustments. It must be: 1 must be tested under different operating conditions within the specified ranges. This refinement is out of scope for the TOE. 227 in [PP] This refinement relates to physical testing. This refinement is out of: 1 out of scope: 12 out of scope for the TOE. AVA_VAN 245 in [PP] The ST redefines this refinement as follows. The vulnerability: 1 related to the development and production of the TOE. ALC_CMS 199 in [PP] This refinement is out of scope for the TOE because it relates to consumer software that can be part of manufacturing and delivery: 1 to test software delivered but not available in the operational phase. This refinement is regarded out of scope for the TOE. 216 in [PP] This refinement refers to features that do not provide functionality but: 1 transitions of power save modes if provided by the TOE. 210 in [PP] This refinement in [PP] is out of scope for the TOE because it relates to test features used in wafer testing. ADV_FSP 215 in [PP] This: 1
pdf_data/st_metadata	/CreationDate: D:20231211070817-08'00' /Creator: Microsoft® Word for Microsoft 365 /ModDate: D:20231211070817-08'00' /Producer: Microsoft® Word for Microsoft 365 /Subject: Common Criteria Security Target Lite /Title: PKE V4.1 Security Target Lite pdf_file_size_bytes: 606225 pdf_hyperlinks: mailto:[email protected], https://www.rambus.com/, mailto:[email protected][email protected] pdf_is_encrypted: False pdf_number_of_pages: 29	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 1418253 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 51
state/cert/convert_garbage	False	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different