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Rambus PKE4 Core version 4.1
NSCIB-CC-0503107-CR 		S3CC91A 16-bit RISC Microcontroller for Smart Card, Revision 3
BSI-DSZ-CC-0483-2008
name Rambus PKE4 Core version 4.1 S3CC91A 16-bit RISC Microcontroller for Smart Card, Revision 3
scheme NL DE
status active archived
not_valid_after 11.12.2028 01.09.2019
not_valid_before 11.12.2023 01.07.2008
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0503107-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0503107-CR.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0483a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST-LITE]%20Rambus_PKE4_Core_version_4.1_Security_Target_Lite_RevD.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0483b.pdf
manufacturer Rambus Inc. Samsung Electronics Co., Ltd.
manufacturer_web https://www.rambus.com/ https://www.samsung.com
security_level EAL4+, ATE_DPT.2, ALC_DVS.2, AVA_VAN.5 ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2
dgst 505cf4bb7f73e46d 7db14b2410ce0ed3
heuristics/cert_id NSCIB-CC-0503107-CR BSI-DSZ-CC-0483-2008
heuristics/cert_lab BSI
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ATE_DPT.2, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ASE_REQ.2, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 ATE_COV.2, ADV_RCR.1, ALC_TAT.1, ADV_FSP.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, AVA_SOF.1, ADV_SPM.1, AVA_MSU.3
heuristics/extracted_versions 4.1 16, 3
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0581-2009, BSI-DSZ-CC-0548-2008
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0451-2007
heuristics/report_references/indirectly_referenced_by {} BSI-DSZ-CC-0581-2009, BSI-DSZ-CC-0548-2008
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0438-2007, BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0451-2007
heuristics/scheme_data
maintenance_updates
pdf_data/cert_filename NSCIB-CC-0503107-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-23-0503107: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL4: 1
    • EAL4 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR.3: 2
  • ATE:
    • ATE_DPT.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
  • R:
    • R.L: 1
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 1
    • ISO/IEC 15408-2: 1
    • ISO/IEC 15408-3: 1
    • ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: kruitr
  • /CreationDate: D:20231220083238+01'00'
  • /Creator: Bullzip PDF Printer (11.10.0.2761)
  • /ModDate: D:20231220083308+01'00'
  • /Producer: PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH
  • /Title: Microsoft Word - NSCIB-CC-0503107-CERT.doc
  • pdf_file_size_bytes: 266966
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-0503107-CR.pdf 0483a.pdf
pdf_data/report_frontpage
  • DE:
  • NL:
    • cert_id: NSCIB-CC-0503107-CR
    • cert_item: PKE4 Core version 4.1
    • cert_lab: SGS Brightsight B.V.
    • developer: Rambus Inc
  • DE:
    • cert_id: BSI-DSZ-CC-0483-2008
    • cert_item: S3CC91A 16-bit RISC Microcontroller for Smart Card, Revision 3
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-0503107-CR: 12
  • DE:
    • BSI-DSZ-CC-0451-2007: 1
    • BSI-DSZ-CC-0483: 1
    • BSI-DSZ-CC-0483-2008: 19
  • NL:
    • CC-0451-2007: 1
    • CC-0483: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 6
    • EAL4 augmented: 3
    • EAL4+: 7
  • EAL:
    • EAL 1: 1
    • EAL 4: 9
    • EAL 4 augmented: 4
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
  • ATE:
    • ATE_DPT.2: 2
    • ATE_FUN: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 6
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 16
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
  • SGS:
    • SGS: 2
    • SGS Brightsight: 2
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 7
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
    • ECDH:
      • ECDH: 3
    • ECDSA:
      • ECDSA: 2
    • EdDSA:
      • EdDSA: 1
  • FF:
    • DH:
      • Diffie-Hellman: 1
  • ECC:
    • ECDSA:
      • ECDSA: 1
pdf_data/report_keywords/crypto_scheme
  • PKE:
    • PKE: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • ECB:
    • ECB: 1
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/ecc_curve
  • Curve:
    • Curve25519: 1
  • Edwards:
    • Ed25519: 1
    • Ed448: 1
  • NIST:
    • NIST P-192: 2
    • NIST P-224: 2
    • NIST P-256: 2
    • NIST P-384: 2
    • NIST P-521: 2
    • P-192: 2
    • P-224: 2
    • P-256: 2
    • P-384: 2
    • P-521: 2
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 2
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Fault Injection: 1
  • SCA:
    • DPA: 1
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • Bellcore attack: 1
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 1
    • AIS 38: 1
    • AIS20: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/javacard_api_const
  • curves:
    • SM2: 1
    • X25519: 1
    • X448: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 1.1, 2008-04-10, Samsung Electronics (confidential document) [9] Security Target Lite of S3CC91A 16-bit RISC Microcontroller for Smart Cards, Version 1.0: 1
    • 2, 2008-06-03, TÜViT (confidential document) [8] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne (S3CC91A: 1
    • EVALUATION (ETR-COMP), 8103270436_40 / BSI-DSZ- CC-0483, S3CC91A, Version 2, 2008-06-03, TÜViT (confidential document) [12] Security Application Note, S3CC91A, Version 1.4, 2008-03-31, Samsung Electronics 8: 1
    • Microcontroller for Smart Cards – Project Cheyenne, Version 1.3, 2008-04-10, Samsung Electronics (confidential document) [7] EVALUATION TECHNICAL REPORT SUMMARY (ETR SUMMARY), 8103270436_40 / BSI-DSZ-CC-0483, S3CC91A: 1
pdf_data/report_metadata
  • /Author: Federal Office for Information Security
  • /CreationDate: D:20080717124808+02'00'
  • /Creator: Writer
  • /Keywords: "S3CC91A 16-bit RISC Microcontroller for Smart Card, Revision 3, BSI-DSZ-CC-0483-2008, Samsung Electronics Co., Ltd"
  • /ModDate: D:20080717151127+02'00'
  • /Producer: StarOffice 8
  • /Subject: Common Criteria Zertifizierung
  • /Title: Zertifizierungsreport BSI-DSZ-CC-0483-2008
  • pdf_file_size_bytes: 566022
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename [ST-LITE] Rambus_PKE4_Core_version_4.1_Security_Target_Lite_RevD.pdf 0483b.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 10
    • EAL4 augmented: 2
  • EAL:
    • EAL 4: 1
    • EAL4: 10
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 3
    • ADV_FSP: 1
    • ADV_FSP.4: 2
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_TDS.3: 3
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 2
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS: 1
    • ALC_CMS.4: 1
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 9
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.1: 2
    • ATE_DPT.2: 7
    • ATE_FUN.1: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 11
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 3
    • ADV_HLD: 1
    • ADV_HLD.1: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 1
    • ADV_LLD.1: 3
    • ADV_RCR: 1
    • ADV_RCR.1: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 5
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 2
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FCS:
    • FCS_CKM: 34
    • FCS_CKM.1: 17
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 4
    • FCS_CKM.4: 28
    • FCS_CKM.4.1: 1
    • FCS_COP: 37
    • FCS_COP.1: 16
    • FCS_COP.1.1: 1
  • FDP:
    • FDP_ACC.1: 2
    • FDP_IFC.1: 15
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 1
    • FDP_ITC.1: 30
    • FDP_ITC.1.1: 1
    • FDP_ITC.1.2: 1
    • FDP_ITC.1.3: 1
    • FDP_ITC.2: 6
    • FDP_ITT.1: 10
    • FDP_ITT.1.1: 1
  • FMT:
    • FMT_MSA.3: 2
  • FPT:
    • FPT_FLS.1: 13
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 10
    • FPT_ITT.1.1: 1
  • FRU:
    • FRU_FLT.2: 11
    • FRU_FLT.2.1: 1
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 29
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 19
    • FCS_CKM.4.1: 2
    • FCS_COP: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 22
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 15
    • FDP_ITC.1.1: 2
    • FDP_ITC.1.2: 2
    • FDP_ITC.1.3: 2
    • FDP_ITC.2: 17
    • FDP_ITC.2.1: 2
    • FDP_ITC.2.2: 2
    • FDP_ITC.2.3: 2
    • FDP_ITC.2.4: 2
    • FDP_ITC.2.5: 2
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 21
    • FMT_MSA.2.1: 2
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 2
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.RNG: 5
  • D:
    • D.J: 1
  • O:
    • O.ECC: 8
    • O.RSA: 7
  • OE:
    • OE.RNG: 4
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 38
    • ECDH:
      • ECDH: 11
    • ECDSA:
      • ECDSA: 8
    • EdDSA:
      • EdDSA: 9
  • FF:
    • DH:
      • Diffie-Hellman: 6
    • DSA:
      • DSA: 2
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
  • KEX:
    • Key exchange: 1
  • PKE:
    • PKE: 36
pdf_data/st_keywords/crypto_protocol
  • PGP:
    • PGP: 1
pdf_data/st_keywords/randomness
  • PRNG:
    • PRNG: 7
  • RNG:
    • RNG: 9
  • TRNG:
    • TRNG: 5
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/ecc_curve
  • Curve:
    • Curve25519: 1
  • Edwards:
    • Ed25519: 3
    • Ed448: 5
  • NIST:
    • NIST P-192: 6
    • NIST P-224: 5
    • NIST P-256: 6
    • NIST P-384: 6
    • NIST P-521: 6
    • P-192: 6
    • P-224: 5
    • P-256: 6
    • P-384: 6
    • P-521: 6
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 8
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
    • fault injection: 1
    • malfunction: 1
  • SCA:
    • DPA: 3
    • SPA: 1
    • side channel: 1
    • side-channel: 6
    • template attacks: 1
  • FI:
    • DFA: 1
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 5
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 3
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 1
  • CC:
    • CCMB-2017-04-0004: 1
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
  • FIPS:
    • FIPS 140-2: 1
    • FIPS 186-4: 6
    • FIPS PUB 140-2: 1
  • NIST:
    • NIST SP 800-186: 4
  • PKCS:
    • PKCS#1: 4
  • RFC:
    • RFC 5639: 5
    • RFC 7748: 4
    • RFC 8032: 5
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 7816: 4
    • ISO/IEC 9796-1: 3
pdf_data/st_keywords/javacard_api_const
  • curves:
    • SM2: 16
    • X25519: 1
    • X448: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • 240 in [PP] This refinement refers to configuration in Phase 2 or Phase 7. This refinement is out of scope for the TOE 241 in [PP] This refinement refers to downloading of embedded software. This refinement: 1
    • This refinement relates to requirements concerting embedded software. This requirement is regarded out of scope for the TOE. 235 in [PP] This refinement is applicable without any adjustments. Guidance documents: 1
    • contribute to SFRs. This refinement is regarded out of scope for the TOE. 217 in [PP] The ST redefines this refinement as follows. The Functional Specification: 1
    • in [PP] This refinement is out of scope for the TOE because it refers to the CMS refinement. 206 in [PP] This refinement is out of scope: 1
    • mechanisms. 218 in [PP] This refinement refers to operating conditions. This refinement is regarded out of scope for the TOE. ADV_IMP 223 in [PP] This refinement is applicable without any adjustments. It must be: 1
    • must be tested under different operating conditions within the specified ranges. This refinement is out of scope for the TOE. 227 in [PP] This refinement relates to physical testing. This refinement is out of: 1
    • out of scope: 12
    • out of scope for the TOE. AVA_VAN 245 in [PP] The ST redefines this refinement as follows. The vulnerability: 1
    • related to the development and production of the TOE. ALC_CMS 199 in [PP] This refinement is out of scope for the TOE because it relates to consumer software that can be part of manufacturing and delivery: 1
    • to test software delivered but not available in the operational phase. This refinement is regarded out of scope for the TOE. 216 in [PP] This refinement refers to features that do not provide functionality but: 1
    • transitions of power save modes if provided by the TOE. 210 in [PP] This refinement in [PP] is out of scope for the TOE because it relates to test features used in wafer testing. ADV_FSP 215 in [PP] This: 1
pdf_data/st_metadata
  • /Author: Kyungsuk Yi (Bryant)
  • /CreationDate: D:20080604112544+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Smartcard, IC, S3CC91A, 16-bit RISC Microcontroller For Smart Cards, 16-bit CMOS Microcontroller For Smart Cards, Samsung Electronics
  • /ModDate: D:20080609165146+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Subject: Securiti Target Lite
  • /Title: Security Target Lite of S3CC91A 16-bit RISC Microcontroller For Smart Cards
  • pdf_file_size_bytes: 540341
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 61
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