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ST19 platform (0.6æ technology) : ST19SF04A Integrated circuit
ANSSI-CC-2001/18 		NXP SN300 Series - Secure Element SN300_SE B1.1 J9
NSCIB-CC-2300122-01-CR
name ST19 platform (0.6æ technology) : ST19SF04A Integrated circuit NXP SN300 Series - Secure Element SN300_SE B1.1 J9
scheme FR NL
status archived active
not_valid_after 01.09.2019 04.12.2028
not_valid_before 01.01.2001 04.12.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2001_18.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-ST-Lite_v104.pdf
manufacturer STMicroelectronics NXP Semiconductors Germany GmbH
manufacturer_web https://www.st.com/ https://www.nxp.com
security_level ADV_IMP.2, ALC_FLR.1, AVA_VLA.4, EAL4+, ALC_DVS.2 EAL4+, ALC_DVS.2, AVA_VAN.5
dgst 4c2248dd71e6c457 c7190ae339b364a2
heuristics/cert_id ANSSI-CC-2001/18 NSCIB-CC-2300122-01-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_ENV.1, ADV_RCR.1, ASE_INT.1, ADV_HLD.2, AGD_USR.1, ALC_DVS.2, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, ADV_FSP.2, AVA_SOF.1, ATE_COV.2, ALC_FLR.1, ALC_TAT.1, AVA_MSU.2, ASE_TSS.1, AGD_ADM.1, ALC_LCD.1, ATE_FUN.1, ADV_IMP.2, ATE_DPT.1, AVA_VLA.4, ASE_SRE.1, ASE_OBJ.1, ATE_IND.2, ADV_LLD.1, ADV_SPM.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ADV_FSP.4, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 0.6 1.1
heuristics/report_references/directly_referenced_by {} NSCIB-CC-2200029-03-CR
heuristics/report_references/directly_referencing ANSSI-CC-2000/12 {}
heuristics/report_references/indirectly_referenced_by {} NSCIB-CC-2200029-03-CR
heuristics/report_references/indirectly_referencing ANSSI-CC-2000/12 {}
heuristics/scheme_data
heuristics/st_references/directly_referenced_by {} NSCIB-CC-2200029-03-CR
heuristics/st_references/indirectly_referenced_by {} NSCIB-CC-2200029-03-CR
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-CC-2300122-01-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-22-0441513: 1
    • NSCIB-2300122-01: 1
    • NSCIB-CC-2300122-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL4: 1
    • EAL4 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.3: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Haak
  • /CreationDate: D:20231213165447+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20231213165447+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 91845
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2001_18.pdf NSCIB-CC-2300122-01-CR.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300122-01-CR
    • cert_item: NXP SN300 Series - Secure Element SN300_SE B1.1 J9
    • cert_lab: SGS Brightsight B.V.
    • developer: NXP Semiconductors Germany
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2000/12: 1
    • Rapport de certification 2001/18: 3
  • NL:
    • CC-3: 1
  • NL:
    • CC-22-0441513: 1
    • NSCIB-2300122-01: 1
    • NSCIB-CC-2300122-01-CR: 11
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL4: 3
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
    • EAL4+: 3
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT.1: 1
    • ACM_CAP.4: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL.2: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP.2: 1
    • ADV_HLD.2: 1
    • ADV_IMP.2: 3
    • ADV_LLD.1: 1
    • ADV_RCR.1: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM.1: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS.2: 3
    • ALC_FLR.1: 3
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • AMA:
    • AMA_AMP.1: 1
    • AMA_CAT.1: 1
    • AMA_EVD.1: 1
    • AMA_SIA.2: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU.2: 1
    • AVA_SOF.1: 1
    • AVA_VLA.4: 4
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
  • AVA:
    • AVA_VAN.5: 2
pdf_data/report_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 18
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • Serma:
    • Serma Technologies: 4
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • DES:
      • DES: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
pdf_data/report_metadata
  • /Author: blad
  • /CreationDate: D:20011122113214
  • /Creator: FrameMaker 6.0
  • /ModDate: D:20011122114539+01'00'
  • /Producer: Acrobat Distiller 4.05 for Windows
  • /Title: RapportCertification.book
  • pdf_file_size_bytes: 107607
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
pdf_data/st_filename NSCIB-CC-2300122-01-ST-Lite_v104.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2300122-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 4
    • EAL4 augmented: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ: 2
    • ASE_REQ.2: 1
    • ASE_SPD: 2
    • ASE_SPD.1: 1
    • ASE_TSS: 2
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 108
    • NXP Semiconductors: 29
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 2
  • OFB:
    • OFB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-3: 2
  • ISO:
    • ISO/IEC 7816: 4
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: NXP B.V.
  • /CreationDate: D:20231025165048+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 Single Chip Secure Element and NFC Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL4 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 1321495
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different