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S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
BSI-DSZ-CC-0910-2016 		S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
BSI-DSZ-CC-0882-2013
name S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
not_valid_before 2016-11-30 2013-12-04
not_valid_after 2021-11-30 2019-09-01
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882b_pdf.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882a_pdf.pdf
maintenance_updates frozendict({'_type': 'sec_certs.sample.cc.CCCertificate.MaintenanceReport', 'maintenance_date': datetime.date(2018, 12, 20), 'maintenance_title': 'Reassessment - S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software', 'maintenance_report_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910ra1a_pdf.pdf', 'maintenance_st_link': None}), frozendict({'_type': 'sec_certs.sample.cc.CCCertificate.MaintenanceReport', 'maintenance_date': datetime.date(2018, 12, 20), 'maintenance_title': 'S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software', 'maintenance_report_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910ma1a_pdf.pdf', 'maintenance_st_link': None}) frozendict({'_type': 'sec_certs.sample.cc.CCCertificate.MaintenanceReport', 'maintenance_date': datetime.date(2017, 12, 11), 'maintenance_title': 'Reassessment - S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software', 'maintenance_report_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882ra2a_pdf.pdf', 'maintenance_st_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882ra2b_pdf.pdf'})
state/report/pdf_hash 200870bf0bb791cfadb4e399114a9a529ccc9d212213078ba644a9a802f5e7a1 a02a30ceadeadedcf2bd3b17e04c6055c60d645b5bfdd7bbdfb5333ee81f9b1c
state/report/txt_hash 56175c58ab9e2e12c07ce95a251f9bd5820337df113d6ba92e31c72364f94d09 643e9459ea3790a56bd0318f76485a8805041e9c690bb8d07e43b0e7f5a1cf22
state/st/pdf_hash 8274080fb1ed65d3877d570cdab7a09c79ad1b1e0afcd6b64245f1493f580581 caed053c4d600915c762daaa97b6fdebb0f612d28019a1a7a79fb1b3917eb98d
state/st/txt_hash a744cb55847d1dbde41fa9f58a681a3a75bf45c1d1808af4d3f93e8f5049af0b deaccc5d87c1ab0ac9bac72b142adfcd5bd16933c56aef3ffd983b6dc3f86847
heuristics/cert_id BSI-DSZ-CC-0910-2016 BSI-DSZ-CC-0882-2013
heuristics/extracted_versions 1.01 0, 32
heuristics/report_references/directly_referenced_by None BSI-DSZ-CC-0882-V2-2019
heuristics/report_references/directly_referencing None BSI-DSZ-CC-0801-2012
heuristics/report_references/indirectly_referenced_by None BSI-DSZ-CC-0882-V2-2019
heuristics/report_references/indirectly_referencing None BSI-DSZ-CC-0639-2010, BSI-DSZ-CC-0801-2012, BSI-DSZ-CC-0547-2009, BSI-DSZ-CC-0720-2011, BSI-DSZ-CC-0719-2011
pdf_data/report_filename 0910a_pdf.pdf 0882a_pdf.pdf
pdf_data/report_frontpage/DE
  • match_rules: (BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)
  • cert_id: BSI-DSZ-CC-0910-2016
  • cert_item: S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software
  • developer: Samsung Electronics
  • cert_lab: BSI
  • ref_protection_profiles: Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007
  • cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended
  • cc_security_level: Common Criteria Part 3 conformant EAL 5 augmented by ALC_DVS.2 and AVA_VAN.5
  • match_rules: (BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)
  • cert_id: BSI-DSZ-CC-0882-2013
  • cert_item: S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
  • developer: Samsung Electronics
  • cert_lab: BSI
pdf_data/report_frontpage/DE/cert_id BSI-DSZ-CC-0910-2016 BSI-DSZ-CC-0882-2013
pdf_data/report_frontpage/DE/cert_item S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
pdf_data/report_keywords/asymmetric_crypto/ECC
  • ECDH:
    • ECDH: 2
  • ECDSA:
    • ECDSA: 3
  • ECC:
    • ECC: 19
  • ECC:
    • ECC: 1
pdf_data/report_keywords/asymmetric_crypto/ECC/ECC/ECC 19 1
pdf_data/report_keywords/cc_cert_id/DE
  • BSI-DSZ-CC-0910-2016: 22
  • BSI-DSZ-CC-0882-2013: 22
  • BSI-DSZ-CC-0801-2012: 3
  • BSI-DSZ-CC-0882: 1
pdf_data/report_keywords/cc_sar/ALC/ALC_CMC 1 2
pdf_data/report_keywords/cc_sar/ALC/ALC_FLR 3 1
pdf_data/report_keywords/cc_sar/ATE/ATE_FUN 2 1
pdf_data/report_keywords/cc_sar/ATE/ATE_IND 2 1
pdf_data/report_keywords/cc_sar/AVA/AVA_VAN 3 2
pdf_data/report_keywords/cc_security_level/EAL
  • EAL 5: 13
  • EAL5: 1
  • EAL 4: 9
  • EAL 1: 7
  • EAL 2: 4
  • EAL 5+: 1
  • EAL 6: 4
  • EAL 3: 4
  • EAL 7: 4
  • EAL 5 augmented: 3
  • EAL 5: 7
  • EAL 4: 2
  • EAL1: 7
  • EAL4: 7
  • EAL5: 7
  • EAL5+: 1
  • EAL6: 4
  • EAL3: 4
  • EAL7: 4
  • EAL2: 3
  • EAL 5 augmented: 3
pdf_data/report_keywords/cc_security_level/EAL/EAL 4 9 2
pdf_data/report_keywords/cc_security_level/EAL/EAL 5 13 7
pdf_data/report_keywords/cc_security_level/EAL/EAL5 1 7
pdf_data/report_keywords/certification_process/ConfidentialDocument
  • being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1
  • ECC Library including specific IC Dedicated Software, Version 3.2, 2016-10-07, Samsung Electronics (confidential document) [7] Evaluation Technical Report, Version 6, 2016-11-21, Evaluation Ttechnical Report Summary (ETR: 1
  • TÜV Informationstechnik GmbH, (confidential document) [8] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [9: 1
  • / S3FV5RK / S3FV5RJ / S3FV5RH Revision 0, version 6, 2016-11-21, TÜV Informationstechnik GmbH. (confidential document) [11] Tornado-E ECC Library API Manual, Version 0.21, 2015-10-13, Samsung Electronics [12] HW DTRNG: 1
  • Software (Project Kansa), BSI-DSZ-CC-0882-2013, Version 1.9, 2013-10-21, Samsung Electronics (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
  • Report Summary (ETR Summary), BSI-DSZ-CC-0882, S3CS9AB Revision 0, Version 3, 2013-11-27, TÜViT (confidential document) [10] ETR for composite evaluation according to AIS 36 for the Product S3CS9AB Revision 0, Version: 1
  • 2013-11-27, TÜViT (confidential document) [11] Project < Kansa > Life Cycle Definition (Class ALC_CMC.4/CMS.5), Version 1.4, 2013-10-21: 1
  • Electronics (confidential document) [12] S3CS9AB 32-Bit CMOS Microcontroller for Smart Card User’s manual, Version 1.00, April 2013: 1
pdf_data/report_keywords/cipher_mode
  • ECB:
    • ECB: 2
  • ECB:
    • ECB: 1
  • CBC:
    • CBC: 1
pdf_data/report_keywords/cipher_mode/ECB/ECB 2 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/report_keywords/ecc_curve
  • NIST:
    • P-192: 6
    • P-224: 6
    • P-256: 6
    • P-384: 6
pdf_data/report_keywords/eval_facility/TUV
  • TÜV Informationstechnik: 4
  • TÜV Informationstechnik: 2
  • TÜViT: 2
pdf_data/report_keywords/eval_facility/TUV/TÜV Informationstechnik 4 2
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
      • SHA1: 1
    • SHA2:
      • SHA224: 1
      • SHA256: 1
      • SHA384: 1
      • SHA512: 1
      • SHA-2: 2
pdf_data/report_keywords/randomness/RNG/RNG 1 2
pdf_data/report_keywords/randomness/TRNG
  • DTRNG: 8
  • DTRNG: 12
  • TRNG: 1
pdf_data/report_keywords/randomness/TRNG/DTRNG 8 12
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • DPA: 2
    • SPA: 1
  • other:
    • JIL: 4
  • SCA:
    • physical probing: 1
    • side-channel: 1
    • SPA: 1
    • DPA: 2
  • FI:
    • physical tampering: 1
    • DFA: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/side_channel_analysis/SCA
  • DPA: 2
  • SPA: 1
  • physical probing: 1
  • side-channel: 1
  • SPA: 1
  • DPA: 2
pdf_data/report_keywords/standard_id
  • FIPS:
    • FIPS186-4: 6
    • FIPS197: 3
    • FIPS180-3: 4
    • FIPS 180-3: 2
    • FIPS PUB 180-3: 1
    • FIPS 186-4: 1
    • FIPS PUB 186-4: 1
  • BSI:
    • AIS 34: 2
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 4
    • AIS 37: 1
    • AIS 36: 2
    • AIS31: 3
    • AIS 35: 2
    • AIS 32: 1
  • RFC:
    • RFC5639: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 18045: 4
    • ISO/IEC 17065: 2
  • BSI:
    • AIS31: 3
    • AIS 34: 2
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 3
    • AIS 36: 3
    • AIS 35: 2
    • AIS 32: 1
    • AIS 38: 1
    • AIS 46: 1
pdf_data/report_keywords/standard_id/BSI
  • AIS 34: 2
  • AIS 25: 2
  • AIS 26: 2
  • AIS 31: 4
  • AIS 37: 1
  • AIS 36: 2
  • AIS31: 3
  • AIS 35: 2
  • AIS 32: 1
  • AIS31: 3
  • AIS 34: 2
  • AIS 25: 2
  • AIS 26: 2
  • AIS 31: 3
  • AIS 36: 3
  • AIS 35: 2
  • AIS 32: 1
  • AIS 38: 1
  • AIS 46: 1
pdf_data/report_keywords/standard_id/BSI/AIS 31 4 3
pdf_data/report_keywords/standard_id/BSI/AIS 36 2 3
pdf_data/report_keywords/symmetric_crypto/AES_competition/AES/AES 4 6
pdf_data/report_keywords/symmetric_crypto/DES/3DES
  • TDES: 1
  • TDEA: 1
  • Triple-DES: 2
  • TDES: 2
  • TDEA: 1
pdf_data/report_keywords/symmetric_crypto/DES/3DES/TDES 1 2
pdf_data/report_keywords/symmetric_crypto/DES/DES/DES 1 5
pdf_data/report_keywords/symmetric_crypto/constructions/MAC/HMAC 2 1
pdf_data/report_keywords/technical_report_id/BSI
  • BSI TR-02102: 1
  • BSI 7148: 1
  • BSI TR-02102: 1
  • BSI 7125: 2
  • BSI 7148: 1
pdf_data/report_keywords/vendor/Samsung/Samsung 20 24
pdf_data/report_metadata//CreationDate D:20170103094609+01'00' D:20140205100058+01'00'
pdf_data/report_metadata//Keywords "Common Criteria, Certification, Zertifizierung, EAL5, S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH" "Common Criteria, Certification, Zertifizierung, S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software, Samsung Electronics"
pdf_data/report_metadata//ModDate D:20170103132209+01'00' D:20140206085959+01'00'
pdf_data/report_metadata//Producer LibreOffice 4.2 LibreOffice 3.6
pdf_data/report_metadata//Title Certification Report BSI-DSZ-CC-0910-2016 Certification Report BSI-DSZ-CC-0882-2013
pdf_data/report_metadata/pdf_file_size_bytes 741597 996795
pdf_data/st_filename 0910b_pdf.pdf 0882b_pdf.pdf
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECDH:
      • ECDH: 7
    • ECDSA:
      • ECDSA: 14
    • ECC:
      • ECC: 58
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
pdf_data/st_keywords/cc_claims/O
  • O.RND: 6
  • O.MEM_ACCESS: 1
  • O.RND: 5
pdf_data/st_keywords/cc_claims/O/O.RND 6 5
pdf_data/st_keywords/cc_protection_profile_id/BSI/BSI-PP-0035 5 4
pdf_data/st_keywords/cc_sar/ADV
  • ADV_ARV: 1
  • ADV_FSP: 2
  • ADV_IMP: 1
  • ADV_VAN: 1
  • ADV_ARC.1: 7
  • ADV_FSP.5: 3
  • ADV_IMP.1: 2
  • ADV_INT.2: 1
  • ADV_TDS.4: 1
  • ADV_FSP.4: 2
  • ADV_TDS.3: 1
  • ADV_ARV: 1
  • ADV_FSP: 2
  • ADV_IMP: 1
  • ADV_VAN: 1
  • ADV_ARC.1: 7
  • ADV_FSP.5: 3
  • ADV_IMP.1: 2
  • ADV_INT.2: 1
  • ADV_TDS.4: 1
  • ADV_FSP.2: 1
  • ADV_TDS.3: 1
  • ADV_FSP.4: 1
pdf_data/st_keywords/cc_sar/ADV/ADV_FSP.4 2 1
pdf_data/st_keywords/cc_sar/ATE
  • ATE_COV: 1
  • ATE_COV.2: 1
  • ATE_DPT.3: 1
  • ATE_FUN.1: 1
  • ATE_IND.2: 1
  • ATE_DPT.1: 1
  • ATE_COV: 1
  • ATE_COV.2: 1
  • ATE_DPT.3: 1
  • ATE_FUN.1: 1
  • ATE_IND.2: 1
pdf_data/st_keywords/cc_sfr/FCS
  • FCS_RNG: 6
  • FCS_RNG.1: 12
  • FCS_RNG.1.1: 2
  • FCS_RNG.1.2: 2
  • FCS_COP.1: 22
  • FCS_COP: 27
  • FCS_CKM.1: 23
  • FCS_CKM.4: 11
  • FCS_CKM: 5
  • FCS_CKM.2: 2
  • FCS_RNG: 6
  • FCS_RNG.1: 15
  • FCS_RNG.1.1: 2
  • FCS_RNG.1.2: 2
  • FCS_COP.1: 9
  • FCS_COP: 8
  • FCS_CKM.1: 6
  • FCS_CKM.4: 4
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM.1 23 6
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM.4 11 4
pdf_data/st_keywords/cc_sfr/FCS/FCS_COP 27 8
pdf_data/st_keywords/cc_sfr/FCS/FCS_COP.1 22 9
pdf_data/st_keywords/cc_sfr/FCS/FCS_RNG.1 12 15
pdf_data/st_keywords/cc_sfr/FDP
  • FDP_ACF: 8
  • FDP_ITT.1: 17
  • FDP_ITT.1.1: 1
  • FDP_ACC.1: 8
  • FDP_IFC.1: 18
  • FDP_IFC.1.1: 1
  • FDP_IFF.1: 3
  • FDP_ACF.1: 10
  • FDP_ACC: 10
  • FDP_ITC.1: 9
  • FDP_ITC.2: 9
  • FDP_SDI.1: 1
  • FDP_IFC: 1
  • FDP_ITT: 1
  • FDP_ACF: 2
  • FDP_ITT.1: 17
  • FDP_ITT.1.1: 1
  • FDP_ACC.1: 13
  • FDP_IFC.1: 18
  • FDP_IFC.1.1: 1
  • FDP_IFF.1: 3
  • FDP_ACF.1: 9
  • FDP_ACC.1.1: 1
  • FDP_ACF.1.1: 1
  • FDP_ACF.1.2: 1
  • FDP_ACF.1.3: 1
  • FDP_ACF.1.4: 1
  • FDP_ITC.1: 4
  • FDP_ITC.2: 4
  • FDP_SDI.1: 1
  • FDP_ACC: 1
  • FDP_IFC: 1
  • FDP_ITT: 1
pdf_data/st_keywords/cc_sfr/FDP/FDP_ACC 10 1
pdf_data/st_keywords/cc_sfr/FDP/FDP_ACC.1 8 13
pdf_data/st_keywords/cc_sfr/FDP/FDP_ACF 8 2
pdf_data/st_keywords/cc_sfr/FDP/FDP_ACF.1 10 9
pdf_data/st_keywords/cc_sfr/FDP/FDP_ITC.1 9 4
pdf_data/st_keywords/cc_sfr/FDP/FDP_ITC.2 9 4
pdf_data/st_keywords/cc_sfr/FMT
  • FMT_LIM: 20
  • FMT_LIM.1: 28
  • FMT_LIM.2: 32
  • FMT_LIM.1.1: 2
  • FMT_LIM.2.1: 2
  • FMT_MSA.3: 13
  • FMT_MSA.1: 12
  • FMT_MSA.3.1: 1
  • FMT_MSA.3.2: 1
  • FMT_SMR.1: 6
  • FMT_MSA.1.1: 1
  • FMT_SMF.1: 9
  • FMT_SMF.1.1: 1
  • FMT_CKM.4: 1
  • FMT_MSA: 2
  • FMT_SMF: 1
  • FMT_LIM: 8
  • FMT_LIM.1: 24
  • FMT_LIM.2: 28
  • FMT_LIM.1.1: 2
  • FMT_LIM.2.1: 2
  • FMT_MSA.3: 10
  • FMT_MSA.1: 9
  • FMT_MSA.3.1: 1
  • FMT_MSA.3.2: 1
  • FMT_SMR.1: 6
  • FMT_MSA.1.1: 1
  • FMT_SMF.1: 6
  • FMT_SMF.1.1: 1
  • FMT_MSA: 2
  • FMT_SMF: 1
pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM 20 8
pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM.1 28 24
pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM.2 32 28
pdf_data/st_keywords/cc_sfr/FMT/FMT_MSA.1 12 9
pdf_data/st_keywords/cc_sfr/FMT/FMT_MSA.3 13 10
pdf_data/st_keywords/cc_sfr/FMT/FMT_SMF.1 9 6
pdf_data/st_keywords/cipher_mode
  • ECB:
    • ECB: 11
  • CTR:
    • CTR: 5
  • ECB:
    • ECB: 4
  • CBC:
    • CBC: 3
  • OFB:
    • OFB: 2
pdf_data/st_keywords/cipher_mode/ECB/ECB 11 4
pdf_data/st_keywords/crypto_library
  • NSS:
    • NSS: 1
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/st_keywords/ecc_curve
  • NIST:
    • P-192: 8
    • P-224: 8
    • P-256: 8
    • P-384: 8
    • P-521: 8
    • secp192k1: 4
    • secp192r1: 4
    • secp224k1: 4
    • secp224r1: 4
    • secp256k1: 4
    • secp256r1: 4
    • secp384r1: 4
    • secp521r1: 4
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP192t1: 4
    • brainpoolP224r1: 4
    • brainpoolP224t1: 4
    • brainpoolP256r1: 4
    • brainpoolP256t1: 4
    • brainpoolP320r1: 4
    • brainpoolP320t1: 4
    • brainpoolP384r1: 4
    • brainpoolP384t1: 4
    • brainpoolP512r1: 4
    • brainpoolP512t1: 4
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 5
      • SHA1: 3
    • SHA2:
      • SHA-224: 3
      • SHA-256: 3
      • SHA-512: 3
      • SHA224: 6
      • SHA256: 6
      • SHA384: 6
      • SHA512: 5
      • SHA-384: 2
      • SHA-2: 1
pdf_data/st_keywords/randomness/RNG
  • RNG: 8
  • RND: 11
  • RND: 10
pdf_data/st_keywords/randomness/RNG/RND 11 10
pdf_data/st_keywords/randomness/TRNG/DTRNG 28 18
pdf_data/st_keywords/randomness/TRNG/TRNG 4 2
pdf_data/st_keywords/side_channel_analysis/FI
  • physical tampering: 2
  • Malfunction: 27
  • malfunction: 11
  • DFA: 2
  • physical tampering: 2
  • Malfunction: 24
  • malfunction: 11
pdf_data/st_keywords/side_channel_analysis/FI/Malfunction 27 24
pdf_data/st_keywords/side_channel_analysis/SCA
  • Leak-Inherent: 23
  • Physical Probing: 4
  • physical probing: 9
  • Physical probing: 2
  • side-channel: 1
  • side channel: 2
  • DPA: 7
  • SPA: 5
  • timing attacks: 1
  • timing attack: 2
  • Leak-Inherent: 21
  • Physical Probing: 4
  • physical probing: 9
  • Physical probing: 2
  • side-channel: 3
  • SPA: 2
  • DPA: 3
  • timing attacks: 1
pdf_data/st_keywords/side_channel_analysis/SCA/DPA 7 3
pdf_data/st_keywords/side_channel_analysis/SCA/Leak-Inherent 23 21
pdf_data/st_keywords/side_channel_analysis/SCA/SPA 5 2
pdf_data/st_keywords/side_channel_analysis/SCA/side-channel 1 3
pdf_data/st_keywords/side_channel_analysis/other/reverse engineering 2 5
pdf_data/st_keywords/standard_id/BSI
  • AIS31: 1
  • AIS 31: 1
  • BSI-AIS31: 3
  • AIS31: 1
  • AIS 31: 2
pdf_data/st_keywords/standard_id/BSI/AIS 31 1 2
pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-001 3 2
pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-002 3 2
pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-003 3 2
pdf_data/st_keywords/standard_id/FIPS
  • FIPS PUB 180-3: 6
  • FIPS197: 1
  • FIPS 197: 1
  • FIPS197: 1
  • FIPS 197: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 16
  • DES:
    • DES:
      • DES: 9
    • 3DES:
      • 3DES: 6
      • Triple-DES: 1
      • TDEA: 1
  • LWC_competition:
    • ASCON:
      • ASCON: 1
  • constructions:
    • MAC:
      • HMAC: 7
  • AES_competition:
    • AES:
      • AES: 13
  • DES:
    • DES:
      • DES: 8
    • 3DES:
      • 3DES: 6
      • Triple-DES: 2
      • TDEA: 1
pdf_data/st_keywords/symmetric_crypto/AES_competition/AES/AES 16 13
pdf_data/st_keywords/symmetric_crypto/DES/3DES/Triple-DES 1 2
pdf_data/st_keywords/symmetric_crypto/DES/DES/DES 9 8
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI TR-02102: 1
pdf_data/st_keywords/vendor/Samsung/Samsung 2 3
pdf_data/st_metadata
  • pdf_file_size_bytes: 1425901
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 71
  • /Author: Sunggeun Park
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Company: SAMSUNG
  • /CreationDate: D:20161122184902+09'00'
  • /Creator: Word용 Acrobat PDFMaker 10.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /Keywords: ST Lite; S3FV5RP; S3FV5RK; S3FV5RJ; S3FV5RH
  • /ModDate: D:20170201195503+09'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Adobe PDF Library 10.0
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20161122094808
  • /Subject: ST Lite of S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Technologie: 0,22 µm
  • /Title: Security Target of Samsung S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_hyperlinks:
  • pdf_file_size_bytes: 1315207
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 57
  • /Author: KyungSuk YI
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Company: Samsung Electronics
  • /CreationDate: D:20131021190305+09'00'
  • /Creator: Word용 Acrobat PDFMaker 10.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /ModDate: D:20140206090253+01'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Adobe PDF Library 10.0
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20131021100233
  • /Technologie: 0,22 µm
  • /Title: Security Target
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_hyperlinks: http://www.bsi.bund.de/
pdf_data/st_metadata//Author Sunggeun Park KyungSuk YI
pdf_data/st_metadata//Company SAMSUNG Samsung Electronics
pdf_data/st_metadata//CreationDate D:20161122184902+09'00' D:20131021190305+09'00'
pdf_data/st_metadata//ModDate D:20170201195503+09'00' D:20140206090253+01'00'
pdf_data/st_metadata//SourceModified D:20161122094808 D:20131021100233
pdf_data/st_metadata//Title Security Target of Samsung S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software Security Target
pdf_data/st_metadata/pdf_file_size_bytes 1425901 1315207
pdf_data/st_metadata/pdf_hyperlinks http://www.bsi.bund.de/
pdf_data/st_metadata/pdf_is_encrypted True False
pdf_data/st_metadata/pdf_number_of_pages 71 57
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