Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
ATEN/IOGear Secure KVM Switch Series
CCEVS-VR-10446-2011 		Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
2019-48-INF-3811
name ATEN/IOGear Secure KVM Switch Series Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme US ES
status archived active
not_valid_after 01.11.2014 07.06.2027
not_valid_before 01.07.2011 07.06.2022
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48_Certificado.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10446-vr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20INF-3811.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10446-st.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20ST_lite.pdf
manufacturer ATEN International Co., LTD Winbond Electonics Corporation
manufacturer_web https://www.aten.com https://www.winbond.com/
security_level EAL2+, ALC_FLR.2 EAL5+, ALC_DVS.2, AVA_VAN.5
dgst 2b7233c8fe166ccf 51a1149f945dea23
heuristics/cert_id CCEVS-VR-10446-2011 2019-48-INF-3811
heuristics/cert_lab US []
heuristics/extracted_sars ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ALC_FLR.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ASE_CCL.1
heuristics/scheme_data
  • category: Peripheral Switch
  • certification_date: 01.07.2011
  • evaluation_facility: Leidos Common Criteria Testing Laboratory
  • expiration_date: 01.11.2014
  • id: CCEVS-VR-VID10446
  • product: ATEN/IOGear Secure KVM Switch Series
  • scheme: US
  • url: https://www.niap-ccevs.org/product/10446
  • vendor: ATEN International Co., Ltd.
  • category: Smart Cards and similiar devices
  • certification_date: 07.06.2022
  • enhanced:
    • category: Smart Cards and similiar devices
    • cc_version: Common Criteria 3.1 release 5
    • cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1478
    • certification_date: 07.06.2022
    • description: The TOE is a memory flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC.
    • evaluation_facility: Applus Laboratories
    • level: EAL5 + ALC_DVS.2 + AVA_VAN.5
    • manufacturer: Winbond Electronics Corporation
    • report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1479
    • status: Certified
    • target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1477
    • type: Product
  • manufacturer: Winbond Electronics Corporation
  • product: Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/826-winbond-spiflash-trustme-secure-flash-memory-w75f40wbyjeg-version-a
heuristics/protection_profiles fd5d86dc01df0437 {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp_psshid_v2.1-vr.pdf {}
pdf_data/cert_filename 2019-48_Certificado.pdf
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 880365
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
pdf_data/report_filename st_vid10446-vr.pdf 2019-48 INF-3811.pdf
pdf_data/report_frontpage
  • US:
    • cert_id: CCEVS-VR-10446-2011
    • cert_item: ATEN/IOGear Secure KVM Switch Series
    • cert_lab: US NIAP
  • US:
pdf_data/report_keywords/cc_cert_id
  • US:
    • CCEVS-VR-10446-2011: 1
  • ES:
    • 2019-48-INF-3811- v1: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2+: 4
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2: 1
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR.2: 3
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 1
    • FDP_RIP.1: 1
    • FDP_SDI.2: 1
    • FDP_UIT.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS: 2
    • FPT_ITT.1: 1
    • FPT_TRP.1: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 5
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • fault injection: 2
  • other:
    • JIL: 1
pdf_data/report_metadata
  • /Author: Petty, Jean E
  • /CreationDate: D:20110714095732
  • /Creator: Microsoft® Office Word 2007
  • /ModDate: D:20110714095732
  • /Producer: Microsoft® Office Word 2007
  • /Title: National Information Assurance Partnership
  • pdf_file_size_bytes: 251018
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 964023
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
pdf_data/st_filename st_vid10446-st.pdf 2019-48 ST_lite.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 2 augmented: 1
    • EAL 2+: 1
    • EAL2: 3
    • EAL2 augmented: 3
  • EAL:
    • EAL5: 6
    • EAL5 augmented: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.2: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_CMS.2: 1
    • ALC_DEL.1: 1
    • ALC_FLR.2: 6
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 6
    • ADV_FSP.1: 3
    • ADV_FSP.2: 3
    • ADV_FSP.4: 1
    • ADV_FSP.5: 8
    • ADV_IMP.1: 9
    • ADV_INT.2: 1
    • ADV_TDS.1: 2
    • ADV_TDS.3: 4
    • ADV_TDS.4: 8
  • AGD:
    • AGD_OPE.1: 6
    • AGD_PRE.1: 6
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.1: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 2
    • ALC_DVS.2: 9
    • ALC_LCD.1: 3
    • ALC_TAT.1: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 5
    • ASE_INT.1: 5
    • ASE_OBJ.2: 3
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 2
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 6
  • AVA:
    • AVA_VAN.5: 10
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ETC.1: 1
    • FDP_IFC.1: 5
    • FDP_IFF.1: 5
    • FDP_ITC.1: 1
    • FDP_MSA.1: 1
  • FMT:
    • FMT_MSA.1: 5
    • FMT_MSA.3: 5
    • FMT_SMF.1: 4
    • FMT_SMR.1: 4
  • FDP:
    • FDP_ACC.1: 3
    • FDP_ACF: 1
    • FDP_IFC.1: 27
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 4
    • FDP_ITT.1: 13
    • FDP_ITT.1.1: 1
    • FDP_RIP.1: 8
    • FDP_RIP.1.1: 1
    • FDP_SDC: 4
    • FDP_SDC.1: 16
    • FDP_SDC.1.1: 2
    • FDP_SDI: 1
    • FDP_SDI.2: 11
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 8
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FMT:
    • FMT_LIM: 5
    • FMT_LIM.1: 22
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 2
  • FPT:
    • FPT_FLS: 24
    • FPT_FLS.1: 3
    • FPT_ITT.1: 12
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 14
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 12
    • FRU_FLT.2.1: 1
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • O:
    • O.CONF: 1
    • O.INDICATE: 1
    • O.ROM: 3
    • O.SELECT: 1
    • O.SWITCH: 1
    • O.USBDETECT: 1
  • OE:
    • OE.ACCESS: 1
    • OE.MANAGE: 1
    • OE.NOEVIL: 1
    • OE.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 9
  • FI:
    • Fault Injection: 1
    • Malfunction: 17
    • fault injection: 2
    • malfunction: 3
    • physical tampering: 3
  • SCA:
    • Leak-Inherent: 17
    • Physical Probing: 2
    • physical probing: 5
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 1
    • CCMB-2009-07-003: 1
    • CCMB-2009-07-004: 1
  • CC:
    • CCMB-2017-04-004: 1
  • ISO:
    • ISO/IEC 7816-3: 1
pdf_data/st_metadata
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different