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ATEN/IOGear Secure KVM Switch Series
CCEVS-VR-10446-2011 		NXP Secure Smart Card Controller P5CD040V0B, P5CC040V0B, P5CD020V0B and P5CC021V0B each with specific IC Dedicated Software
BSI-DSZ-CC-0404-2007
name ATEN/IOGear Secure KVM Switch Series NXP Secure Smart Card Controller P5CD040V0B, P5CC040V0B, P5CD020V0B and P5CC021V0B each with specific IC Dedicated Software
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme US DE
not_valid_after 01.11.2014 01.09.2019
not_valid_before 01.07.2011 05.07.2007
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10446-vr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0404a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10446-st.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0404b.pdf
manufacturer ATEN International Co., LTD NXP Semiconductors
manufacturer_web https://www.aten.com https://www.nxp.com/
security_level EAL2+, ALC_FLR.2 EAL5+, AVA_MSU.3, ALC_DVS.2, AVA_VLA.4
dgst 2b7233c8fe166ccf 2d8ef517d7f7ce1a
heuristics/cert_id CCEVS-VR-10446-2011 BSI-DSZ-CC-0404-2007
heuristics/cert_lab US BSI
heuristics/indirect_transitive_cves {} CVE-2021-3011
heuristics/extracted_sars ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ALC_FLR.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1 ASE_ENV.1, ALC_LCD.2, ASE_INT.1, AGD_USR.1, ALC_DVS.2, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, AVA_SOF.1, ATE_COV.2, ASE_TSS.1, ATE_DPT.2, AGD_ADM.1, ADV_INT.1, ADV_RCR.2, ATE_FUN.1, ADV_IMP.2, ALC_TAT.2, ADV_HLD.3, AVA_VLA.4, ASE_SRE.1, ASE_OBJ.1, ADV_SPM.3, ATE_IND.2, ADV_LLD.1, ADV_FSP.3, AVA_CCA.1, AVA_MSU.3
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0439-2008, ANSSI-CC-2009/48, BSI-DSZ-CC-0797-2012, ANSSI-CC-2009/20, BSI-DSZ-CC-0730-2011, ANSSI-CC-2009/19, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0411-2007, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0410-2007
heuristics/report_references/indirectly_referenced_by {} BSI-DSZ-CC-0576-2009, BSI-DSZ-CC-0745-2012, BSI-DSZ-CC-0527-2008, BSI-DSZ-CC-0741-2011, ANSSI-CC-2011/21, BSI-DSZ-CC-0532-2008, BSI-DSZ-CC-0603-2010, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0797-2012, ANSSI-CC-2009/08, BSI-DSZ-CC-0479-2008, BSI-DSZ-CC-0571-2008, ANSSI-CC-2008/12, BSI-DSZ-CC-0521-2008, ANSSI-CC-2010/52, BSI-DSZ-CC-0673-2010, BSI-DSZ-CC-0602-2009, ANSSI-CC-2009/48, BSI-DSZ-CC-0446-2007, ANSSI-CC-2009/17, BSI-DSZ-CC-0528-2008, BSI-DSZ-CC-0700-2011, ANSSI-CC-2010/06, BSI-DSZ-CC-0743-2011, BSI-DSZ-CC-0709-2010, BSI-DSZ-CC-0533-2009, ANSSI-CC-2008/13, BSI-DSZ-CC-0567-2009, BSI-DSZ-CC-0575-2009, ANSSI-CC-2013/70, BSI-DSZ-CC-0515-2009, BSI-DSZ-CC-0440-2008, BSI-DSZ-CC-0609-2010, ANSSI-CC-2010/39, ANSSI-CC-2012/46, ANSSI-CC-2010/27, ANSSI-CC-2008/14, BSI-DSZ-CC-0506-2008, BSI-DSZ-CC-0522-2008, ANSSI-CC-2010/59, BSI-DSZ-CC-0642-2011, BSI-DSZ-CC-0861-2014, BSI-DSZ-CC-0704-2010, BSI-DSZ-CC-0634-2009, BSI-DSZ-CC-0742-2011, ANSSI-CC-2009/20, BSI-DSZ-CC-0746-2012, BSI-DSZ-CC-0411-2007, BSI-DSZ-CC-0744-2011, BSI-DSZ-CC-0447-2008, BSI-DSZ-CC-0582-2009, BSI-DSZ-CC-0748-2011, BSI-DSZ-CC-0643-2010, BSI-DSZ-CC-0568-2008, ANSSI-CC-2012/10, BSI-DSZ-CC-0747-2011, BSI-DSZ-CC-0730-2011, ANSSI-CC-2010/58, BSI-DSZ-CC-0635-2010, BSI-DSZ-CC-0710-2010, BSI-DSZ-CC-0675-2011, BSI-DSZ-CC-0700-V2-2013, ANSSI-CC-2008/45, ANSSI-CC-2008/16, BSI-DSZ-CC-0417-2008, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0537-2009, ANSSI-CC-2009/03, BSI-DSZ-CC-0661-2011, BSI-DSZ-CC-0604-2010, BSI-DSZ-CC-0658-2010, BSI-DSZ-CC-0625-2010, BSI-DSZ-CC-0410-2007, ANSSI-CC-2012/45, ANSSI-CC-2012/09, ANSSI-CC-2009/19, BSI-DSZ-CC-0731-2011, BSI-DSZ-CC-0812-2012, BSI-DSZ-CC-0694-2012, BSI-DSZ-CC-0518-2008, BSI-DSZ-CC-0680-2010, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0439-2008, ANSSI-CC-2008/28, BSI-DSZ-CC-0463-2008, BSI-DSZ-CC-0391-2009, BSI-DSZ-CC-0674-2011, ANSSI-CC-2009/07, BSI-DSZ-CC-0608-2010
heuristics/scheme_data
  • category: Peripheral Switch
  • certification_date: 01.07.2011
  • evaluation_facility: Leidos Common Criteria Testing Laboratory
  • expiration_date: 01.11.2014
  • id: CCEVS-VR-VID10446
  • product: ATEN/IOGear Secure KVM Switch Series
  • scheme: US
  • url: https://www.niap-ccevs.org/product/10446
  • vendor: ATEN International Co., Ltd.
heuristics/st_references/directly_referenced_by {} BSI-DSZ-CC-0439-2008, BSI-DSZ-CC-0797-2012, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0730-2011, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0799-2012
heuristics/st_references/indirectly_referenced_by {} BSI-DSZ-CC-0439-2008, BSI-DSZ-CC-0797-2012, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0730-2011, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0799-2012
heuristics/protection_profiles fd5d86dc01df0437 {}
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp_psshid_v2.1-vr.pdf {}
pdf_data/report_filename st_vid10446-vr.pdf 0404a.pdf
pdf_data/report_frontpage
  • DE:
  • US:
    • cert_id: CCEVS-VR-10446-2011
    • cert_item: ATEN/IOGear Secure KVM Switch Series
    • cert_lab: US NIAP
  • DE:
    • cert_id: BSI-DSZ-CC-0404-2007
    • cert_item: NXP Secure Smart Card Controller P5CD040V0B, P5CC040V0B, P5CD020V0B and P5CC021V0B each with specific IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH Business Line Identification . BSI -
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
  • US:
pdf_data/report_keywords/cc_cert_id
  • US:
    • CCEVS-VR-10446-2011: 1
  • DE:
    • BSI-DSZ-CC-0404: 2
    • BSI-DSZ-CC-0404-2007: 24
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0002-2001: 2
    • BSI-PP-0002-: 1
    • BSI-PP-0002-2001: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2+: 4
  • EAL:
    • EAL 1: 1
    • EAL 4: 2
    • EAL 5: 3
    • EAL 5 augmented: 3
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 8
    • EAL5 augmented: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR.2: 3
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 2
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 3
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_FSP.3: 2
    • ADV_HLD: 2
    • ADV_HLD.3: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 2
    • ADV_INT: 2
    • ADV_INT.1: 2
    • ADV_LLD: 2
    • ADV_LLD.1: 1
    • ADV_RCR: 2
    • ADV_RCR.2: 2
    • ADV_SPM: 2
    • ADV_SPM.3: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 1
    • AGD_USR: 2
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 3
    • ALC_TAT: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 2
    • ATE_COV.2: 1
    • ATE_DPT: 2
    • ATE_DPT.2: 2
    • ATE_FUN: 2
    • ATE_FUN.1: 1
    • ATE_IND: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 2
    • AVA_CCA.1: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_SOF.1: 1
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP.1: 2
    • FCS_RND.1: 1
  • FDP:
    • FDP_ACC.1: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_ITC.1: 1
    • FDP_ITT.1: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 2
    • FMT_MSA.2: 1
    • FMT_MSA.3: 2
    • FMT_SMF.1: 1
    • FMT_SMR.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
    • FPT_SEP.1: 2
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 26
    • NXP Semiconductors: 19
  • Philips:
    • Philips: 1
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 11
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 1
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • Malfunction: 1
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • Physical Probing: 1
    • SPA: 1
    • physical probing: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 1
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 1
    • AIS 36: 4
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
    • ISO/IEC15408: 2005: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • NXP P5CD040V0B Secure Smart Card Controller version 1.1, Date from June 08th, 2007, (confidential document) [9] Smart Card IC Platform Protection Profile, Version 1.0, July 2001, registered at the German: 1
pdf_data/report_metadata
  • /Author: Petty, Jean E
  • /CreationDate: D:20110714095732
  • /Creator: Microsoft® Office Word 2007
  • /ModDate: D:20110714095732
  • /Producer: Microsoft® Office Word 2007
  • /Title: National Information Assurance Partnership
  • pdf_file_size_bytes: 251018
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /Company: BSI, Postfach 200363, 53133 Bonn
  • /CreationDate: D:20070712110857+02'00'
  • /Creator: Acrobat PDFMaker 7.0.7 für Word
  • /Keywords: Common Criteria, Certification, Zertifizierung NXP Seminconductors Germany GmbH, NXP Smart Card Controller, NXP Secure Smart Card Controller
  • /ModDate: D:20070712143721+02'00'
  • /Producer: Acrobat Distiller 7.0.5 (Windows)
  • /SourceModified: D:20070712090200
  • /Title: Certification Report BSI-DSZ-CC-0404-2007
  • pdf_file_size_bytes: 308728
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 46
pdf_data/st_filename st_vid10446-st.pdf 0404b.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0404: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 2 augmented: 1
    • EAL 2+: 1
    • EAL2: 3
    • EAL2 augmented: 3
  • EAL:
    • EAL 5: 4
    • EAL 5 augmented: 2
    • EAL4: 4
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL5: 34
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.2: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_CMS.2: 1
    • ALC_DEL.1: 1
    • ALC_FLR.2: 6
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 4
    • ACM_SCP.2: 4
    • ACM_SCP.3: 5
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 4
    • ADV_FSP.2: 4
    • ADV_FSP.3: 6
    • ADV_HLD: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.2: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA.1: 1
    • AVA_MSU: 2
    • AVA_MSU.3: 1
    • AVA_SOF.1: 2
    • AVA_VLA.4: 3
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ETC.1: 1
    • FDP_IFC.1: 5
    • FDP_IFF.1: 5
    • FDP_ITC.1: 1
    • FDP_MSA.1: 1
  • FMT:
    • FMT_MSA.1: 5
    • FMT_MSA.3: 5
    • FMT_SMF.1: 4
    • FMT_SMR.1: 4
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM: 1
    • FCS_CKM.1: 6
    • FCS_CKM.4: 4
    • FCS_COP.1: 26
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 33
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 30
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 10
    • FDP_ITC: 1
    • FDP_ITC.1: 6
    • FDP_ITC.2: 6
    • FDP_ITT.1: 6
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 29
    • FMT_MSA.1.1: 2
    • FMT_MSA.2: 6
    • FMT_MSA.3: 22
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_SEP.1: 15
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • O:
    • O.CONF: 1
    • O.INDICATE: 1
    • O.ROM: 3
    • O.SELECT: 1
    • O.SWITCH: 1
    • O.USBDETECT: 1
  • OE:
    • OE.ACCESS: 1
    • OE.MANAGE: 1
    • OE.NOEVIL: 1
    • OE.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
  • O:
    • O.CONFIG: 7
    • O.HW_AES: 7
    • O.MEM_ACCESS: 9
    • O.MF_FW: 7
    • O.RND: 3
    • O.SFR_ACCESS: 7
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 85
    • NXP Semiconductors: 17
  • Philips:
    • Philips: 3
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 38
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 10
    • DES:
      • DEA: 2
      • DES: 29
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 11
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 9
  • FI:
    • Malfunction: 10
    • fault injection: 4
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • Leak-Inherent: 14
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 1
    • CCMB-2009-07-003: 1
    • CCMB-2009-07-004: 1
  • BSI:
    • AIS31: 3
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 1
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
pdf_data/st_metadata
  • /Author:
  • /CreationDate: D:20070321155957+01'00'
  • /Creator: Acrobat PDFMaker 6.0 for Word
  • /ModDate: D:20070321160622+01'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /SourceModified: D:20070321145325
  • /Title: Microsoft Word - st-lite_p5cd040v0b_v1_0.doc
  • pdf_file_size_bytes: 707921
  • pdf_hyperlinks: http://www.nxp.com/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 74
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
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