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NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
NSCIB-CC-2300128-01-CR 		Smart Card IC Development flow, Smart Card IC Development section in Kumamoto, NEC - Japan
ANSSI-CC-2002/08
name NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 Smart Card IC Development flow, Smart Card IC Development section in Kumamoto, NEC - Japan
category ICs, Smart Cards and Smart Card-Related Devices and Systems Other Devices and Systems
scheme NL FR
status active archived
not_valid_after 27.12.2028 01.09.2019
not_valid_before 27.12.2023 01.01.2002
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CR%20.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2002_08.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-ST%20lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2002_08.pdf
manufacturer NXP Semiconductors Germany GmbH NEC Smart Card IC development Section, Kumamoto (Japan)
manufacturer_web https://www.nxp.com https://www.nec.com/
security_level EAL4 AVA_VLA.2, EAL1+
dgst 2b64c5fbc41dddeb e411cf0d6d48f791
heuristics/cert_id NSCIB-CC-2300128-01-CR ANSSI-CC-2002/08
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 ASE_ENV.1, ADV_RCR.1, ADV_FSP.1, AVA_VLA.2, ASE_INT.1, ASE_SRE.1, ADV_HLD.2, ASE_TSS.1, ASE_OBJ.1, AGD_USR.1, ATE_IND.1, ADV_LLD.1, AGD_ADM.1, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, ADV_IMP.1
heuristics/extracted_versions 01.1 -
heuristics/scheme_data
pdf_data/cert_filename NSCIB-CC-2300128-01-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL4: 2
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • Riscure:
    • Riscure: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: JM2
  • /CreationDate: D:20240109181337+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240109181337+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 92264
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-2300128-01-CR .pdf 2002_08.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300128-01-CR
    • cert_item: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
    • cert_lab: Riscure B.V.
    • developer: NXP Semiconductors Germany GmbH
  • FR:
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01-CR: 11
  • FR:
    • Rapport de certification 2002/08: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL4: 3
  • EAL:
    • EAL 1: 6
    • EAL 1 augmented: 2
    • EAL1: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_CAP.1: 1
  • ADO:
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP.1: 1
    • ADV_RCR.1: 1
  • AGD:
    • AGD_ADM.1: 1
    • AGD_USR.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_IND.1: 1
  • AVA:
    • AVA_VLA.2: 12
pdf_data/report_keywords/vendor
  • NXP:
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • Riscure:
    • Riscure: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 3
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JHAS: 1
    • JIL: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
pdf_data/report_metadata
  • /Author: bousson
  • /CreationDate: D:20020612093426
  • /Creator: FrameMaker 6.0
  • /ModDate: D:20020612095217+02'00'
  • /Producer: Acrobat Distiller 4.05 for Windows
  • /Title: RapportCertification.book
  • pdf_file_size_bytes: 105962
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
pdf_data/st_filename NSCIB-CC-2300128-01-ST lite.pdf cible2002_08.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 5
  • EAL:
    • EAL1: 4
    • EAL1 augmented: 2
    • EAL1+: 1
    • EAL4: 1
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.3: 2
  • ACM:
    • ACM_CAP.1: 12
  • ADO:
    • ADO_IGS.1: 8
  • ADV:
    • ADV_FSP.1: 22
    • ADV_HLD.2: 2
    • ADV_IMP.1: 2
    • ADV_LLD.1: 2
    • ADV_RCR.1: 9
  • AGD:
    • AGD_ADM.1: 28
    • AGD_USR.1: 21
  • ATE:
    • ATE_IND.1: 10
  • AVA:
    • AVA_VLA.2: 16
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
    • FAU_STG.1: 8
    • FAU_STG.1.1: 1
    • FAU_STG.1.2: 1
    • FAU_STG.2: 7
    • FAU_STG.2.1: 1
    • FAU_STG.2.2: 1
    • FAU_STG.2.3: 1
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 15
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 8
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 18
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 8
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_ETC: 5
    • FDP_ETC.1: 1
    • FDP_ETC.2: 1
    • FDP_ETC.3: 15
    • FDP_ETC.3.1: 2
    • FDP_ETC.3.2: 2
    • FDP_ETC.3.3: 2
    • FDP_IFC.1: 16
    • FDP_IFF.1: 2
    • FDP_ITC.1: 6
    • FDP_ITC.2: 14
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 7
    • FDP_ROL.1: 5
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 2
    • FDP_SDI.1: 1
    • FDP_SDI.2: 4
    • FDP_SDI.2.1: 2
    • FDP_SDI.2.2: 2
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 6
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 5
    • FIA_UID.2: 7
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_LIM.1: 5
    • FMT_LIM.2: 5
    • FMT_MSA.1: 8
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 5
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 13
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 14
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 5
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 3
    • FPT_PHP.3: 7
    • FPT_RPL.1: 7
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 6
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 12
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 4
  • FDP:
    • FDP_ACC.1: 10
    • FDP_ACC.2: 6
    • FDP_ACF.1: 6
    • FDP_IFC.1: 2
  • FIA:
    • FIA_ATD.1: 3
    • FIA_UAU.1: 1
    • FIA_UAU.2: 1
    • FIA_UID.1: 5
    • FIA_UID.2: 3
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 3
    • FMT_MSA.3: 4
    • FMT_SMR.1: 7
pdf_data/st_keywords/cc_claims
  • O:
    • O.MAC: 7
    • O.RND: 3
  • T:
    • T.RND: 2
  • O:
    • O.ACS_PRT: 6
    • O.ASSETS_PRT: 4
    • O.DESIGN_ACS: 1
    • O.DSOFT_ACS: 1
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.SEC_DEL: 1
    • O.SOFT_ACS: 1
    • O.TI_ACS: 1
    • O.TOE_PRT: 6
  • T:
    • T.CLON: 1
    • T.COPY_ELECFILES: 9
    • T.DIS_DESIGN: 1
    • T.DIS_DSOFT: 2
    • T.DIS_ELECFILES: 5
    • T.DIS_HARDCOPY: 1
    • T.DIS_HARDDOC: 2
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_ELECFILES: 4
    • T.MOD_HARDCOPY: 1
    • T.MOD_PHOTOMASK: 1
    • T.MOD_SOFT: 1
    • T.PRINT_ELECFILES: 5
    • T.T_ELECFILES: 4
    • T.T_EMUL: 1
    • T.T_HARDCOPY: 1
    • T.T_HARDDOC: 2
    • T.T_PHOTOMASK: 1
    • T.T_PRODUCT: 7
    • T.T_SIMUL: 1
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 23
    • NXP Semiconductors: 18
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 25
      • AES128: 1
  • constructions:
    • MAC:
      • CMAC: 6
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 35
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 11
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 6
    • fault injection: 1
    • malfunction: 2
  • SCA:
    • DPA: 1
    • Leak-Inherent: 6
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 2
    • side-channels: 1
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 2
    • AIS31: 3
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS PUB 197: 2
pdf_data/st_metadata
  • /CreationDate: D:20030128185633
  • /ModDate: D:20030128185637+01'00'
  • /Producer: Acrobat Distiller 4.0 for Windows
  • pdf_file_size_bytes: 140903
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 61
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different