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NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
NSCIB-CC-2300128-01-CR 		STMicroelectronics STSafe S300 v1.2.5
NSCIB-CC-0176780-CR
name NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 STMicroelectronics STSafe S300 v1.2.5
not_valid_after 27.12.2028 20.08.2025
not_valid_before 27.12.2023 20.08.2020
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CERT.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC-20-0176780.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CR%20.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0176780-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-ST%20lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20STSafe300%20Security%20Target_LITE_A.pdf
manufacturer NXP Semiconductors Germany GmbH STMicroelectronics S.r.l et STMicroelectronics
manufacturer_web https://www.nxp.com https://www.st.com/content/st_com/en.html
security_level EAL4 EAL4+, ALC_DVS.2, AVA_VAN.5
dgst 2b64c5fbc41dddeb a9b795fa74ce0452
heuristics/cert_id NSCIB-CC-2300128-01-CR NSCIB-CC-0176780-CR
heuristics/extracted_sars ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ADV_FSP.4, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 01.1 1.2.5
heuristics/report_references/directly_referencing {} ANSSI-CC-2020/22
heuristics/report_references/indirectly_referencing {} ANSSI-CC-2020/22
heuristics/scheme_data
heuristics/st_references/directly_referencing {} ANSSI-CC-2020/22, ANSSI-CC-2017/73
heuristics/st_references/indirectly_referencing {} ANSSI-CC-2020/22, ANSSI-CC-2017/73
pdf_data/cert_filename NSCIB-CC-2300128-01-CERT.pdf CC-20-0176780.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01: 1
  • NL:
    • CC-20-0176780: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL4: 2
  • EAL:
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR.3: 1
  • ALC:
    • ALC_DVS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_claims
  • R:
    • R.L: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • Riscure:
    • Riscure: 1
  • BrightSight:
    • Brightsight: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_metadata
  • /Author: JM2
  • /CreationDate: D:20240109181337+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240109181337+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 92264
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /CreationDate: D:20200903160855+01'00'
  • /Creator: C458-M
  • /ModDate: D:20200903160325+02'00'
  • /Producer: KONICA MINOLTA bizhub C458
  • /Title: C458-M&S20090316080
  • pdf_file_size_bytes: 68365
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-2300128-01-CR .pdf NSCIB-CC-0176780-CR.pdf
pdf_data/report_frontpage
  • NL:
    • cert_id: NSCIB-CC-2300128-01-CR
    • cert_item: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
    • cert_lab: Riscure B.V.
    • developer: NXP Semiconductors Germany GmbH
  • NL:
    • cert_id: NSCIB-CC-0176780-CR
    • cert_item: STSafe S300 v1.2.5
    • cert_lab: Brightsight
    • developer: ST Microelectronics S.r.l
pdf_data/report_keywords/cc_cert_id
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01-CR: 11
  • FR:
    • ANSSI-CC-2020/22: 1
  • NL:
    • NSCIB-CC-0176780-CR: 11
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL4: 3
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
    • EAL4+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
  • AVA:
    • AVA_VAN.5: 3
pdf_data/report_keywords/vendor
  • NXP:
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • Riscure:
    • Riscure: 3
  • BrightSight:
    • Brightsight: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 3
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JHAS: 1
    • JIL: 1
  • SCA:
    • side channel: 1
  • other:
    • JIL: 2
pdf_data/report_metadata
pdf_data/st_filename NSCIB-CC-2300128-01-ST lite.pdf [ST] STSafe300 Security Target_LITE_A.pdf
pdf_data/st_keywords/cc_cert_id
  • FR:
    • ANSSI-CC-2017/73: 1
    • ANSSI-CC-2020/22: 2
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 5
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 2
    • EAL4: 4
    • EAL4 augmented: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.3: 2
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE: 3
    • AGD_OPE.1: 1
    • AGD_PRE: 2
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 4
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 4
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
    • FAU_STG.1: 8
    • FAU_STG.1.1: 1
    • FAU_STG.1.2: 1
    • FAU_STG.2: 7
    • FAU_STG.2.1: 1
    • FAU_STG.2.2: 1
    • FAU_STG.2.3: 1
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 15
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 8
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 18
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 8
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_ETC: 5
    • FDP_ETC.1: 1
    • FDP_ETC.2: 1
    • FDP_ETC.3: 15
    • FDP_ETC.3.1: 2
    • FDP_ETC.3.2: 2
    • FDP_ETC.3.3: 2
    • FDP_IFC.1: 16
    • FDP_IFF.1: 2
    • FDP_ITC.1: 6
    • FDP_ITC.2: 14
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 7
    • FDP_ROL.1: 5
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 2
    • FDP_SDI.1: 1
    • FDP_SDI.2: 4
    • FDP_SDI.2.1: 2
    • FDP_SDI.2.2: 2
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 6
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 5
    • FIA_UID.2: 7
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_LIM.1: 5
    • FMT_LIM.2: 5
    • FMT_MSA.1: 8
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 5
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 13
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 14
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 5
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 3
    • FPT_PHP.3: 7
    • FPT_RPL.1: 7
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 6
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 12
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 4
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ACC: 21
    • FDP_ACC.1: 12
    • FDP_ACF: 15
    • FDP_ACF.1: 12
    • FDP_ETC.1: 5
    • FDP_ETC.1.1: 1
    • FDP_ETC.1.2: 1
    • FDP_IFC.1: 9
    • FDP_ITC: 1
    • FDP_ITC.1: 4
    • FDP_ITC.1.1: 1
    • FDP_ITC.1.2: 1
    • FDP_ITC.1.3: 1
    • FDP_ITT.1: 1
    • FDP_SDC.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 5
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT.1: 5
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 6
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FIA:
    • FIA_UID: 1
  • FMT:
    • FMT_LIM: 4
    • FMT_MSA: 4
    • FMT_MSA.3: 9
    • FMT_SMF: 2
    • FMT_SMR: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
  • FTP:
    • FTP_ITC: 12
    • FTP_ITC.1: 10
    • FTP_TRP.1: 4
pdf_data/st_keywords/cc_claims
  • O:
    • O.MAC: 7
    • O.RND: 3
  • T:
    • T.RND: 2
  • O:
    • O.RND: 1
  • OE:
    • OE.KEY_PERSO: 4
  • OT:
    • OT.ACCESS_CONTROL: 4
    • OT.DATA_PROTECTION: 4
  • T:
    • T.DATA_DISCLOSE: 3
    • T.DATA_MODIFY: 3
    • T.LOADER_MISUSE: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 23
    • NXP Semiconductors: 18
  • STMicroelectronics:
    • STMicroelectronics: 4
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 25
      • AES128: 1
  • constructions:
    • MAC:
      • CMAC: 6
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 35
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 11
  • RNG:
    • RND: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 6
    • fault injection: 1
    • malfunction: 2
  • SCA:
    • DPA: 1
    • Leak-Inherent: 6
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 2
    • side-channels: 1
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 1
  • SCA:
    • Leak-Inherent: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 2
    • AIS31: 3
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS PUB 197: 2
  • CC:
    • CCMB-2017-04-004: 1
pdf_data/st_keywords/javacard_version
  • JavaCard:
    • Java Card 3.0.5: 1
pdf_data/st_metadata
  • /Author: Marisca Crompvoets
  • /CreationDate: D:20200804140313+02'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20200804140313+02'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 540613
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 27
state/cert/convert_garbage False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different