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	NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 NSCIB-CC-2300128-01-CR	Los Altos Technologies Unishred Pro Version 3.3.2 CCEVS-VR-0039-2006
name	NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1	Los Altos Technologies Unishred Pro Version 3.3.2
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	Other Devices and Systems
scheme	NL	US
status	active	archived
not_valid_after	27.12.2028	06.09.2012
not_valid_before	27.12.2023	22.11.2006
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CERT.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CR%20.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10105-vr.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-ST%20lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10105-st.pdf
manufacturer	NXP Semiconductors Germany GmbH	Los Altos Technologies
manufacturer_web	https://www.nxp.com	https://www.lat.com/
security_level	EAL4	EAL2
dgst	2b64c5fbc41dddeb	91ae54df62c5c188
heuristics/cert_id	NSCIB-CC-2300128-01-CR	CCEVS-VR-0039-2006
heuristics/cert_lab		US
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1	ATE_COV.2, ADV_RCR.1, ADV_FSP.1, ATE_FUN.1, AGD_USR.1, AVA_VLA.1, ATE_IND.2, AGD_ADM.1, ADV_HLD.1, AVA_SOF.1
heuristics/extracted_versions	01.1	3.3.2
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	cert_id: NSCIB-CC-2300128-01-CR cert_link: https://trustcb.com/download/?wpdmdl=3633 certification_date: 27.12.2023 developer: NXP Semiconductors GmbH evaluation_facility: Riscure B.V level: EAL4 product: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 report_link: https://trustcb.com/download/?wpdmdl=3634 status: Issued target_link: https://trustcb.com/download/?wpdmdl=3635	category: Sensitive Data Protection certification_date: 22.11.2006 evaluation_facility: Arca CCTL expiration_date: id: CCEVS-VR-VID10105 product: Los Altos Technologies UniShred Pro® Version 3.3.2 scheme: US url: https://www.niap-ccevs.org/product/10105 vendor: Los Altos Tecnologies
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	NSCIB-CC-2300128-01-CERT.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id	NL: CC-19-175197: 1 NSCIB-2300128-01: 1 NSCIB-CC-2300128-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level	EAL: EAL2: 1 EAL4: 2
pdf_data/cert_keywords/cc_sar	ALC: ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor	NXP: NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility	Riscure: Riscure: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id	ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: JM2 /CreationDate: D:20240109181337+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240109181337+00'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 92264 pdf_hyperlinks: https://www.tuv-nederland.nl/ pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	NSCIB-CC-2300128-01-CR .pdf	st_vid10105-vr.pdf
pdf_data/report_frontpage	NL: cert_id: NSCIB-CC-2300128-01-CR cert_item: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 cert_lab: Riscure B.V. developer: NXP Semiconductors Germany GmbH US:	NL: US: cert_id: CCEVS-VR-06-0039 cert_item: Los Altos Technologies UniShred Pro® Version 3.3.2 cert_lab: US NIAP
pdf_data/report_keywords/cc_cert_id	NL: CC-19-175197: 1 NSCIB-2300128-01: 1 NSCIB-CC-2300128-01-CR: 11	US: CCEVS-VR-06-0039: 1
pdf_data/report_keywords/cc_protection_profile_id
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 1 EAL4: 3	EAL: EAL 2: 2 EAL2: 9
pdf_data/report_keywords/cc_sar		ACM: ACM_CAP.2: 1 ADO: ADO_DEL: 2 ADO_DEL.1: 1 ADO_IGS.1: 2 ADV: ADV_FSP.1: 1 ADV_HLD.1: 1 ADV_RCR.1: 1 AGD: AGD_ADM: 1 AGD_ADM.1: 1 AGD_USR: 2 AGD_USR.1: 1 ALC: ALC_FLR: 1 ASE: ASE_TSS: 2 ATE: ATE_COV.1: 2 ATE_FUN.1: 2 ATE_IND: 2 ATE_IND.2: 1 AVA: AVA_SOF.1: 1 AVA_VLA.1: 1
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims		A: A.ADMIN_CRED: 1 A.LOCATE: 1 A.NOEVIL: 1 A.PHYSICAL: 1 T: T.DATA_ACCESS: 1 T.DATA_DELETED: 1 T.DATA_FORMAT: 1 T.INCOMP_OVER: 1
pdf_data/report_keywords/vendor	NXP: NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility	Riscure: Riscure: 3
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 3
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	SCA: side-channel: 1 other: JHAS: 1 JIL: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: JM2 /CreationDate: D:20240109180059+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240109180059+00'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 274045 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/, https://trustcb.com/common-criteria/nscib/, https://nscib.nl/, mailto:[email protected], https://www.tuv-nederland.nl/common-criteria/certificates.html pdf_is_encrypted: False pdf_number_of_pages: 11	/Author: Elizabeth A. Foreman /Comments: Validation Report, ver.1.0 VID 10105, CCEVS-VR-06-0039 /Company: The MITRE Corporation /CreationDate: D:20061128145854-05'00' /Creator: Acrobat PDFMaker 7.0 for Word /ModDate: D:20061128150010-05'00' /Producer: Acrobat Distiller 7.0 (Windows) /SourceModified: D:20061128195805 /Title: Validation Report: Los Altos Technologies UniShred Pro, version 3.3.2 pdf_file_size_bytes: 232551 pdf_hyperlinks: http://niap.bahialab.com/cc-scheme/PD/index.html, http://www.commoncriteriaportal.org/public/expert/index.php?menu=4 pdf_is_encrypted: False pdf_number_of_pages: 27
pdf_data/st_filename	NSCIB-CC-2300128-01-ST lite.pdf	st_vid10105-st.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 5	EAL: EAL2: 9
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_IMP.1: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.1: 1 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.3: 2	ACM: ACM_CAP.2: 16 ADO: ADO_DEL.1: 9 ADO_IGS.1: 9 ADV: ADV_FSP.1: 12 ADV_HLD.1: 15 ADV_RCR.1: 8 AGD: AGD_ADM.1: 15 AGD_USR.1: 13 ATE: ATE_COV.1: 7 ATE_COV.2: 1 ATE_FUN.1: 13 ATE_IND.2: 11 AVA: AVA_SOF.1: 10 AVA_VLA.1: 12
pdf_data/st_keywords/cc_sfr	FAU: FAU_GEN.1: 8 FAU_SAS.1: 6 FAU_SAS.1.1: 1 FAU_STG.1: 8 FAU_STG.1.1: 1 FAU_STG.1.2: 1 FAU_STG.2: 7 FAU_STG.2.1: 1 FAU_STG.2.2: 1 FAU_STG.2.3: 1 FCS: FCS_CKM.1: 6 FCS_CKM.4: 15 FCS_CKM.4.1: 1 FCS_COP.1: 21 FCS_COP.1.1: 2 FCS_RNG.1: 8 FCS_RNG.1.1: 3 FCS_RNG.1.2: 2 FDP: FDP_ACC.1: 18 FDP_ACC.1.1: 1 FDP_ACF.1: 8 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_ETC: 5 FDP_ETC.1: 1 FDP_ETC.2: 1 FDP_ETC.3: 15 FDP_ETC.3.1: 2 FDP_ETC.3.2: 2 FDP_ETC.3.3: 2 FDP_IFC.1: 16 FDP_IFF.1: 2 FDP_ITC.1: 6 FDP_ITC.2: 14 FDP_ITC.2.1: 1 FDP_ITC.2.2: 1 FDP_ITC.2.3: 1 FDP_ITC.2.4: 1 FDP_ITC.2.5: 1 FDP_ITT.1: 7 FDP_ROL.1: 5 FDP_ROL.1.1: 1 FDP_ROL.1.2: 1 FDP_SDC.1: 5 FDP_SDC.1.1: 2 FDP_SDI.1: 1 FDP_SDI.2: 4 FDP_SDI.2.1: 2 FDP_SDI.2.2: 2 FIA: FIA_UAU.1: 1 FIA_UAU.2: 5 FIA_UAU.2.1: 1 FIA_UAU.5: 6 FIA_UAU.5.1: 1 FIA_UAU.5.2: 1 FIA_UID.1: 5 FIA_UID.2: 7 FIA_UID.2.1: 1 FMT: FMT_LIM.1: 5 FMT_LIM.2: 5 FMT_MSA.1: 8 FMT_MSA.1.1: 1 FMT_MSA.3: 8 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_MTD.1: 5 FMT_MTD.1.1: 1 FMT_SMF.1: 13 FMT_SMF.1.1: 1 FMT_SMR.1: 14 FMT_SMR.1.1: 1 FMT_SMR.1.2: 1 FPR: FPR_UNL.1: 5 FPR_UNL.1.1: 1 FPT: FPT_FLS.1: 7 FPT_ITT.1: 3 FPT_PHP.3: 7 FPT_RPL.1: 7 FPT_RPL.1.1: 1 FPT_RPL.1.2: 1 FPT_TDC.1: 8 FPT_TDC.1.1: 1 FPT_TDC.1.2: 1 FRU: FRU_FLT.2: 6 FTP: FTP_ITC.1: 2 FTP_TRP.1: 12 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 4	FAU: FAU_GEN.1: 1 FAU_GEN_EXP.1: 12 FAU_GEN_EXP.1.2: 1 FDP: FDP_OOP_EXP.1: 8 FDP_OOP_EXP.1.1: 1 FDP_VOP_EXP.1: 8 FDP_VOP_EXP.1.1: 1 FIA: FIA_UID.1: 5 FIA_UID.1.1: 1 FIA_UID.1.2: 1 FMT: FMT_MSA: 1 FPT: FPT_STM.1: 6 FPT_STM.1.1: 1
pdf_data/st_keywords/cc_claims	O: O.MAC: 7 O.RND: 3 T: T.RND: 2	A: A.ADMIN_CRED: 4 A.LOCATE: 3 A.NOEVIL: 2 A.PHYSICAL: 5 O: O.NOFITY: 2 O.NOTIFY: 3 O.REPORT_GEN: 4 O.SANITIZE: 5 O.VERIFY: 4 OE: OE.ACCESS: 5 OE.AUTHORIZATION: 4 OE.NOEVIL: 3 OE.PHYSEC: 3 T: T.DATA_ACCESS: 4 T.DATA_DELETED: 2 T.DATA_FORMAT: 4 T.INCOMP_OVER: 4
pdf_data/st_keywords/vendor	NXP: NXP: 23 NXP Semiconductors: 18
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 25 AES128: 1 constructions: MAC: CMAC: 6
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	MAC: MAC: 35
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 5 RNG: 11
pdf_data/st_keywords/cipher_mode	CBC: CBC: 2
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 6 fault injection: 1 malfunction: 2 SCA: DPA: 1 Leak-Inherent: 6 Physical Probing: 2 physical probing: 2 side channel: 2 side-channels: 1 other: reverse engineering: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS20: 2 AIS31: 3 CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS PUB 197: 2	ISO: ISO/IEC 15408:2004: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: /CreationDate: D:20181231112145+01'00' /Creator: LaTeX with hyperref package /Keywords: /ModDate: D:20181231112145+01'00' /PTEX.Fullbanner: This is MiKTeX-pdfTeX 2.9.4052 (1.40.11) /Producer: pdfTeX-1.40.11 /Subject: /Title: /Trapped: /False pdf_file_size_bytes: 584723 pdf_hyperlinks: http://csrc.nist.gov/publications/nistpubs/800-38B/SP_800-38B.pdf, http://csrc.nist.gov/publications/nistpubs/800-38a/sp800-38a.pdf pdf_is_encrypted: False pdf_number_of_pages: 63	/Author: Laura Stubbs /Company: C&W CCTL /CreationDate: D:20061128144755-05'00' /Creator: Acrobat PDFMaker 7.0 for Word /ModDate: D:20061128144838-05'00' /Producer: Acrobat Distiller 7.0 (Windows) /SourceModified: D:20061128194711 /Title: Generic ST /_AdHocReviewCycleID: n/a /_AuthorEmail: [email protected] /_AuthorEmailDisplayName: Alicia Squires /_EmailSubject: EAL2 ST Template pdf_file_size_bytes: 437842 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 37
state/cert/convert_garbage	False	False
state/cert/convert_ok	True	False
state/cert/download_ok	True	False
state/cert/extract_ok	True	False
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different