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	NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 NSCIB-CC-2300128-01-CR	Samsung SSP01 of S5E9830 with Specific IC Dedicated Software Revision 1.1 2018-59-INF-3424
name	NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1	Samsung SSP01 of S5E9830 with Specific IC Dedicated Software Revision 1.1
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	NL	ES
status	active	active
not_valid_after	27.12.2028	18.03.2026
not_valid_before	27.12.2023	18.03.2021
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CERT.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-59%20CCRA.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CR%20.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-59%20INF-3424.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-ST%20lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-59%20ST_lite.pdf
manufacturer	NXP Semiconductors Germany GmbH	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.nxp.com	https://www.samsung.com
security_level	EAL4	EAL5+, ALC_DVS.2, AVA_VAN.5
dgst	2b64c5fbc41dddeb	8070163bf63b0e18
heuristics/cert_id	NSCIB-CC-2300128-01-CR	2018-59-INF-3424
heuristics/cert_lab		[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions	01.1	1.1
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	cert_id: NSCIB-CC-2300128-01-CR cert_link: https://trustcb.com/download/?wpdmdl=3633 certification_date: 27.12.2023 developer: NXP Semiconductors GmbH evaluation_facility: Riscure B.V level: EAL4 product: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 report_link: https://trustcb.com/download/?wpdmdl=3634 status: Issued target_link: https://trustcb.com/download/?wpdmdl=3635	category: Smart Cards and similiar devices certification_date: 18.03.2021 enhanced: category: Smart Cards and similiar devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1100 certification_date: 18.03.2021 description: The Target of Evaluation (TOE), the SSP01 of S5E9830 with Specific IC Dedicated Software Revision 1.1 secure subsystem, is a Hard macro instantiated within an SOC which is composed of a processing unit, security components, hardware circuit for testing purpose during the manufacturing process and volatile and non-volatile memories (hardware). The main security features of the TOE are: Security sensors or detectors including High and Low Temperature detectors, High and Low Supply Voltage detectors, Supply Voltage Glitch detector and Laser detector Active Shields against physical intrusive attacks Dedicated hardware mechanisms against side-channel attacks Secure TDES and AES Symmetric Cryptography support PARITY/ CRC-32 calculators One Hardware Digital True Random Number Generator (DTRNG) that fulfills Test Procedure A specified by AIS31 standard. The IC Dedicated Software includes: DTRNG library built around Hardware DTRNG together with corresponding DTRNG application notes. This library fulfills the criteria of Test Procedure A specified by AIS31 standard. Secure Boot Loader is a loader for copying the embedded software from an external FLASH storage into the internal SRAM. evaluation_facility: Applus Laboratories level: EAL5 + ALC_DVS.2 + AVA_VAN.5 manufacturer: Samsung Electronics Co., Ltd report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1101 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1099 type: Product manufacturer: Samsung Electronics Co., Ltd product: Samsung SSP01 of S5E9830 with Specific IC Dedicated Software Revision 1.1 product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/655-samsung-ssp01-of-s5e9830-with-specific-ic-dedicated-software-revision-1-1
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	cf0f01bcd7be3e9c
maintenance_updates
protection_profiles
protection_profile_links	{}	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename	NSCIB-CC-2300128-01-CERT.pdf	2018-59 CCRA.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id	NL: CC-19-175197: 1 NSCIB-2300128-01: 1 NSCIB-CC-2300128-01: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL2: 1 EAL4: 2	EAL: EAL 2: 1 EAL5: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_FLR.3: 1	ALC: ALC_DVS.2: 1 ALC_FLR: 1 AVA: AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims		O: O.E: 1 T: T.I: 1
pdf_data/cert_keywords/vendor	NXP: NXP Semiconductors: 1	Samsung: Samsung: 2
pdf_data/cert_keywords/eval_facility	Riscure: Riscure: 1	Applus: Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id	ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: JM2 /CreationDate: D:20240109181337+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240109181337+00'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 92264 pdf_hyperlinks: https://www.tuv-nederland.nl/ pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 729339 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2
pdf_data/report_filename	NSCIB-CC-2300128-01-CR .pdf	2018-59 INF-3424.pdf
pdf_data/report_frontpage	NL: cert_id: NSCIB-CC-2300128-01-CR cert_item: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1 cert_lab: Riscure B.V. developer: NXP Semiconductors Germany GmbH	NL:
pdf_data/report_keywords/cc_cert_id	NL: CC-19-175197: 1 NSCIB-2300128-01: 1 NSCIB-CC-2300128-01-CR: 11	ES: 2018-59-INF-3424- v1: 1
pdf_data/report_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 2
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 1 EAL4: 3	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 1 EAL5: 8 ITSEC: ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar		ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_IMP.1: 1 ADV_TDS.4: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 8 ALC_FLR: 3 ALC_LCD.1: 1 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_REQ.2: 1 ATE: ATE_COV.2: 1 ATE_FUN.1: 1 AVA: AVA_VAN.5: 9
pdf_data/report_keywords/cc_sfr		FAU: FAU_SAS.1: 1 FCS: FCS_COP: 2 FCS_RNG.1: 1 FDP: FDP_ACC: 1 FDP_ACF: 1 FDP_IFC.1: 1 FDP_SDC.1: 1 FDP_SDR.1: 1 FDP_UIT.1: 1 FIA: FIA_API.1: 1 FMT: FMT_LIM: 4 FMT_MSA.1: 1 FMT_SMF.1: 1 FPT: FPT_FLS.1: 1 FPT_PHP.3: 1 FRU: FRU_FLT.2: 1 FTP: FTP_ITC.1: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	NXP: NXP Semiconductors: 3	Samsung: Samsung: 9
pdf_data/report_keywords/eval_facility	Riscure: Riscure: 3	Applus: Applus Laboratories: 5
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 3	AES_competition: AES: AES: 2 DES: 3DES: TDES: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function		SHA: SHA2: SHA-256: 1 SHA-512: 1 SHA384: 1
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness		TRNG: DTRNG: 9
pdf_data/report_keywords/cipher_mode		CBC: CBC: 1 CTR: CTR: 1 GCM: GCM: 1
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	SCA: side-channel: 1 other: JHAS: 1 JIL: 1	SCA: side-channel: 1 other: JIL: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id		BSI: AIS31: 2
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: JM2 /CreationDate: D:20240109180059+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240109180059+00'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 274045 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/, https://trustcb.com/common-criteria/nscib/, https://nscib.nl/, mailto:[email protected], https://www.tuv-nederland.nl/common-criteria/certificates.html pdf_is_encrypted: False pdf_number_of_pages: 11	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 947275 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 14
pdf_data/st_filename	NSCIB-CC-2300128-01-ST lite.pdf	2018-59 ST_lite.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1	BSI: BSI-CC-PP-0084: 1 BSI-CC-PP-0084-: 1 BSI-PP-0084: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 5	EAL: EAL 5: 1 EAL 5 augmented: 1 EAL5: 6 EAL5 augmented: 3
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_IMP.1: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.1: 1 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.3: 2	ADV: ADV_ARC: 1 ADV_ARC.1: 5 ADV_FSP: 2 ADV_FSP.4: 1 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.1: 1 ADV_INT.2: 1 ADV_TDS.4: 1 ADV_VAN: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 1 AGD_PRE: 1 AGD_PRE.1: 1 ALC: ALC_CMC: 1 ALC_CMC.4: 1 ALC_CMS: 2 ALC_CMS.4: 1 ALC_CMS.5: 3 ALC_DEL: 1 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.1: 1 ALC_DVS.2: 7 ALC_LCD.1: 1 ALC_TAT.2: 1 APE: APE_ECD: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 11
pdf_data/st_keywords/cc_sfr	FAU: FAU_GEN.1: 8 FAU_SAS.1: 6 FAU_SAS.1.1: 1 FAU_STG.1: 8 FAU_STG.1.1: 1 FAU_STG.1.2: 1 FAU_STG.2: 7 FAU_STG.2.1: 1 FAU_STG.2.2: 1 FAU_STG.2.3: 1 FCS: FCS_CKM.1: 6 FCS_CKM.4: 15 FCS_CKM.4.1: 1 FCS_COP.1: 21 FCS_COP.1.1: 2 FCS_RNG.1: 8 FCS_RNG.1.1: 3 FCS_RNG.1.2: 2 FDP: FDP_ACC.1: 18 FDP_ACC.1.1: 1 FDP_ACF.1: 8 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_ETC: 5 FDP_ETC.1: 1 FDP_ETC.2: 1 FDP_ETC.3: 15 FDP_ETC.3.1: 2 FDP_ETC.3.2: 2 FDP_ETC.3.3: 2 FDP_IFC.1: 16 FDP_IFF.1: 2 FDP_ITC.1: 6 FDP_ITC.2: 14 FDP_ITC.2.1: 1 FDP_ITC.2.2: 1 FDP_ITC.2.3: 1 FDP_ITC.2.4: 1 FDP_ITC.2.5: 1 FDP_ITT.1: 7 FDP_ROL.1: 5 FDP_ROL.1.1: 1 FDP_ROL.1.2: 1 FDP_SDC.1: 5 FDP_SDC.1.1: 2 FDP_SDI.1: 1 FDP_SDI.2: 4 FDP_SDI.2.1: 2 FDP_SDI.2.2: 2 FIA: FIA_UAU.1: 1 FIA_UAU.2: 5 FIA_UAU.2.1: 1 FIA_UAU.5: 6 FIA_UAU.5.1: 1 FIA_UAU.5.2: 1 FIA_UID.1: 5 FIA_UID.2: 7 FIA_UID.2.1: 1 FMT: FMT_LIM.1: 5 FMT_LIM.2: 5 FMT_MSA.1: 8 FMT_MSA.1.1: 1 FMT_MSA.3: 8 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_MTD.1: 5 FMT_MTD.1.1: 1 FMT_SMF.1: 13 FMT_SMF.1.1: 1 FMT_SMR.1: 14 FMT_SMR.1.1: 1 FMT_SMR.1.2: 1 FPR: FPR_UNL.1: 5 FPR_UNL.1.1: 1 FPT: FPT_FLS.1: 7 FPT_ITT.1: 3 FPT_PHP.3: 7 FPT_RPL.1: 7 FPT_RPL.1.1: 1 FPT_RPL.1.2: 1 FPT_TDC.1: 8 FPT_TDC.1.1: 1 FPT_TDC.1.2: 1 FRU: FRU_FLT.2: 6 FTP: FTP_ITC.1: 2 FTP_TRP.1: 12 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 4	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 8 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM.1: 7 FCS_CKM.4: 5 FCS_COP: 15 FCS_COP.1: 9 FCS_RNG: 6 FCS_RNG.1: 15 FCS_RNG.1.1: 2 FCS_RNG.1.2: 2 FDP: FDP_ACC: 8 FDP_ACC.1: 19 FDP_ACC.1.1: 1 FDP_ACF: 11 FDP_ACF.1: 19 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC: 1 FDP_IFC.1: 23 FDP_IFC.1.1: 1 FDP_IFF.1: 3 FDP_ITC.1: 4 FDP_ITC.2: 4 FDP_ITT: 1 FDP_ITT.1: 18 FDP_ITT.1.1: 1 FDP_SDC: 4 FDP_SDC.1: 14 FDP_SDC.1.1: 2 FDP_SDI: 1 FDP_SDI.1: 2 FDP_SDI.2: 8 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_SDR: 5 FDP_SDR.1: 11 FDP_SDR.1.1: 2 FDP_UCT.1: 9 FDP_UCT.1.1: 1 FDP_UIT.1: 9 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FIA: FIA_API: 6 FIA_API.1: 12 FIA_API.1.1: 2 FMT: FMT_LIM: 82 FMT_LIM.1: 12 FMT_LIM.1.1: 1 FMT_LIM.2: 11 FMT_LIM.2.1: 1 FMT_MSA: 2 FMT_MSA.1: 12 FMT_MSA.1.1: 1 FMT_MSA.3: 16 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF: 1 FMT_SMF.1: 9 FMT_SMF.1.1: 1 FMT_SMR.1: 6 FPT: FPT_ETD: 1 FPT_FLS: 1 FPT_FLS.1: 21 FPT_FLS.1.1: 1 FPT_ITT: 1 FPT_ITT.1: 16 FPT_ITT.1.1: 1 FPT_PHP: 2 FPT_PHP.3: 20 FPT_PHP.3.1: 1 FRU: FRU_FLT: 1 FRU_FLT.1: 1 FRU_FLT.2: 16 FRU_FLT.2.1: 1 FTP: FTP_ITC.1: 13 FTP_ITC.1.1: 1 FTP_ITC.1.2: 1 FTP_ITC.1.3: 1 FTP_TRP.1: 4
pdf_data/st_keywords/cc_claims	O: O.MAC: 7 O.RND: 3 T: T.RND: 2	O: O.AES: 5 O.MEM_ACCESS: 1 O.RND: 6 O.TDES: 7 T: T.RND: 5
pdf_data/st_keywords/vendor	NXP: NXP: 23 NXP Semiconductors: 18	Samsung: Samsung: 18
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 25 AES128: 1 constructions: MAC: CMAC: 6	AES_competition: AES: AES: 27 DES: 3DES: TDEA: 1 TDES: 14 Triple-DES: 6 DES: DES: 5
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	MAC: MAC: 35
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 5 RNG: 11	RNG: RND: 11 RNG: 1 TRNG: DTRNG: 23
pdf_data/st_keywords/cipher_mode	CBC: CBC: 2	ECB: ECB: 3
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 6 fault injection: 1 malfunction: 2 SCA: DPA: 1 Leak-Inherent: 6 Physical Probing: 2 physical probing: 2 side channel: 2 side-channels: 1 other: reverse engineering: 1	FI: Malfunction: 26 malfunction: 10 physical tampering: 2 SCA: DPA: 3 Leak-Inherent: 21 Physical Probing: 4 Physical probing: 2 SPA: 2 physical probing: 8 side-channel: 2 timing attacks: 1 other: reverse engineering: 4
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS20: 2 AIS31: 3 CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS PUB 197: 2	BSI: AIS31: 7 CC: CCMB-2017-04-001: 6 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS 180-4: 1 FIPS 197: 1 FIPS PUB 180-3: 3 FIPS197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: /CreationDate: D:20181231112145+01'00' /Creator: LaTeX with hyperref package /Keywords: /ModDate: D:20181231112145+01'00' /PTEX.Fullbanner: This is MiKTeX-pdfTeX 2.9.4052 (1.40.11) /Producer: pdfTeX-1.40.11 /Subject: /Title: /Trapped: /False pdf_file_size_bytes: 584723 pdf_hyperlinks: http://csrc.nist.gov/publications/nistpubs/800-38B/SP_800-38B.pdf, http://csrc.nist.gov/publications/nistpubs/800-38a/sp800-38a.pdf pdf_is_encrypted: False pdf_number_of_pages: 63	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 1094224 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 91
state/cert/convert_garbage	False	True
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different