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	Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC ANSSI-CC-2013/58	NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD NSCIB-CC-2300083-01-CR
name	Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC	NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	FR	NL
status	archived	active
not_valid_after	01.09.2019	19.09.2028
not_valid_before	04.09.2013	19.09.2023
cert_link		https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-Certificate.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2013_58__RC.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-CR.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Lite%20S3FT9MD_MC%20v1.0.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-STlite_v0_5%20.pdf
manufacturer	Samsung Electronics Co., Ltd.	NXP Semiconductors
manufacturer_web	https://www.samsung.com	https://www.nxp.com/
security_level	EAL5+, ALC_DVS.2, AVA_VAN.5	EAL6+, ALC_FLR.1, ASE_TSS.2
dgst	29ebedca9ed77512	bb5f58677109f233
heuristics/cert_id	ANSSI-CC-2013/58	NSCIB-CC-2300083-01-CR
heuristics/cert_lab	CEA
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1	ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ADV_CMC.5, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions	-	5.1.002
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data		cert_id: NSCIB-CC-2300083-01-CR cert_link: https://trustcb.com/download/?wpdmdl=3404 certification_date: 19.09.2023 developer: NXP Semiconductors GmbH evaluation_facility: TÜV Informationstechnik level: EAL6+ ASE_TSS.2, ALC_FLR.1 product: NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD report_link: https://trustcb.com/download/?wpdmdl=3405 status: Issued target_link: https://trustcb.com/download/?wpdmdl=3410
heuristics/st_references/directly_referenced_by	{}	NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	f6d23054061d72ba	cf0f01bcd7be3e9c
maintenance_updates
protection_profiles
protection_profile_links	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename		NSCIB-CC-2300083-01-Certificate.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id		NL: NSCIB-2300083-01: 1 NSCIB-CC-2300083-01: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-PP-0084-: 1
pdf_data/cert_keywords/cc_security_level		EAL: EAL2: 1 EAL6: 1 EAL6 augmented: 1 EAL7: 1
pdf_data/cert_keywords/cc_sar		ALC: ALC_FLR: 1 ALC_FLR.1: 1 ALC_FLR.3: 1 ASE: ASE_TSS.2: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor		NXP: NXP: 1 NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility		TUV: TÜV Informationstechnik: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id		ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata		/Author: Wim Ton /CreationDate: D:20231024161948+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20231024161948+01'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 89688 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	ANSSI-CC-2013_58__RC.pdf	NSCIB-CC-2300083-01-CR.pdf
pdf_data/report_frontpage	FR: cc_security_level: EAL 5 augmenté ALC_DVS.2, AVA_VAN.5 cc_version: Critères Communs version 3.1 révision 4 cert_id: ANSSI-CC-2013/58 cert_item: Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC cert_item_version: Revision 0 cert_lab: CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France developer: Samsung Electronics Co. Ltd. San #24, Nongseo-Dong, Giheung-Gu, Yongin-City, Gyeonggi-Do 446-711, République de Corée Commanditaire Samsung Electronics Co. Ltd. San #24, Nongseo-Dong, Giheung-Gu, Yongin-City, Gyeonggi-Do 446-711, République de Corée match_rules: ['Référence du rapport de certification(.+)Nom du produit(.+)Référence/version du produit(.+)Conformité à un profil de protection(.+)Critères d’évaluation et version(.+)Niveau d’évaluation(.+)Développeur (.+)Centre d’évaluation(.+)Accords de reconnaissance applicables'] ref_protection_profiles: PP0035] : Security IC Platform Protection Profile Version 1.0 NL:	FR: NL: cert_id: NSCIB-CC-2300083-01-CR cert_item: NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD cert_lab: TÜV Informationstechnik GmbH developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id	FR: ANSSI-CC-2013/58: 16	NL: NSCIB-2300083-01: 1 NSCIB-CC-2300083-01-CR: 13
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-PP-0035-2007: 1	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 1: 1 EAL 3: 1 EAL 5: 3 EAL 7: 1 EAL4: 2 EAL7: 1 ITSEC: ITSEC E6 Elevé: 1	EAL: EAL 6: 1 EAL 6 augmented: 1 EAL4: 1 EAL6: 1 EAL6 augmented: 1 EAL6+: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_ARC: 1 ADV_FSP: 1 ADV_IMP: 1 ADV_INT: 1 ADV_SPM: 1 ADV_TDS: 1 AGD: AGD_OPE: 1 AGD_PRE: 1 ALC: ALC_CMC: 2 ALC_CMS: 1 ALC_DEL: 1 ALC_DVS: 1 ALC_DVS.2: 2 ALC_FLR: 1 ALC_LCD: 1 ALC_TAT: 1 ASE: ASE_CCL: 1 ASE_ECD: 1 ASE_INT: 1 ASE_OBJ: 1 ASE_REQ: 1 ASE_SPD: 1 ASE_TSS: 1 ATE: ATE_COV: 1 ATE_DPT: 1 ATE_FUN: 1 ATE_IND: 1 AVA: AVA_VAN: 3 AVA_VAN.5: 2	ADV: ADV_IMP: 1 ALC: ALC_DVS.2: 1 ALC_FLR.1: 2 ASE: ASE_TSS.2: 1
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	Samsung: Samsung: 15	NXP: NXP: 13 NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility	CEA-LETI: CEA - LETI: 1 CESTI: CESTI: 3	TUV: TÜV Informationstechnik: 2
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 2 DES: 3DES: 3DES: 1 DES: DES: 1	AES_competition: AES: AES: 1 DES: DES: DES: 1 constructions: MAC: CBC-MAC: 1
pdf_data/report_keywords/asymmetric_crypto		ECC: ECC: ECC: 1 ECDH: ECDH: 1 ECDSA: ECDSA: 1 FF: DH: Diffie-Hellman: 1
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme		MAC: MAC: 1
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness	TRNG: DTRNG: 9	RNG: RNG: 1 TRNG: TRNG: 1
pdf_data/report_keywords/cipher_mode		CBC: CBC: 1 ECB: ECB: 1
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis		FI: DFA: 1 Fault Injection: 3 SCA: side-channel: 1 other: JIL: 2 JIL-AAPS: 1 JIL-AM: 2
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	BSI: AIS 31: 2 AIS31: 1 CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 CCMB-2012-09-004: 1	ISO: ISO/IEC 7816: 2
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: doucet /CreationDate: D:20130905163603+02'00' /Creator: PDFCreator Version 1.2.1 /Keywords: /ModDate: D:20130905163603+02'00' /Producer: GPL Ghostscript 9.02 /Subject: /Title: ANSSI-CC-2013_58__RC pdf_file_size_bytes: 150939 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 15	/Author: Denise Cater /CreationDate: D:20231027172548+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20231027172548+01'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 255271 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/, https://trustcb.com/common-criteria/nscib/, https://nscib.nl/, mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 13
pdf_data/st_filename	ST Lite S3FT9MD_MC v1.0.pdf	NSCIB-CC-2300083-01-STlite_v0_5 .pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id		NL: NSCIB-2300083-01: 1
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-PP-0035: 5	BSI: BSI-CC-PP-0084-2014: 1 BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL 5: 2 EAL 5 augmented: 2 EAL5: 6 EAL5 augmented: 1	EAL: EAL4: 1 EAL5: 5 EAL6: 14 EAL6 augmented: 2 EAL6+: 3
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 7 ADV_ARV: 1 ADV_FSP: 2 ADV_FSP.4: 2 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.1: 2 ADV_INT.2: 1 ADV_TDS.3: 1 ADV_TDS.4: 1 ADV_VAN: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 2 AGD_PRE: 1 AGD_PRE.1: 2 ALC: ALC_CMC: 1 ALC_CMC.4: 1 ALC_CMS: 2 ALC_CMS.4: 1 ALC_CMS.5: 3 ALC_DEL: 1 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.1: 1 ALC_DVS.2: 8 ALC_LCD.1: 1 ALC_TAT.2: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT.1: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 13	ADV: ADV_ARC.1: 5 ADV_CMC.5: 2 ADV_CMS.4: 1 ADV_CMS.5: 1 ADV_FSP: 1 ADV_FSP.1: 1 ADV_FSP.2: 4 ADV_FSP.4: 4 ADV_FSP.5: 6 ADV_IMP: 1 ADV_IMP.1: 6 ADV_IMP.2: 5 ADV_INT.3: 2 ADV_SPM.1: 5 ADV_TDS: 1 ADV_TDS.1: 7 ADV_TDS.3: 3 ADV_TDS.4: 1 ADV_TDS.5: 1 AGD: AGD_OPE.1: 4 AGD_PRE.1: 4 ALC: ALC_CMC: 1 ALC_CMC.4: 4 ALC_CMC.5: 5 ALC_CMS: 1 ALC_CMS.1: 1 ALC_CMS.4: 2 ALC_CMS.5: 4 ALC_DEL.1: 2 ALC_DVS.2: 5 ALC_FLR: 1 ALC_FLR.1: 5 ALC_LCD.1: 3 ALC_TAT.1: 6 ALC_TAT.3: 2 ASE: ASE_CCL: 2 ASE_CCL.1: 2 ASE_ECD: 1 ASE_ECD.1: 3 ASE_INT: 2 ASE_INT.1: 4 ASE_OBJ.2: 3 ASE_REQ: 2 ASE_REQ.1: 2 ASE_REQ.2: 2 ASE_SPD: 2 ASE_SPD.1: 2 ASE_TSS: 2 ASE_TSS.2: 6 ATE: ATE_COV: 1 ATE_COV.1: 2 ATE_COV.2: 2 ATE_COV.3: 4 ATE_DPT.1: 1 ATE_DPT.3: 1 ATE_FUN.1: 5 ATE_FUN.2: 2 ATE_IND.2: 1 AVA: AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 8 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM.1: 9 FCS_CKM.4: 5 FCS_COP: 11 FCS_COP.1: 9 FCS_RNG: 6 FCS_RNG.1: 14 FCS_RNG.1.1: 2 FCS_RNG.1.2: 2 FDP: FDP_ACC: 1 FDP_ACC.1: 14 FDP_ACC.1.1: 1 FDP_ACF: 2 FDP_ACF.1: 10 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC: 1 FDP_IFC.1: 18 FDP_IFC.1.1: 1 FDP_IFF.1: 3 FDP_ITC.1: 4 FDP_ITC.2: 4 FDP_ITT: 1 FDP_ITT.1: 17 FDP_ITT.1.1: 1 FDP_SDI.1: 1 FMT: FMT_LIM: 8 FMT_LIM.1: 24 FMT_LIM.1.1: 2 FMT_LIM.2: 28 FMT_LIM.2.1: 2 FMT_MSA: 2 FMT_MSA.1: 12 FMT_MSA.1.1: 1 FMT_MSA.3: 13 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF: 1 FMT_SMF.1: 9 FMT_SMF.1.1: 1 FMT_SMR.1: 6 FPT: FPT_FLS: 1 FPT_FLS.1: 21 FPT_FLS.1.1: 1 FPT_ITT: 1 FPT_ITT.1: 15 FPT_ITT.1.1: 1 FPT_PHP: 3 FPT_PHP.3: 20 FPT_PHP.3.1: 1 FRU: FRU_FLT: 1 FRU_FLT.1: 1 FRU_FLT.2: 17	FAU: FAU_SAS: 1 FAU_SAS.1: 6 FAU_SAS.1.1: 1 FCS: FCS_RNG: 6 FCS_RNG.1: 3 FDP: FDP_IFC.1: 7 FDP_ITT.1: 6 FDP_SDC: 1 FDP_SDC.1: 5 FDP_SDC.1.1: 1 FDP_SDI: 4 FDP_SDI.1: 1 FDP_SDI.2: 3 FMT: FMT_LIM: 1 FMT_LIM.1: 5 FMT_LIM.2: 4 FPT: FPT_FLS.1: 8 FPT_ITT.1: 6 FPT_PHP.3: 6 FRU: FRU_FLT.2: 8 FTP: FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims	O: O.MEM_ACCESS: 1 O.RND: 5 O.RNG: 1 T: T.RND: 5	O: O.RND: 1 O.RND_HW: 4 T: T.RND: 1 T.RND_HW: 3
pdf_data/st_keywords/vendor	Samsung: Samsung: 3	NXP: NXP: 107 NXP Semiconductors: 29
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 14 DES: 3DES: 3DES: 6 TDEA: 1 Triple-DES: 1 DES: DES: 8	AES_competition: AES: AES: 1
pdf_data/st_keywords/asymmetric_crypto	ECC: ECC: ECC: 3
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 10 RNG: 1 TRNG: DTRNG: 21 TRNG: 1	RNG: RND: 2 RNG: 12
pdf_data/st_keywords/cipher_mode	ECB: ECB: 3	CBC: CBC: 1 CFB: CFB: 1 CTR: CTR: 1 GCM: GCM: 1 OFB: OFB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 27 malfunction: 11 physical tampering: 2 SCA: DPA: 1 Leak-Inherent: 23 Physical Probing: 4 Physical probing: 2 physical probing: 9 side-channel: 3 timing attacks: 1 other: reverse engineering: 5	FI: Malfunction: 5 malfunction: 1 SCA: Leak-Inherent: 5 Physical Probing: 2 physical probing: 2
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data	ICVersion: IC Version: 1
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	BSI: AIS 31: 2 AIS31: 2 BSI-AIS31: 3 CC: CCMB-2012-09-001: 3 CCMB-2012-09-002: 3 CCMB-2012-09-003: 3 CCMB-2012-09-004: 3 FIPS: FIPS 197: 1 FIPS197: 1	CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 ISO: ISO/IEC 7816: 4
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: KyungSuk YI /Baustein: SLE66C82P/SLE66C42P /BausteinVersion: a15 /Classification: Public /Company: /CreationDate: D:20130718170836+09'00' /Creator: Word용 Acrobat PDFMaker 10.1 /Datum: 23-10-2003 /Dokument: Security Target /EEPROM: 8 kBytes /Jahr: 2003 /Keywords: /ModDate: D:20130718170850+09'00' /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98 /PP_Date: July 2001 /PP_Short: BSI-PP-0002; Version 1.0, July 2001 /PP_Version: 1.0 /Producer: Adobe PDF Library 10.0 /Protection Profile: Smartcard IC Platform Protection Profile /ROM: 64 kBytes /SourceModified: D:20130718053125 /Subject: /Technologie: 0,22 µm /Title: Security Target /Version: 1.2 /XRAM: 2 kBytes /m-Nummer: m1474/m1495 pdf_file_size_bytes: 1172525 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 62	/Author: NXP B.V. /CreationDate: D:20231019141135+01'00' /Creator: DITA Open Toolkit 3.7 /Keywords: NXP, ASE, SN300 B5 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL6 augmented /Producer: Apache FOP Version 2.6 /Subject: NXP SN300 B5 Series - Secure Element /Title: Security Target Lite pdf_file_size_bytes: 835909 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 36
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	True
state/cert/download_ok	False	True
state/cert/extract_ok	False	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different