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FM1280 V05
SERTIT-109 		NXP Secure Smart Card Controller P61N1M3PVD/VE including IC Dedicated Software
BSI-DSZ-CC-0824-2014
name FM1280 V05 NXP Secure Smart Card Controller P61N1M3PVD/VE including IC Dedicated Software
scheme NO DE
not_valid_after 02.07.2023 01.09.2019
not_valid_before 02.07.2018 18.06.2014
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20C%20v%202.0.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20Certification%20Report%20Fudan%20EAL5plus%20v2.0_rev.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0824a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/FM1280%20EAL5plus%20ST%20lite%20v2.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0824b_pdf.pdf
manufacturer Shanghai Fudan Microelectronics Group Co., Ltd. NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://eng.fmsh.com https://www.nxp.com
security_level ALC_DVS.2, EAL5+, AVA_VAN.5 EAL6+, ALC_FLR.1, ASE_TSS.2
dgst 29eab60d2793d1a1 dbf4b5998df90c88
heuristics/cert_id SERTIT-109 BSI-DSZ-CC-0824-2014
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, APE_ECD.1, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, ADV_COV.3, AGD_PRE.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ADV_IMP.2, ADV_CMC.5, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, APE_INT.1, ALC_COV.3, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 02.07.2018
  • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-109
    • certification_date: 02.07.2018
    • description: The TOE is a Dual Interface Smart Card Chip with IC Dedicated Software. It provides TDES, RSA, AES, ECC,True Random Number Generator and other security features. It can be widely and easily applied in various security fields such as banking and financial market, social security card, transport card, small-amount payment and security identification, etc. The TOE supports the following communication interfaces: - ISO/IEC 14443 TYPE A contactless interface - ISO/IEC 7816 contact interface - GPIO - SPI - I2C - UART
    • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
    • documents: frozendict({'cert': [frozendict({'href': 'https://sertit.no/getfile.php/135331-1607953855/SERTIT/Sertifikater/2018/109/SERTIT-109%20C%20v%202.0.pdf'})], 'target': [frozendict({'href': 'https://sertit.no/getfile.php/135325-1607953847/SERTIT/Sertifikater/2018/109/FM1280%20EAL5%2B%20ST%20lite.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/135328-1607953852/SERTIT/Sertifikater/2018/109/SERTIT-109%20Certification%20Report%20Fudan%20EAL5%2B%20v2.0_rev.pdf'})], 'maintenance': [frozendict({'href': 'https://sertit.no/getfile.php/135322-1607953843/SERTIT/Sertifikater/2018/109/SERTIT-109%20MR%20Maintenance%20Report%20v1.0-.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • expiration_date: 02.07.2023
    • level: EAL 5, ALC_DVS.2, ATE_DPT.2, AVA_VAN.5
    • mutual_recognition: CCRA, SOG-IS
    • product: V05
    • protection_profile: Security IC Platform Protection Profile with Augmentation Packages Version 1.0, BSI-CC-PP-0084-2014
    • sponsor: Shanghai Fudan Microelectronics Group Co., Ltd.
  • product: FM1280
  • url: https://sertit.no/certified-products/product-archive/fm1280
heuristics/protection_profiles cf0f01bcd7be3e9c f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename SERTIT-109 C v 2.0.pdf
pdf_data/cert_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 2
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • pdf_file_size_bytes: 2830569
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename SERTIT-109 Certification Report Fudan EAL5plus v2.0_rev.pdf 0824a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0824-2014
    • cert_item: NXP Secure Smart Card Controller P61N1M3PVD/VE including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 20
  • DE:
    • BSI-DSZ-CC-0824: 1
    • BSI-DSZ-CC-0824-2014: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 23
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 5: 22
    • EAL 5 augmented: 1
    • EAL1: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5+: 1
    • EAL7: 1
  • EAL:
    • EAL 4: 2
    • EAL 5: 3
    • EAL 6: 4
    • EAL 6 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 2
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 1
    • ADV_INT.3: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 2
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_TDS.5: 2
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 1
    • ALC_CMC.5: 3
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 3
    • ALC_FLR: 1
    • ALC_FLR.1: 7
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 1
    • ALC_TAT.3: 3
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 2
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_COP.1: 8
    • FCS_RNG.1: 4
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_ITT.1: 1
    • FDP_SDC.1: 4
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM.1: 2
    • FMT_LIM.2: 2
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 5
  • R:
    • R.O: 5
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 26
    • NXP Semiconductors: 37
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 5
  • DES:
    • 3DES:
      • TDES: 5
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 7
  • DES:
    • 3DES:
      • TDES: 2
      • Triple-DES: 4
    • DES:
      • DES: 3
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • RNG:
    • RNG: 2
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 6
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
  • SCA:
    • DPA: 1
    • SPA: 1
  • other:
    • JIL: 2
  • FI:
    • physical tampering: 1
  • SCA:
    • physical probing: 1
    • side channel: 1
    • timing attacks: 1
  • other:
    • JIL: 4
    • reverse engineering: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 15408: 8
    • ISO/IEC 7816: 2
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 37: 1
    • AIS 38: 1
    • AIS36: 1
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 7816: 4
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 05.2014 (confidential document) [11] P61N1M3 VD, NV Properties, data sheet addendum, NXP Semiconductors, Business Unit: 1
    • 9] Evaluation Technical Report BSI-DSZ-CC-0824, Version 1.6, 05 June 2014, T-Systems GEI GmbH (confidential document) [10] ETR for composition according to AIS36, NXP P61N1M3PVD/VE, T-Systems GEI GmbH, Version 1.1: 1
    • Security Target, NXP Semiconductors, Business Unit Identification, Rev. 2.3, 17 October 2013 (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
pdf_data/report_metadata
  • /Author: Ulrich Isachsen
  • /CreationDate: D:20190319130354+01'00'
  • /Creator: Microsoft® Word 2013
  • /Keywords: ugradert
  • /ModDate: D:20190319130354+01'00'
  • /Producer: Microsoft® Word 2013
  • /Title: tittel
  • pdf_file_size_bytes: 423796
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20140627072837+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, BSI, P61N1M3PVD/VE, Secure Smart Card Controller, EAL6, NXP"
  • /ModDate: D:20140627075820+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: IT Security
  • /Title: Certification Report BSI-DSZ-CC-0824-2014
  • pdf_file_size_bytes: 1101788
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
pdf_data/st_filename FM1280 EAL5plus ST lite v2.0.pdf 0824b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0824: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 2
    • EAL5 augmented: 2
    • EAL5+: 1
  • EAL:
    • EAL 6: 2
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL6: 39
    • EAL6 augmented: 4
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ADV:
    • ADV_ARC.1: 2
    • ADV_CMC.4: 1
    • ADV_CMC.5: 1
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_COV.3: 1
    • ADV_FSP: 1
    • ADV_FSP.4: 5
    • ADV_FSP.5: 13
    • ADV_IMP: 1
    • ADV_IMP.1: 3
    • ADV_IMP.2: 5
    • ADV_INT.3: 1
    • ADV_SPM: 2
    • ADV_SPM.1: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 3
    • ALC_CMC.5: 6
    • ALC_CMS: 2
    • ALC_CMS.4: 4
    • ALC_CMS.5: 6
    • ALC_COV: 1
    • ALC_COV.2: 2
    • ALC_COV.3: 1
    • ALC_DEL: 1
    • ALC_DEL.1: 5
    • ALC_DVS.2: 3
    • ALC_FLR.1: 4
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV.2: 1
    • ATE_COV.3: 4
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 9
    • FCS_CKM.4: 9
    • FCS_COP.1: 28
    • FCS_COP.1.1: 4
    • FCS_RNG.1: 6
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 8
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 7
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 4
    • FDP_ITC.1: 13
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
    • FDP_SDC.1: 7
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 2
    • FMT_MSA.3: 3
  • FPT:
    • FPT_FLS.1: 6
    • FPT_ITT.1: 6
    • FPT_PHP.3: 5
  • FRU:
    • FRU_FLT.2: 6
  • FAU:
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 3
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 8
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 36
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 31
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_FLS.1: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 13
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 7
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 8
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 9
    • FMT_LIM.2.1: 1
    • FMT_MSA.1: 24
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 21
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 7
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 12
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITT.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.AES: 5
    • O.ECC: 5
    • O.MEM_ACCCESS: 1
    • O.MEM_ACCESS: 4
    • O.RND: 3
    • O.RSA: 5
    • O.TDES: 6
  • T:
    • T.RND: 2
  • O:
    • O.FM_FW: 12
    • O.HW_AES: 7
    • O.INTEGRITY_CHK: 7
    • O.MEM_ACCESS: 13
    • O.NVM_INTEGRITY: 5
    • O.RND: 3
    • O.SFR_ACCESS: 13
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 98
    • NXP Semiconductors: 26
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 29
  • DES:
    • 3DES:
      • 3DES: 1
      • TDEA: 1
      • TDES: 16
      • Triple-DES: 7
    • DES:
      • DES: 13
  • AES_competition:
    • AES:
      • AES: 26
  • DES:
    • 3DES:
      • TDEA: 3
      • TDES: 1
      • Triple-DEA: 1
      • Triple-DES: 12
    • DES:
      • DEA: 2
      • DES: 10
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 30
    • ECDH:
      • ECDH: 3
    • ECDSA:
      • ECDSA: 4
  • ECC:
    • ECC:
      • ECC: 2
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 8
  • TRNG:
    • TRNG: 1
  • RNG:
    • RND: 5
    • RNG: 12
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 5
  • ECB:
    • ECB: 5
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 11
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • fault injection: 1
    • malfunction: 4
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
  • FI:
    • Malfunction: 12
    • fault injection: 2
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 14
    • Physical Probing: 2
    • physical probing: 1
    • side channel: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • FIPS:
    • FIPS 197: 3
  • ISO:
    • ISO/IEC 14443: 4
    • ISO/IEC 7816: 4
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • PKCS:
    • PKCS#1: 3
  • BSI:
    • AIS31: 3
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 13239: 2
    • ISO/IEC 14443: 8
    • ISO/IEC 7816: 12
    • ISO/IEC 7816-3: 1
pdf_data/st_metadata
  • /Author: FMSH
  • /CreationDate: D:20180606084137+08'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20180606084137+08'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 677458
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
  • /Author: NXP Semiconductors
  • /CreationDate: D:20140707144121+02'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: "CC, Security Evaluation, P61N1M3, P61N1M3PVD, P61N1M3PVE, Security Functional Requirements"
  • /ModDate: D:20140707163938+02'00'
  • /Producer: Acrobat Distiller 10.1.7 (Windows)
  • /Subject: P61N1M3PVD/VE
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 395220
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 75
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