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FM1280 V05
SERTIT-109
NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
NSCIB-CC-2300128-01-CR
name FM1280 V05 NXP MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
scheme NO NL
status archived active
not_valid_after 02.07.2023 27.12.2028
not_valid_before 02.07.2018 27.12.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20C%20v%202.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20Certification%20Report%20Fudan%20EAL5plus%20v2.0_rev.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-CR%20.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/FM1280%20EAL5plus%20ST%20lite%20v2.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300128-01-ST%20lite.pdf
manufacturer Shanghai Fudan Microelectronics Group Co., Ltd. NXP Semiconductors Germany GmbH
manufacturer_web https://eng.fmsh.com https://www.nxp.com
security_level ALC_DVS.2, EAL5+, AVA_VAN.5 EAL4
dgst 29eab60d2793d1a1 2b64c5fbc41dddeb
heuristics/cert_id SERTIT-109 NSCIB-CC-2300128-01-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions - 01.1
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 02.07.2018
  • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-109
    • certification_date: 02.07.2018
    • description: The TOE is a Dual Interface Smart Card Chip with IC Dedicated Software. It provides TDES, RSA, AES, ECC,True Random Number Generator and other security features. It can be widely and easily applied in various security fields such as banking and financial market, social security card, transport card, small-amount payment and security identification, etc. The TOE supports the following communication interfaces: - ISO/IEC 14443 TYPE A contactless interface - ISO/IEC 7816 contact interface - GPIO - SPI - I2C - UART
    • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
    • documents: frozendict({'cert': [frozendict({'href': 'https://sertit.no/getfile.php/135331-1607953855/SERTIT/Sertifikater/2018/109/SERTIT-109%20C%20v%202.0.pdf'})], 'target': [frozendict({'href': 'https://sertit.no/getfile.php/135325-1607953847/SERTIT/Sertifikater/2018/109/FM1280%20EAL5%2B%20ST%20lite.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/135328-1607953852/SERTIT/Sertifikater/2018/109/SERTIT-109%20Certification%20Report%20Fudan%20EAL5%2B%20v2.0_rev.pdf'})], 'maintenance': [frozendict({'href': 'https://sertit.no/getfile.php/135322-1607953843/SERTIT/Sertifikater/2018/109/SERTIT-109%20MR%20Maintenance%20Report%20v1.0-.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • expiration_date: 02.07.2023
    • level: EAL 5, ALC_DVS.2, ATE_DPT.2, AVA_VAN.5
    • mutual_recognition: CCRA, SOG-IS
    • product: V05
    • protection_profile: Security IC Platform Protection Profile with Augmentation Packages Version 1.0, BSI-CC-PP-0084-2014
    • sponsor: Shanghai Fudan Microelectronics Group Co., Ltd.
  • product: FM1280
  • url: https://sertit.no/certified-products/product-archive/fm1280
heuristics/protection_profiles cf0f01bcd7be3e9c {}
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/cert_filename SERTIT-109 C v 2.0.pdf NSCIB-CC-2300128-01-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 2
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
  • EAL:
    • EAL2: 1
    • EAL4: 2
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ALC:
    • ALC_FLR.3: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • Riscure:
    • Riscure: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • pdf_file_size_bytes: 2830569
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: JM2
  • /CreationDate: D:20240109181337+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240109181337+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 92264
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename SERTIT-109 Certification Report Fudan EAL5plus v2.0_rev.pdf NSCIB-CC-2300128-01-CR .pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-2300128-01-CR
    • cert_item: MF2DL(H)x0, MF2ID(H)10, NT4H2x21Gf and NT4H2x21Tf, Version 01.1
    • cert_lab: Riscure B.V.
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 20
  • NL:
    • CC-19-175197: 1
    • NSCIB-2300128-01: 1
    • NSCIB-CC-2300128-01-CR: 11
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 23
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 5: 22
    • EAL 5 augmented: 1
    • EAL1: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5+: 1
    • EAL7: 1
  • EAL:
    • EAL 4: 1
    • EAL4: 3
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_COP.1: 8
    • FCS_RNG.1: 4
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_ITT.1: 1
    • FDP_SDC.1: 4
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM.1: 2
    • FMT_LIM.2: 2
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
  • Riscure:
    • Riscure: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 5
  • DES:
    • 3DES:
      • TDES: 5
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 3
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
  • SCA:
    • DPA: 1
    • SPA: 1
  • other:
    • JIL: 2
  • SCA:
    • side-channel: 1
  • other:
    • JHAS: 1
    • JIL: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 15408: 8
    • ISO/IEC 7816: 2
pdf_data/report_metadata
  • /Author: Ulrich Isachsen
  • /CreationDate: D:20190319130354+01'00'
  • /Creator: Microsoft® Word 2013
  • /Keywords: ugradert
  • /ModDate: D:20190319130354+01'00'
  • /Producer: Microsoft® Word 2013
  • /Title: tittel
  • pdf_file_size_bytes: 423796
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
pdf_data/st_filename FM1280 EAL5plus ST lite v2.0.pdf NSCIB-CC-2300128-01-ST lite.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 2
    • EAL5 augmented: 2
    • EAL5+: 1
  • EAL:
    • EAL4: 5
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.3: 2
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 9
    • FCS_CKM.4: 9
    • FCS_COP.1: 28
    • FCS_COP.1.1: 4
    • FCS_RNG.1: 6
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 8
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 7
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 4
    • FDP_ITC.1: 13
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
    • FDP_SDC.1: 7
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 2
    • FMT_MSA.3: 3
  • FPT:
    • FPT_FLS.1: 6
    • FPT_ITT.1: 6
    • FPT_PHP.3: 5
  • FRU:
    • FRU_FLT.2: 6
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
    • FAU_STG.1: 8
    • FAU_STG.1.1: 1
    • FAU_STG.1.2: 1
    • FAU_STG.2: 7
    • FAU_STG.2.1: 1
    • FAU_STG.2.2: 1
    • FAU_STG.2.3: 1
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 15
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 8
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 18
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 8
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_ETC: 5
    • FDP_ETC.1: 1
    • FDP_ETC.2: 1
    • FDP_ETC.3: 15
    • FDP_ETC.3.1: 2
    • FDP_ETC.3.2: 2
    • FDP_ETC.3.3: 2
    • FDP_IFC.1: 16
    • FDP_IFF.1: 2
    • FDP_ITC.1: 6
    • FDP_ITC.2: 14
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT.1: 7
    • FDP_ROL.1: 5
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 2
    • FDP_SDI.1: 1
    • FDP_SDI.2: 4
    • FDP_SDI.2.1: 2
    • FDP_SDI.2.2: 2
  • FIA:
    • FIA_UAU.1: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 6
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 5
    • FIA_UID.2: 7
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_LIM.1: 5
    • FMT_LIM.2: 5
    • FMT_MSA.1: 8
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 8
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 5
    • FMT_MTD.1.1: 1
    • FMT_SMF.1: 13
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 14
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNL.1: 5
    • FPR_UNL.1.1: 1
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 3
    • FPT_PHP.3: 7
    • FPT_RPL.1: 7
    • FPT_RPL.1.1: 1
    • FPT_RPL.1.2: 1
    • FPT_TDC.1: 8
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FRU:
    • FRU_FLT.2: 6
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 12
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 4
pdf_data/st_keywords/cc_claims
  • O:
    • O.AES: 5
    • O.ECC: 5
    • O.MEM_ACCCESS: 1
    • O.MEM_ACCESS: 4
    • O.RND: 3
    • O.RSA: 5
    • O.TDES: 6
  • T:
    • T.RND: 2
  • O:
    • O.MAC: 7
    • O.RND: 3
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 23
    • NXP Semiconductors: 18
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 29
  • DES:
    • 3DES:
      • 3DES: 1
      • TDEA: 1
      • TDES: 16
      • Triple-DES: 7
    • DES:
      • DES: 13
  • AES_competition:
    • AES:
      • AES: 25
      • AES128: 1
  • constructions:
    • MAC:
      • CMAC: 6
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 30
    • ECDH:
      • ECDH: 3
    • ECDSA:
      • ECDSA: 4
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
  • MAC:
    • MAC: 35
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 8
  • TRNG:
    • TRNG: 1
  • RNG:
    • RND: 5
    • RNG: 11
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 5
  • ECB:
    • ECB: 5
  • CBC:
    • CBC: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • fault injection: 1
    • malfunction: 4
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
  • FI:
    • Malfunction: 6
    • fault injection: 1
    • malfunction: 2
  • SCA:
    • DPA: 1
    • Leak-Inherent: 6
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 2
    • side-channels: 1
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • FIPS:
    • FIPS 197: 3
  • ISO:
    • ISO/IEC 14443: 4
    • ISO/IEC 7816: 4
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • PKCS:
    • PKCS#1: 3
  • BSI:
    • AIS20: 2
    • AIS31: 3
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS PUB 197: 2
pdf_data/st_metadata
  • /Author: FMSH
  • /CreationDate: D:20180606084137+08'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20180606084137+08'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 677458
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
state/cert/convert_garbage True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different