Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
NXP SN100 Series - Secure Element with Crypto Library versions B2.1 C25/C48/C58
NSCIB-CC-2400058-01-CR 		Winbond SpiFlash TrustME Secure Flash Memory W75F32WWJB\W75F32WWJC version A
2018-19-INF-3292
name NXP SN100 Series - Secure Element with Crypto Library versions B2.1 C25/C48/C58 Winbond SpiFlash TrustME Secure Flash Memory W75F32WWJB\W75F32WWJC version A
scheme NL ES
not_valid_after 05.07.2029 05.11.2025
not_valid_before 05.07.2024 05.11.2020
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2400058-01-Cert.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-19%20CCRA.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2400058-01-CR.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-19%20INF-3292.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2400058-01_SE_lite_v3_5.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2018-19%20ST_lite.pdf
manufacturer NXP Semiconductors Germany GmbH Winbond Electonics Corporation
manufacturer_web https://www.nxp.com https://www.winbond.com/
security_level EAL6+, ALC_FLR.1, ASE_TSS.2 EAL5+, ALC_DVS.2, AVA_VAN.5
dgst 2737ecf38e520458 457c233b22eb68ce
heuristics/cert_id NSCIB-CC-2400058-01-CR 2018-19-INF-3292
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ADV_CMC.5, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ASE_CCL.1
heuristics/extracted_versions 2.1 -
heuristics/report_references/directly_referenced_by NSCIB-CC-2300066-02-CR {}
heuristics/report_references/indirectly_referenced_by NSCIB-CC-2300066-02-CR {}
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 05.11.2020
  • enhanced:
    • category: Smart Cards and similiar devices
    • cc_version: Common Criteria 3.1 release 5
    • cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1039
    • certification_date: 05.11.2020
    • description: The TOE is a Memory Flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and they will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC.
    • evaluation_facility: Applus Laboratories
    • level: EAL5 + ALC_DVS.2 + AVA_VAN.5
    • manufacturer: Winbond Electronics Corporation
    • report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1040
    • status: Certified
    • target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1038
    • type: Product
  • manufacturer: Winbond Electronics Corporation
  • product: Winbond SpiFlash TrustME Secure Flash Memory W75F32WWJB\W75F32WWJC version A
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/618-winbond-spiflash-trustme-secure-flash-memory-w75f32wwjb-w75f32wwjc-version-a
heuristics/st_references/directly_referenced_by NSCIB-CC-2300066-02-CR {}
heuristics/st_references/indirectly_referenced_by NSCIB-CC-2300066-02-CR {}
heuristics/protection_profiles cf0f01bcd7be3e9c {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/cert_filename NSCIB-CC-2400058-01-Cert.pdf 2018-19 CCRA.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-22-174263: 1
    • NSCIB-2400058-01: 1
    • NSCIB-CC-2400058-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
  • EAL:
    • EAL5: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
  • ALC:
    • ALC_DVS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
  • T:
    • T.I: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
  • Applus:
    • Applus Laboratories: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /Author: Haak
  • /CreationDate: D:20240708153719+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240708153719+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 91746
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 753211
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
pdf_data/report_filename NSCIB-CC-2400058-01-CR.pdf 2018-19 INF-3292.pdf
pdf_data/report_frontpage
  • NL:
    • cert_id: NSCIB-CC-2400058-01-CR
    • cert_item: SN100 Series - Secure Element with Crypto Library versions B2.1 C25/C48/C58
    • cert_lab: SGS Brightsight B.V.
    • developer: NXP Semiconductors Germany
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • CC-22-174263: 1
    • NSCIB-2400058-01: 1
    • NSCIB-CC-2400058-01-CR: 15
  • ES:
    • 2018-19-INF-3292-v1: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 3
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2: 1
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 1
    • FDP_RIP.1: 1
    • FDP_SDI.2: 1
    • FDP_UIT.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS: 2
    • FPT_ITT.1: 1
    • FPT_TRP.1: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 3
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
  • Applus:
    • Applus Laboratories: 5
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 3
  • DES:
    • 3DES:
      • 3DES: 1
      • TDES: 1
      • Triple-DES: 1
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
      • HMAC: 3
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 7
    • ECDH:
      • ECDH: 2
    • ECDSA:
      • ECDSA: 3
    • EdDSA:
      • EdDSA: 2
  • FF:
    • DH:
      • Diffie-Hellman: 1
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
    • SHA2:
      • SHA-224: 2
      • SHA-256: 2
      • SHA-384: 2
      • SHA-512: 2
    • SHA3:
      • SHA-3: 4
pdf_data/report_keywords/crypto_scheme
  • MAC:
    • MAC: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • ECB:
    • ECB: 1
  • GCM:
    • GCM: 1
  • OFB:
    • OFB: 1
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 1.0.0: 2
    • Crypto Library 2.0.0: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side channel: 1
  • other:
    • JIL: 4
    • JIL-AAPS: 1
  • FI:
    • fault injection: 2
  • other:
    • JIL: 1
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_metadata
  • /Author: 9308
  • /CreationDate: D:20201104180200+01'00'
  • /Creator: Microsoft® Word 2016
  • /ModDate: D:20201104180200+01'00'
  • /Producer: Microsoft® Word 2016
  • pdf_file_size_bytes: 1131696
  • pdf_hyperlinks: https://www.sogis.org/, http://www.commoncriteriaportal.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
pdf_data/st_filename NSCIB-CC-2400058-01_SE_lite_v3_5.pdf 2018-19 ST_lite.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084-2014: 2
  • BSI:
    • BSI-PP-0084: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 4
    • EAL4 augmented: 2
    • EAL6: 15
    • EAL6 augmented: 1
    • EAL6+: 2
  • EAL:
    • EAL5: 6
    • EAL5 augmented: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMC.5: 2
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 4
    • ADV_FSP.4: 4
    • ADV_FSP.5: 6
    • ADV_IMP: 1
    • ADV_IMP.1: 6
    • ADV_IMP.2: 5
    • ADV_INT.3: 2
    • ADV_SPM.1: 5
    • ADV_TDS.1: 7
    • ADV_TDS.3: 4
    • ADV_TDS.4: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 4
    • ALC_CMC.5: 5
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.2: 6
    • ALC_FLR.1: 5
    • ALC_LCD.1: 4
    • ALC_TAT.1: 6
    • ALC_TAT.3: 2
  • ASE:
    • ASE_CCL.1: 2
    • ASE_ECD.1: 3
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 3
    • ATE_COV.2: 2
    • ATE_COV.3: 4
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 5
    • ATE_FUN.2: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 6
    • ADV_FSP.1: 3
    • ADV_FSP.2: 3
    • ADV_FSP.4: 1
    • ADV_FSP.5: 8
    • ADV_IMP.1: 9
    • ADV_INT.2: 1
    • ADV_TDS.1: 2
    • ADV_TDS.3: 4
    • ADV_TDS.4: 8
  • AGD:
    • AGD_OPE.1: 6
    • AGD_PRE.1: 6
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.1: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 2
    • ALC_DVS.2: 9
    • ALC_LCD.1: 3
    • ALC_TAT.1: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 4
    • ASE_INT.1: 5
    • ASE_OBJ.2: 3
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 2
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 6
  • AVA:
    • AVA_VAN.5: 10
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM: 48
    • FCS_CKM.1: 51
    • FCS_CKM.2: 8
    • FCS_CKM.4: 55
    • FCS_CKM.4.1: 1
    • FCS_COP: 138
    • FCS_COP.1: 33
    • FCS_RNG: 25
    • FCS_RNG.1: 12
    • FCS_SDI.2: 1
  • FDP:
    • FDP_ACC: 17
    • FDP_ACC.1: 13
    • FDP_ACF: 17
    • FDP_ACF.1: 9
    • FDP_IFC.1: 14
    • FDP_ITC.1: 46
    • FDP_ITC.2: 46
    • FDP_ITT.1: 9
    • FDP_RIP: 1
    • FDP_RIP.1: 7
    • FDP_RIP.1.1: 1
    • FDP_SDC: 1
    • FDP_SDC.1: 7
    • FDP_SDI: 16
    • FDP_SDI.1: 2
    • FDP_SDI.1.1: 1
    • FDP_SDI.2: 5
    • FDP_SOP: 19
    • FDP_SOP.1: 9
    • FDP_SOP.1.1: 1
    • FDP_SOP.1.2: 1
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 5
    • FMT_LIM.2: 6
    • FMT_MAS.1: 1
    • FMT_MSA: 38
    • FMT_MSA.1: 8
    • FMT_MSA.3: 11
    • FMT_SMF.1: 18
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 9
  • FPT:
    • FPT_FLS.1: 12
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 12
  • FTP:
    • FTP_FLS.1: 1
  • FDP:
    • FDP_ACC.1: 3
    • FDP_ACF: 1
    • FDP_IFC.1: 27
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 4
    • FDP_ITT.1: 13
    • FDP_ITT.1.1: 1
    • FDP_RIP.1: 9
    • FDP_RIP.1.1: 1
    • FDP_SDC: 4
    • FDP_SDC.1: 16
    • FDP_SDC.1.1: 2
    • FDP_SDI: 1
    • FDP_SDI.2: 11
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 8
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FMT:
    • FMT_LIM: 5
    • FMT_LIM.1: 22
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 20
    • FMT_LIM.2.1: 2
  • FPT:
    • FPT_FLS: 22
    • FPT_FLS.1: 3
    • FPT_ITT.1: 12
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 14
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 12
    • FRU_FLT.2.1: 1
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.AES: 7
    • O.ARITH_OP: 6
    • O.COMPARE: 5
    • O.COPY: 6
    • O.CRC: 8
    • O.ECC_DHKE: 5
    • O.ECDAA: 6
    • O.ECDSA: 6
    • O.EDDSA: 5
    • O.EUICC: 5
    • O.FLASH-: 1
    • O.FLASH-INTEGRITY: 6
    • O.GCM-SUPPORT: 8
    • O.HMAC: 6
    • O.KDF: 6
    • O.MEM-ACCESS: 7
    • O.MONT_DHKE: 6
    • O.REUSE: 7
    • O.RND: 9
    • O.RSA: 5
    • O.SFR-ACCESS: 8
    • O.SHA: 5
    • O.SW_AES: 5
    • O.SW_CRC: 5
    • O.SW_DES: 6
    • O.TDES: 7
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 218
    • NXP Semiconductors: 32
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 61
  • DES:
    • 3DES:
      • 3DES: 1
      • TDEA: 2
      • TDES: 28
      • Triple-DES: 22
    • DES:
      • DES: 16
  • constructions:
    • MAC:
      • CBC-MAC: 11
      • CMAC: 11
      • HMAC: 30
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 45
    • ECDH:
      • ECDH: 5
    • ECDSA:
      • ECDSA: 21
    • EdDSA:
      • EdDSA: 26
  • FF:
    • DH:
      • DH: 3
      • Diffie-Hellman: 15
  • RSA:
    • RSA-CRT: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 19
    • SHA2:
      • SHA-224: 13
      • SHA-256: 13
      • SHA-384: 13
      • SHA-512: 13
    • SHA3:
      • SHA-3: 3
      • SHA3: 3
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
  • KEX:
    • Key Exchange: 12
  • MAC:
    • MAC: 2
  • MAC:
    • MAC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 12
    • RNG: 59
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 22
  • CCM:
    • CCM: 6
  • CFB:
    • CFB: 15
  • CTR:
    • CTR: 16
  • ECB:
    • ECB: 14
  • GCM:
    • GCM: 30
  • OFB:
    • OFB: 13
pdf_data/st_keywords/ecc_curve
  • Curve:
    • Curve25519: 7
  • Edwards:
    • Ed25519: 3
    • Ed448: 3
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 1.0.0: 2
    • Crypto Library 2.0.0: 1
    • Crypto Library v1.0.0: 4
    • Crypto Library v2.0: 4
    • Crypto Library v2.0.0: 17
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 4
    • Malfunction: 6
    • fault injection: 1
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 30
    • side-channel: 2
    • template attacks: 4
    • timing attack: 1
    • timing attacks: 4
  • other:
    • JIL: 2
  • FI:
    • Fault Injection: 1
    • Malfunction: 20
    • fault injection: 2
    • malfunction: 3
    • physical tampering: 3
  • SCA:
    • Leak-Inherent: 18
    • Physical Probing: 2
    • physical probing: 5
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI TR-03111: 2
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 1
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-2: 1
    • FIPS 197: 2
    • FIPS 198-1: 1
    • FIPS 202: 1
    • FIPS PUB 202-2015: 3
    • FIPS PUB 81-1980: 1
  • ISO:
    • ISO/IEC 11889:2015: 1
    • ISO/IEC 14888-3: 1
    • ISO/IEC 15946-1: 1
    • ISO/IEC 7816: 6
    • ISO/IEC 9797-1: 2
  • NIST:
    • NIST SP 800-38A: 4
    • NIST SP 800-38B: 1
    • NIST SP 800-38C: 1
    • NIST SP 800-38D: 2
    • NIST SP 800-67: 4
    • NIST SP 800-90A: 3
    • SP 800-38A: 1
    • SP 800-38D: 2
  • PKCS:
    • PKCS #1: 8
    • PKCS#1: 4
  • RFC:
    • RFC 7748: 4
    • RFC 8032: 7
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
    • CCMB-2017-04-004: 1
  • ISO:
    • ISO/IEC 7816-3: 1
pdf_data/st_keywords/javacard_api_const
  • curves:
    • SM2: 1
pdf_data/st_metadata
  • /Author: NXP B.V.
  • /CreationDate: D:20210517170753+02'00'
  • /Creator: DITA Open Toolkit
  • /Keywords: NXP, SN100 Series, SN100x Single Chip Secure Element and NFC Controller, Crypto Library, Common Criteria, Security Target Lite, SN100_SE B2.1 C25 / C48 / C58
  • /ModDate: D:20210517184216+02'00'
  • /PDFVersion: 1.4
  • /Producer: Apache FOP Version 1.1
  • /Subject: SN100 Series - Secure Element with Crypto Library
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 566771
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 103
state/cert/convert_garbage False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different