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STMicroelectronics ST33K1M5A and ST33K1M5M B01
NSCIB-CC-0428014-CR2 		Samsung S3FT9PF/ S3FT9PT/ S3FT9PS 16-bit ISC Microcontroller for Smart Card with optional Secure RSA/ECC/SHA Libraries including specific IC Dedicated Software (révision 0)
ANSSI-CC-2018/25
name STMicroelectronics ST33K1M5A and ST33K1M5M B01 Samsung S3FT9PF/ S3FT9PT/ S3FT9PS 16-bit ISC Microcontroller for Smart Card with optional Secure RSA/ECC/SHA Libraries including specific IC Dedicated Software (révision 0)
scheme NL FR
status active archived
not_valid_after 17.08.2027 18.07.2023
not_valid_before 17.08.2022 18.07.2018
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-22-0428014_2%20cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0428014-CR2.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cc-2018-25fr.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SMD_ST33K1M5AM_ST_21_002_vB01_1.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cible-2018_25en.pdf
manufacturer STMicroelectronics Samsung Electronics Co., Ltd.
manufacturer_web https://www.st.com/ https://www.samsung.com
security_level EAL6+, ALC_FLR.1 EAL5+, ALC_DVS.2, AVA_VAN.5
dgst 1e7fe9a44df65612 eeb88804be0df26e
heuristics/cert_id NSCIB-CC-0428014-CR2 ANSSI-CC-2018/25
heuristics/cert_lab CEA
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ATE_FUN.2, ALC_TAT.3, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ALC_CMC.5, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions - 16, 0
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2019/18
heuristics/report_references/directly_referencing {} ANSSI-CC-2014/58
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2019/18
heuristics/report_references/indirectly_referencing {} ANSSI-CC-2014/37, ANSSI-CC-2014/58, ANSSI-CC-2013/23
heuristics/scheme_data
heuristics/protection_profiles cf0f01bcd7be3e9c 6e69d65d60f25c99
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/PKISKPP v1.1.pdf
pdf_data/cert_filename NSCIB-CC-22-0428014_2 cert.pdf
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL2: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR.1: 1
    • ALC_FLR.3: 2
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
  • R:
    • R.L: 1
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 1
    • ISO/IEC 15408-2: 1
    • ISO/IEC 15408-3: 1
    • ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: kruitr
  • /CreationDate: D:20220915123924+02'00'
  • /Creator: Bullzip PDF Printer (11.0.0.2588)
  • /ModDate: D:20220915124007+02'00'
  • /Producer: PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH
  • /Title: Microsoft Word - NSCIB-CC-22-0428014_2 cert.doc
  • pdf_file_size_bytes: 245992
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-0428014-CR2.pdf anssi-cc-2018-25fr.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
    • cert_id: NSCIB-CC-0428014-CR2
    • cert_item: ST33K1M5A and ST33K1M5M B01
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
  • FR:
    • cc_security_level: EAL 5 augmenté ALC_DVS.2, AVA_VAN.5
    • cc_version: Critères Communs version 3.1 révision 5
    • cert_id: ANSSI-CC-2018/25
    • cert_item: Samsung S3FT9PF/ S3FT9PT/ S3FT9PS 16-bit ISC Microcontroller for Smart Card with optional Secure RSA/ECC/SHA Libraries including specific IC Dedicated Software
    • cert_item_version: révision 0
    • cert_lab: CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France
    • developer: Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330, Corée du Sud Commanditaire Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330, Corée du Sud
    • match_rules: ['Référence du rapport de certification(.+)Nom du produit(.+)Référence/version du produit(.+)Conformité à un profil de protection(.+)Critères d’évaluation et version(.+)Niveau d’évaluation(.+)Développeur (.+)Centre d’évaluation(.+)Accords de reconnaissance applicables']
    • ref_protection_profiles: PP0035] : Security IC platform Protection Profile Version 1.0
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-0428014-CR2: 12
  • FR:
    • ANSSI-CC-2014/58: 3
    • ANSSI-CC-2018/25: 18
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0035-2007: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 2
  • EAL:
    • EAL 1: 1
    • EAL 3: 1
    • EAL 5: 3
    • EAL 7: 1
    • EAL2: 2
    • EAL5+: 1
    • EAL6: 1
    • EAL7: 1
  • ITSEC:
    • ITSEC E6 Elevé: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 2
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_FSP: 1
    • ADV_IMP: 1
    • ADV_INT: 1
    • ADV_SPM: 1
    • ADV_TDS: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_PRE: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMS: 1
    • ALC_DEL: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_FLR: 2
    • ALC_TAT: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_ECD: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_REQ: 1
    • ASE_SPD: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.5: 3
pdf_data/report_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 3
  • Samsung:
    • Samsung: 17
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
  • CEA-LETI:
    • CEA - LETI: 1
  • CESTI:
    • CESTI: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 2
  • TRNG:
    • DTRNG: 7
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 4
  • TORNADO:
    • TORNADO: 5
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 2
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 31: 2
    • AIS 34: 1
    • AIS34: 1
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
    • CCMB-2017-04-004: 1
pdf_data/report_metadata
  • /Category: revision 0
  • /Comments: Samsung Electronics Co. Ltd.
  • /Company: SGDSN/ANSSI
  • /CreationDate: D:20180727164703+02'00'
  • /Creator: Acrobat PDFMaker 11 pour Word
  • /Keywords: ANSSI-CC-CER-F-07.026
  • /ModDate: D:20180730165817+02'00'
  • /Producer: Adobe PDF Library 11.0
  • /SourceModified: D:20180727144649
  • /Subject:
  • /Title:
  • pdf_file_size_bytes: 333511
  • pdf_hyperlinks: http://www.ssi.gouv.fr/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 17
pdf_data/st_filename SMD_ST33K1M5AM_ST_21_002_vB01_1.pdf anssi-cible-2018_25en.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 1
    • BSI-CC-PP-0084-2014: 63
  • BSI:
    • BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL6: 23
    • EAL6 augmented: 2
    • EAL6+: 1
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 2
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 4
    • ADV_SPM.1: 3
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 3
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 3
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.1: 6
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL: 4
    • ASE_CCL.1: 1
    • ASE_ECD: 4
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 12
    • ASE_OBJ.2: 1
    • ASE_REQ: 31
    • ASE_REQ.2: 1
    • ASE_SPD: 9
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 3
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.4: 2
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAR.1: 26
    • FAU_SAS: 2
    • FAU_SAS.1: 26
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 4
    • FCS_COP.1: 17
    • FCS_RNG: 2
    • FCS_RNG.1: 6
  • FDP:
    • FDP_ACC.1: 23
    • FDP_ACC.2: 14
    • FDP_ACF.1: 31
    • FDP_IFC.1: 17
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 10
    • FDP_SDC: 2
    • FDP_SDC.1: 6
    • FDP_SDI.2: 13
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 16
    • FDP_UIT.1: 16
  • FIA:
    • FIA_API: 2
    • FIA_API.1: 6
    • FIA_UAU.1: 14
    • FIA_UID.1: 16
  • FMT:
    • FMT_LIM: 2
    • FMT_LIM.1: 29
    • FMT_LIM.2: 30
    • FMT_MSA.1: 28
    • FMT_MSA.3: 28
    • FMT_SMF.1: 25
    • FMT_SMR.1: 17
  • FPT:
    • FPT_FLS.1: 24
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 11
  • FTP:
    • FTP_ITC.1: 28
    • FTP_TRP.1: 2
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM: 9
    • FCS_CKM.1: 26
    • FCS_CKM.2: 4
    • FCS_CKM.4: 14
    • FCS_COP: 33
    • FCS_COP.1: 24
    • FCS_RNG: 6
    • FCS_RNG.1: 14
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 14
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 10
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 11
    • FDP_ITC.2: 11
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_CKM.4: 1
    • FMT_LIM: 8
    • FMT_LIM.1: 24
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 28
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 9
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.C: 4
    • O.RND: 4
    • O.TOE-: 1
  • R:
    • R.O: 4
  • T:
    • T.RND: 3
  • O:
    • O.MEM_ACCESS: 1
    • O.RND: 5
    • O.RNG: 1
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Infineon:
    • Infineon Technologies: 1
  • Philips:
    • Philips: 1
  • STMicroelectronics:
    • STMicroelectronics: 22
  • Samsung:
    • Samsung: 3
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 13
      • AES-128: 1
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 5
    • DES:
      • DES: 19
  • AES_competition:
    • AES:
      • AES: 15
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 9
  • constructions:
    • MAC:
      • HMAC: 2
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 25
    • ECDH:
      • ECDH: 7
    • ECDSA:
      • ECDSA: 14
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
  • RSA:
    • RSA-CRT: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 1
      • SHA1: 3
    • SHA2:
      • SHA-224: 2
      • SHA-256: 2
      • SHA-384: 2
      • SHA-512: 2
      • SHA224: 6
      • SHA256: 6
      • SHA384: 6
      • SHA512: 5
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 7
    • RNG: 6
  • TRNG:
    • TRNG: 4
  • RNG:
    • RND: 10
    • RNG: 3
  • TRNG:
    • DTRNG: 23
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • ECB:
    • ECB: 7
  • ECB:
    • ECB: 3
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP192t1: 4
    • brainpoolP224r1: 4
    • brainpoolP224t1: 4
    • brainpoolP256r1: 4
    • brainpoolP256t1: 4
    • brainpoolP320r1: 4
    • brainpoolP320t1: 4
    • brainpoolP384r1: 4
    • brainpoolP384t1: 4
    • brainpoolP512r1: 4
    • brainpoolP512t1: 4
  • NIST:
    • P-192: 8
    • P-224: 8
    • P-256: 6
    • P-384: 8
    • secp192k1: 4
    • secp192r1: 4
    • secp224k1: 4
    • secp224r1: 4
    • secp256k1: 4
    • secp256r1: 4
    • secp384r1: 4
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 4
  • TORNADO:
    • TORNADO: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 13
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 14
    • Physical Probing: 4
    • physical probing: 3
    • side channel: 2
  • other:
    • JIL: 69
  • FI:
    • DFA: 5
    • Malfunction: 27
    • fault injection: 2
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 9
    • Leak-Inherent: 23
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 8
    • physical probing: 9
    • side channel: 2
    • side-channel: 2
    • timing attack: 5
    • timing attacks: 1
  • other:
    • reverse engineering: 2
pdf_data/st_keywords/cplc_data
  • ICVersion:
    • IC Version: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 22
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS PUB 197: 3
  • ISO:
    • ISO/IEC 14888: 2
    • ISO/IEC 7816-3: 1
    • ISO/IEC 9796: 1
    • ISO/IEC 9796-2: 1
  • NIST:
    • NIST SP 800-38A: 2
    • NIST SP 800-67: 3
    • SP 800-38A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 2
  • BSI:
    • AIS31: 4
    • BSI-AIS31: 5
  • CC:
    • CCMB-2017-04-001: 3
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS PUB 180-3: 6
    • FIPS197: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1
    • ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation: 1
    • Security IC Embedded Software (ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 46 The user guidance documentation, part of the TOE: 1
    • The TOE also provides a 16- and 32-bit CRC calculation block (ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation. 41 Figure 1 provides an overview of the ST33K1M5A and ST33K1M5M B01. Figure 1: 1
    • out of scope: 2
pdf_data/st_metadata
  • /Author: Christiane DROULERS
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  • /Title: SMD_ST33K1M5AM_VB01_1P.book
  • pdf_file_size_bytes: 702053
  • pdf_hyperlinks: http://www.st.com
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  • pdf_number_of_pages: 83
  • /CreationDate: D:20180320160628+09'00'
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  • /Producer: Microsoft® Word 2010
  • /Title:
  • pdf_file_size_bytes: 836157
  • pdf_hyperlinks: http://www.ecc-brainpool.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 68
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