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Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810
JISEC-CC-CRP-C0005 		S3CC924/ S3CC928 16-bit RISC Microcontroller for Smart Card, Revision 1
BSI-DSZ-CC-0548-2008
name Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810 S3CC924/ S3CC928 16-bit RISC Microcontroller for Smart Card, Revision 1
category Multi-Function Devices ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 10.12.2010 01.09.2019
not_valid_before 16.03.2004 11.12.2008
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0005.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0548a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0548b.pdf
manufacturer Toshiba TEC Corporation Samsung Electronics Co., Ltd.
manufacturer_web https://www.toshibatec.co.jp/en/ https://www.samsung.com
security_level EAL2 EAL5+, AVA_MSU.3, ALC_DVS.2, AVA_VLA.4
dgst 1ca981c1dbed4283 cb12161b6239180f
heuristics/cert_id JISEC-CC-CRP-C0005 BSI-DSZ-CC-0548-2008
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ALC_LCD.2, AGD_USR.1, ALC_DVS.2, AVA_SOF.1, ATE_COV.2, ATE_DPT.2, AGD_ADM.1, ADV_INT.1, ADV_RCR.2, ATE_FUN.1, ADV_IMP.2, ALC_TAT.2, ADV_HLD.3, AVA_VLA.4, ADV_SPM.3, ATE_IND.2, ADV_LLD.1, ADV_FSP.3, AVA_CCA.1, AVA_MSU.3
heuristics/extracted_versions 2.0 16, 1
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0483-2008
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0483-2008, BSI-DSZ-CC-0438-2007, BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0451-2007
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0195
  • certification_date:
  • claim: EAL3
  • enhanced:
    • assurance_level: EAL3
    • cc_version: 3.1
    • description: PRODUCT DESCRIPTION Description of TOE The TOE is the system software of the digital multi function device “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” manufactured by TOSHIBA TEC CORPORATION. The TOE controls general functions as a digital multi function device (Copy, Scan, Print and Fax), and provides functions of e-Filing Box and Shared folder. TOE Security functions The TOE provides function of data overwrite and complete deletion on the user document data deleted from HDD in the “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” (except following data: fax reception; expired user document data stored in e-Filing Box and Shared folder after such data’s effective period). The function of data overwrite and complete deletion includes the function to collectively and completely delete all user document data from the HDD before the HDD is disposed or replaced. This function also prevents unauthorized restore of data.
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center
    • product: Japanese: e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C System Software English: System Software for e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C
    • product_type: data protection function in Multi Function Device
    • toe_version: V3.0
    • vendor: TOSHIBA TEC CORPORATION
  • expiration_date: 01.03.2013
  • supplier: TOSHIBA TEC CORPORATION
  • toe_japan_name: e-STUDIO2330C/2820C/2830C/ 3520C/3530C/4520C System Software V3.0
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0195_it8200.html
  • toe_overseas_name: System Software for e-STUDIO2330C/ 2820C/2830C/3520C/3530C/4520C V3.0
maintenance_updates
pdf_data/report_filename c0005.pdf 0548a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0548-2008
    • cert_item: S3CC924/ S3CC928 16-bit RISC Microcontroller for Smart Card, Revision 1
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0005: 1
  • DE:
    • BSI-DSZ-CC-0483-2008: 2
    • BSI-DSZ-CC-0548: 1
    • BSI-DSZ-CC-0548-2008: 19
  • NL:
    • CC-0548: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 5
    • EAL 5: 4
    • EAL 5 augmented: 3
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.3: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_FSP.3: 1
    • ADV_HLD: 2
    • ADV_HLD.3: 1
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_INT: 2
    • ADV_INT.1: 1
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_RCR.2: 1
    • ADV_SPM: 2
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 2
    • ALC_TAT: 2
    • ALC_TAT.2: 2
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_DPT.2: 1
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_CCA.1: 1
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 16
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 6
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 20: 3
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 1
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 1
    • AIS 38: 1
    • AIS20: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 16-bit RISC Microcontroller For Smart Cards, Version 1.5, 22nd October 2008, Samsung Electronics (confidential document) [7] EVALUATION TECHNICAL REPORT-SUMMARY (ETR SUMMARY), 8104491414 / BSI-DSZ-CC-0548, S3CC924/928: 1
    • 2, TÜViT (confidential document) [8] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Choctaw (S3CC924/928: 1
    • EVALUATION (ETR-COMP), 8104491414 / BSI-DSZ- CC-0548, S3CC924/928, Version 2, 2008-11-28, TÜViT (confidential document) 8 specifically • AIS 20, Version 1, 2 December 1999, Funktionalitätsklassen und: 1
    • Version 1.2, 2008-10-22, Samsung Electronics (confidential document) [9] Security Target Lite of S3CC924/S3CC928 16-bit RISC Microcontroller For Smart Cards, Version 1: 1
pdf_data/report_metadata
  • /CreationDate: D:20040526154004+09'00'
  • /ModDate: D:20040526154004+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 13611
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20081219094826+01'00'
  • /Creator: Writer
  • /Keywords: "Samsung Electronics Co., Ltd, S3CC924/ S3CC928 16-bit RISC Microcontroller for Smart Card, Revision 1"
  • /ModDate: D:20081219104932+01'00'
  • /Producer: StarOffice 8
  • /Subject: Common Criteria
  • /Title: Certification Report BSI-DSZ-CC-0548-2008
  • pdf_file_size_bytes: 503285
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename 0548b.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL4: 9
    • EAL4 augmented: 1
    • EAL5: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.3: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_IMP.2: 4
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 3
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 3
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.2: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA.1: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 12
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 1
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP: 2
    • FCS_COP.1: 13
    • FCS_COP.1.1: 1
    • FCS_RND: 3
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 18
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 19
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 10
    • FDP_ITC.1.1: 1
    • FDP_ITC.1.2: 1
    • FDP_ITC.1.3: 1
    • FDP_ITC.2: 11
    • FDP_ITC.2.1: 1
    • FDP_ITC.2.2: 1
    • FDP_ITC.2.3: 1
    • FDP_ITC.2.4: 1
    • FDP_ITC.2.5: 1
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 11
    • FMT_MSA.2.1: 1
    • FMT_MSA.3: 12
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 7
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 1
    • FTP_TRP.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 14
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 2
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 1
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 2
    • AIS20: 4
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 7816: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: KyungSuk YI (Bryant)
  • /CreationDate: D:20081027164129+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Security Target of S3CC924/S3CC928 16-bit RISC Microcontroller For Smart Cards, CC EAL5+, Samsung Electroncis, SmartCard IC, Common Criteria version 2.3
  • /ModDate: D:20081027170110+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Subject: Security Target Lite (Common Criteria EAL5+)
  • /Title: Security Target Lite of S3CC924/28 16-bit RISC Microcontroller For Smart Cards
  • pdf_file_size_bytes: 494647
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 56
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different