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Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810
JISEC-CC-CRP-C0005
NXP Smart Card Controller P5CD080V0C, P5CN080V0C, P5CC080V0C, P5CC073V0C each with IC Dedicated Software
BSI-DSZ-CC-0625-2010
name Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810 NXP Smart Card Controller P5CD080V0C, P5CN080V0C, P5CC080V0C, P5CC073V0C each with IC Dedicated Software
category Multi-Function Devices ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 10.12.2010 01.09.2019
not_valid_before 16.03.2004 11.06.2010
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0005.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0625a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0625b_pdf.pdf
manufacturer Toshiba TEC Corporation NXP Semiconductors
manufacturer_web https://www.toshibatec.co.jp/en/ https://www.nxp.com/
security_level EAL2 ADV_IMP.2, ATE_DPT.2, AVA_VLA.4, AVA_MSU.3, EAL4+
dgst 1ca981c1dbed4283 ade8ca8ad8cb9336
heuristics/cert_id JISEC-CC-CRP-C0005 BSI-DSZ-CC-0625-2010
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ADV_HLD.3, ALC_LCD.2, ATE_COV.2, AVA_VLA.4, ATE_DPT.2, ADV_SPM.3, AVA_SOF.1, AGD_USR.1, ATE_IND.2, ADV_LLD.1, ALC_DVS.2, ADV_FSP.3, ADV_IMP.2, AVA_CCA.1, ADV_INT.1, ALC_TAT.2, AVA_MSU.3
heuristics/extracted_versions 2.0 -
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0410-2007
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0404-2007, BSI-DSZ-CC-0410-2007
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0195
  • certification_date:
  • claim: EAL3
  • enhanced:
    • assurance_level: EAL3
    • cc_version: 3.1
    • description: PRODUCT DESCRIPTION Description of TOE The TOE is the system software of the digital multi function device “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” manufactured by TOSHIBA TEC CORPORATION. The TOE controls general functions as a digital multi function device (Copy, Scan, Print and Fax), and provides functions of e-Filing Box and Shared folder. TOE Security functions The TOE provides function of data overwrite and complete deletion on the user document data deleted from HDD in the “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” (except following data: fax reception; expired user document data stored in e-Filing Box and Shared folder after such data’s effective period). The function of data overwrite and complete deletion includes the function to collectively and completely delete all user document data from the HDD before the HDD is disposed or replaced. This function also prevents unauthorized restore of data.
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center
    • product: Japanese: e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C System Software English: System Software for e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C
    • product_type: data protection function in Multi Function Device
    • toe_version: V3.0
    • vendor: TOSHIBA TEC CORPORATION
  • expiration_date: 01.03.2013
  • supplier: TOSHIBA TEC CORPORATION
  • toe_japan_name: e-STUDIO2330C/2820C/2830C/ 3520C/3530C/4520C System Software V3.0
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0195_it8200.html
  • toe_overseas_name: System Software for e-STUDIO2330C/ 2820C/2830C/3520C/3530C/4520C V3.0
heuristics/protection_profiles {} f6d23054061d72ba
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0005.pdf 0625a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0625-2010
    • cert_item: NXP Smart Card Controller P5CD080V0C, P5CN080V0C, P5CC080V0C, P5CC073V0C each with IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0005: 1
  • DE:
    • BSI-DSZ-CC-0410-2007: 3
    • BSI-DSZ-CC-0625: 2
    • BSI-DSZ-CC-0625-2010: 20
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 1
  • EAL:
    • EAL 4: 5
    • EAL 5: 4
    • EAL 5 augmented: 3
    • EAL1: 6
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 19
    • NXP Semiconductors: 15
  • Philips:
    • Philips: 1
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 7
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 6
    • DES:
      • DEA: 1
      • DES: 5
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • SPA: 1
    • physical probing: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 20: 1
    • AIS 25: 3
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 1
    • AIS 36: 2
    • AIS 38: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 1.1, February 1st, 2010, (confidential document) [8] Configuration List of the P5CD080/ P5CC80/ P5CN080/ P5CC073 V0C, NXP Semiconductors, Rev. 1.0: 1
    • 11th, 2009 (confidential document) [9] Security Target Lite BSI-DSZ-0625-2009, Evaluation of the NXP P5CD080V0C, P5CN080V0C: 1
    • Card Controllers, NXP Semiconductors, Business Line Identification, Version 1.0, June 8th, 2009 (confidential document) [7] Evaluation Technical Report BSI-DSZ-CC-0625 NXP P5CD080V0C Secure Smart Card Controller: 1
pdf_data/report_metadata
  • /CreationDate: D:20040526154004+09'00'
  • /ModDate: D:20040526154004+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 13611
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20100625110718+02'00'
  • /Creator: Writer
  • /Keywords: NXP Smart Card Controller P5CD080V0C, P5CN080V0C, P5CC080V0C, P5CC073V0C each with IC Dedicated Software, NXP Semiconductors Germany GmbH, Common Criteria, Zertifizierung, CC, Certification
  • /ModDate: D:20100629151150+02'00'
  • /Producer: OpenOffice.org 3.1
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0625-2010
  • pdf_file_size_bytes: 528053
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename 0625b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0625-2009: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 5: 4
    • EAL 5 augmented: 2
    • EAL4: 4
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL5: 34
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 5
    • ACM_SCP.2: 3
    • ACM_SCP.3: 5
  • ADO:
    • ADO_DEL: 3
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 6
    • ADV_FSP.2: 3
    • ADV_FSP.3: 6
    • ADV_HLD: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 5
    • ADV_SPM: 1
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 4
    • AGD_USR: 3
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 1
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA.1: 1
    • AVA_MSU: 2
    • AVA_MSU.3: 1
    • AVA_SOF.1: 2
    • AVA_VLA.4: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM: 1
    • FCS_CKM.1: 4
    • FCS_CKM.4: 4
    • FCS_COP: 1
    • FCS_COP.1: 22
    • FCS_COP.1.1: 2
    • FCS_RND.1: 2
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 27
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 26
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 9
    • FDP_ITC: 1
    • FDP_ITC.1: 3
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA: 1
    • FMT_MSA.1: 26
    • FMT_MSA.1.1: 2
    • FMT_MSA.2: 3
    • FMT_MSA.3: 20
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF: 1
    • FMT_SMF.1: 10
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 6
    • FPT_ITT.1: 5
    • FPT_PHP.3: 7
    • FPT_SEP.1: 15
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
  • FRU:
    • FRU_FLT: 2
    • FRU_FLT.2: 5
pdf_data/st_keywords/cc_claims
  • O:
    • O.CONFI: 1
    • O.CONFIG: 5
    • O.H: 2
    • O.HW: 1
    • O.HW_AE: 1
    • O.HW_AES: 2
    • O.M: 1
    • O.MEM_ACCES: 1
    • O.MEM_ACCESS: 6
    • O.MF_FW: 7
    • O.P: 1
    • O.RND: 3
    • O.SFR: 1
    • O.SFR_ACCE: 1
    • O.SFR_ACCESS: 6
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 90
    • NXP Semiconductors: 14
  • Philips:
    • Philips: 3
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 37
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 1
      • DES: 26
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 9
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CCM:
    • CCM: 2
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 7
    • fault injection: 4
    • malfunction: 1
  • SCA:
    • DPA: 1
    • Leak-Inherent: 9
    • Physical Probing: 1
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 3
  • CC:
    • CCMB-2005-08-002: 1
    • CCMB-2005-08-004: 1
  • FIPS:
    • FIPS PUB 19: 1
    • FIPS PUB 197: 2
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: CRe
  • /Company: NXP Semiconductors Germany GmbH
  • /CreationDate: D:20100629123013+02'00'
  • /Creator: Acrobat PDFMaker 8.1 for Word
  • /Keywords: Security Target Lite; SmartMX; P5CD080V0C; P5CN080V0C; P5CN080V0C; P5CC073V0C; NXP; EAL5+; AVA_VLA.4; BSI-DSZ-CC-0625-2009; AES; DES
  • /Manager: Stefan Philipp
  • /ModDate: D:20100629131840+02'00'
  • /Producer: Acrobat Distiller 8.1.0 (Windows)
  • /SourceModified: D:20090714141753
  • /Subject: Common Criteria Evaluation of SmatMX Crypto Controller
  • /Title: Security Target Lite - P5CD080V0C/ P5CN080V0C/ P5CC080V0C/ P5CC073V0C
  • pdf_file_size_bytes: 650325
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 74
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different