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	Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810 JISEC-CC-CRP-C0005	S3CC9PF 16-bit RISC Microcontroller for Smart Card, Revision 2 BSI-DSZ-CC-0547-2009
name	Scrambler Board GP-1010 V2.0 for the e-STUDIO 550/650/810	S3CC9PF 16-bit RISC Microcontroller for Smart Card, Revision 2
category	Multi-Function Devices	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	JP	DE
status	archived	archived
not_valid_after	10.12.2010	01.09.2019
not_valid_before	16.03.2004	04.11.2009
cert_link	None	None
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0005.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547a_pdf.pdf
st_link		https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547b_pdf.pdf
manufacturer	Toshiba TEC Corporation	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.toshibatec.co.jp/en/	https://www.samsung.com
security_level	EAL2	EAL5+
dgst	1ca981c1dbed4283	37da977e92a14021
heuristics/cert_id	JISEC-CC-CRP-C0005	BSI-DSZ-CC-0547-2009
heuristics/cert_lab	[]	BSI
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	{}	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions	2.0	16, 2
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	BSI-DSZ-CC-0639-2010
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	BSI-DSZ-CC-0720-2011, KECS-ISIS-0533-2014, ANSSI-CC-2012/70, BSI-DSZ-CC-0801-2012, KECS-ISIS-0456-2013, BSI-DSZ-CC-0895-2014, BSI-DSZ-CC-0882-2013, BSI-DSZ-CC-0802-2012, KECS-ISIS-0513-2014, BSI-DSZ-CC-0720-V2-2016, KECS-ISIS-0435-2013, BSI-DSZ-CC-0639-2010, KECS-ISIS-0675-2015, KECS-ISIS-0490-2014, BSI-DSZ-CC-0719-V2-2016, BSI-DSZ-CC-0894-2014, BSI-DSZ-CC-0719-2011, KECS-ISIS-0468-2013, BSI-DSZ-CC-0882-V2-2019, KECS-ISIS-0394-2012, ANSSI-CC-2012/72
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	cert_id: JISEC-CC-CRP-C0195 certification_date: claim: EAL3 enhanced: assurance_level: EAL3 cc_version: 3.1 description: PRODUCT DESCRIPTION Description of TOE The TOE is the system software of the digital multi function device “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” manufactured by TOSHIBA TEC CORPORATION. The TOE controls general functions as a digital multi function device (Copy, Scan, Print and Fax), and provides functions of e-Filing Box and Shared folder. TOE Security functions The TOE provides function of data overwrite and complete deletion on the user document data deleted from HDD in the “e-STUDIO2330C/2820C/2830C/3520C/3530C/4520C” (except following data: fax reception; expired user document data stored in e-Filing Box and Shared folder after such data’s effective period). The function of data overwrite and complete deletion includes the function to collectively and completely delete all user document data from the HDD before the HDD is disposed or replaced. This function also prevents unauthorized restore of data. evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center product: Japanese: e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C System Software English: System Software for e-STUDIO 2330C/2820C/2830C/ 3520C/3530C/4520C product_type: data protection function in Multi Function Device toe_version: V3.0 vendor: TOSHIBA TEC CORPORATION expiration_date: 01.03.2013 supplier: TOSHIBA TEC CORPORATION toe_japan_name: e-STUDIO2330C/2820C/2830C/ 3520C/3530C/4520C System Software V3.0 toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0195_it8200.html toe_overseas_name: System Software for e-STUDIO2330C/ 2820C/2830C/3520C/3530C/4520C V3.0
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates		maintenance_date: 05.01.2010 maintenance_report_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547_ma1a_pdf.pdf maintenance_st_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547_ma1b_pdf.pdf maintenance_title: S3CC9PW 16-bit RISC Microcontroller for Smart Card, Revision 0 maintenance_date: 03.03.2010 maintenance_report_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547_ma2a_pdf.pdf maintenance_st_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0547_ma2b_pdf.pdf maintenance_title: S3CC9PF 16-bit RISC Microcontroller for Smart Card, Revision 7
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	None	None
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
pdf_data/cert_keywords/cc_sar
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
pdf_data/report_filename	c0005.pdf	0547a_pdf.pdf
pdf_data/report_frontpage	DE:	DE: cert_id: BSI-DSZ-CC-0547-2009 cert_item: S3CC9PF 16-bit RISC Microcontroller for Smart Card, Revision 2 cert_lab: BSI developer: Samsung Electronics Co., Ltd match_rules: *['(BSI-DSZ-CC-.+?) (?:for\|For) (.+?) from (.)']**
pdf_data/report_keywords/cc_cert_id	JP: Certification No. C0005: 1	DE: BSI-DSZ-CC-0547-2009: 19
pdf_data/report_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0035: 1 BSI-CC-PP-0035-2007: 3
pdf_data/report_keywords/cc_security_level	EAL: EAL2: 1	EAL: EAL 1: 1 EAL 4: 5 EAL 5: 4 EAL 5 augmented: 3 EAL 7: 1 EAL1: 6 EAL2: 3 EAL3: 4 EAL4: 5 EAL5: 6 EAL5+: 1 EAL6: 3 EAL7: 4
pdf_data/report_keywords/cc_sar		ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_FSP: 1 ADV_FSP.1: 1 ADV_FSP.2: 1 ADV_FSP.3: 1 ADV_FSP.4: 1 ADV_FSP.5: 1 ADV_FSP.6: 1 ADV_IMP: 1 ADV_IMP.1: 1 ADV_IMP.2: 1 ADV_INT: 1 ADV_INT.1: 1 ADV_INT.2: 1 ADV_INT.3: 1 ADV_SPM: 1 ADV_SPM.1: 1 ADV_TDS: 1 ADV_TDS.1: 1 ADV_TDS.2: 1 ADV_TDS.3: 1 ADV_TDS.4: 1 ADV_TDS.5: 1 ADV_TDS.6: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 1 AGD_PRE: 1 AGD_PRE.1: 1 ALC: ALC_CMC: 2 ALC_CMC.1: 1 ALC_CMC.2: 1 ALC_CMC.3: 1 ALC_CMC.4: 2 ALC_CMC.5: 1 ALC_CMS: 1 ALC_CMS.1: 1 ALC_CMS.2: 1 ALC_CMS.3: 1 ALC_CMS.4: 1 ALC_CMS.5: 2 ALC_DEL: 1 ALC_DEL.1: 2 ALC_DVS: 1 ALC_DVS.1: 2 ALC_DVS.2: 6 ALC_FLR: 1 ALC_FLR.1: 1 ALC_FLR.2: 1 ALC_FLR.3: 1 ALC_LCD.1: 2 ALC_LCD.2: 1 ALC_TAT: 1 ALC_TAT.1: 1 ALC_TAT.2: 2 ALC_TAT.3: 1 APE: APE_CCL.1: 1 APE_ECD.1: 1 APE_INT.1: 1 APE_OBJ.1: 1 APE_OBJ.2: 1 APE_REQ.1: 1 APE_REQ.2: 1 APE_SPD.1: 1 ASE: ASE_CCL: 1 ASE_CCL.1: 1 ASE_ECD: 1 ASE_ECD.1: 1 ASE_INT: 1 ASE_INT.1: 1 ASE_OBJ: 1 ASE_OBJ.1: 1 ASE_OBJ.2: 1 ASE_REQ.1: 1 ASE_REQ.2: 1 ASE_SPD: 1 ASE_SPD.1: 1 ASE_TSS: 1 ASE_TSS.1: 1 ASE_TSS.2: 1 ATE: ATE_COV: 1 ATE_COV.1: 1 ATE_COV.2: 1 ATE_COV.3: 1 ATE_DPT: 1 ATE_DPT.1: 1 ATE_DPT.2: 1 ATE_DPT.3: 1 ATE_DPT.4: 1 ATE_FUN: 1 ATE_FUN.1: 1 ATE_FUN.2: 1 ATE_IND: 1 ATE_IND.1: 1 ATE_IND.2: 1 ATE_IND.3: 1 AVA: AVA_VAN: 2 AVA_VAN.1: 1 AVA_VAN.2: 1 AVA_VAN.3: 1 AVA_VAN.4: 1 AVA_VAN.5: 6
pdf_data/report_keywords/cc_sfr		FCS: FCS_COP.1: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		Samsung: Samsung: 16
pdf_data/report_keywords/eval_facility		TUV: TÜV Informationstechnik: 2 TÜViT: 2
pdf_data/report_keywords/symmetric_crypto		AES_competition: AES: AES: 4 DES: 3DES: Triple-DES: 4 DES: DES: 6
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness		RNG: RNG: 1 TRNG: TRNG: 7
pdf_data/report_keywords/cipher_mode		CBC: CBC: 1 ECB: ECB: 1
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine		TORNADO: TORNADO: 1
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis		FI: physical tampering: 1 SCA: DPA: 1 physical probing: 1 side-channel: 1 other: JIL: 4
pdf_data/report_keywords/technical_report_id		BSI: BSI 7125: 2 BSI 7148: 1 BSI 7149: 1 BSI TR-02102: 1
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data		ICFab: IC Fabricator: 1 ICVersion: IC Version: 1
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id		BSI: AIS 20: 2 AIS 25: 2 AIS 26: 2 AIS 31: 1 AIS 32: 1 AIS 34: 2 AIS 35: 2 AIS 36: 2 AIS 38: 1 AIS20: 1 AIS31: 4
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process		ConfidentialDocument: Definition (Class ALC_CMC.4/CMS.5) – Project Chippewa, Version 1.5, 2009-05-15,Samsung Electronics(confidential document) [12] User’s manual S3CC9PF Family (S3CC9PF/AF/PW) 16-Bit CMOS Microcontroller for Smart Card: 1 Microcontroller for Smart Cards, Version 2.2 from 2009-04-22 Project Chippewa, Samsung Electronics (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15.06.2007, registered and certified by: 1 TECHNICAL REPORT-SUMMARY (ETR SUMMARY) for the product S3CC9PF, Version 1 from 2009-09-04, TÜViT (confidential document) [10] ETR FOR COMPOSITE EVALUATION (ETR-COMP) according to AIS 36 for the Product S3CC9PF, Version: 1 from 2009-09-04, Version 1 from 2009-09-04, TÜViT (confidential document) 8 specifically • AIS 20, Version 1, 2. December 1999, Funktionalitätsklassen und: 1
pdf_data/report_metadata	/CreationDate: D:20040526154004+09'00' /ModDate: D:20040526154004+09'00' /Producer: Acrobat Distiller 6.0 (Windows) /Title: untitled pdf_file_size_bytes: 13611 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: Bundesamt für Sicherheit in der Informationstechnik /CreationDate: D:20091117115143+01'00' /Creator: Writer /Keywords: S3CC9PF 16-bit RISC Microcontroller for Smart Card, Revision 2, Samsung Electronics Co., Ltd, Certification, Common Crtieria /ModDate: D:20091118125353+01'00' /Producer: StarOffice 9 /Subject: Common Criteria Certification /Title: Certification Report BSI-DSZ-CC-0547-2009 pdf_file_size_bytes: 797259 pdf_hyperlinks: http://www.bsi.bund.de/ pdf_is_encrypted: False pdf_number_of_pages: 38
pdf_data/st_filename		0547b_pdf.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id		BSI: BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level		EAL: EAL 4: 1 EAL 4 augmented: 1 EAL 5: 2 EAL 5 augmented: 2 EAL5: 6 EAL5 augmented: 1
pdf_data/st_keywords/cc_sar		ADV: ADV_ARC: 1 ADV_ARC.1: 7 ADV_FSP: 2 ADV_FSP.2: 1 ADV_FSP.4: 1 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.1: 2 ADV_INT.2: 1 ADV_TDS.3: 1 ADV_TDS.4: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 2 AGD_PRE: 1 AGD_PRE.1: 2 ALC: ALC_CMC: 1 ALC_CMC.4: 1 ALC_CMS: 2 ALC_CMS.4: 1 ALC_CMS.5: 3 ALC_DEL: 1 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.1: 1 ALC_DVS.2: 7 ALC_LCD.1: 1 ALC_TAT.2: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN: 2 AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr		FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 8 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM: 1 FCS_CKM.1: 16 FCS_CKM.1.1: 1 FCS_CKM.2: 2 FCS_CKM.4: 7 FCS_COP: 10 FCS_COP.1: 15 FCS_RNG: 11 FCS_RNG.1: 19 FCS_RNG.1.1: 2 FCS_RNG.1.2: 2 FDP: FDP_ACC: 1 FDP_ACC.1: 13 FDP_ACC.1.1: 1 FDP_ACF: 2 FDP_ACF.1: 9 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC: 1 FDP_IFC.1: 18 FDP_IFC.1.1: 1 FDP_IFF.1: 3 FDP_ITC.1: 6 FDP_ITC.2: 6 FDP_ITT: 1 FDP_ITT.1: 17 FDP_ITT.1.1: 1 FDP_SDI.1: 1 FMT: FMT_LIM: 8 FMT_LIM.1: 24 FMT_LIM.1.1: 2 FMT_LIM.2: 28 FMT_LIM.2.1: 2 FMT_MSA: 2 FMT_MSA.1: 9 FMT_MSA.1.1: 1 FMT_MSA.3: 10 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF: 1 FMT_SMF.1: 6 FMT_SMF.1.1: 1 FMT_SMR.1: 6 FPT: FPT_FLS: 1 FPT_FLS.1: 21 FPT_FLS.1.1: 1 FPT_ITT: 1 FPT_ITT.1: 15 FPT_ITT.1.1: 1 FPT_PHP: 3 FPT_PHP.3: 20 FPT_PHP.3.1: 1 FRU: FRU_FLT: 1 FRU_FLT.1: 1 FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims		O: O.RND: 5 T: T.RND: 5
pdf_data/st_keywords/vendor		Samsung: Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto		AES_competition: AES: AES: 14 DES: 3DES: 3DES: 6 T-DES: 1 Triple-DES: 1 DES: DES: 9
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness		RNG: RND: 10 TRNG: TRNG: 14
pdf_data/st_keywords/cipher_mode		ECB: ECB: 3
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine		TORNADO: TORNADO: 8
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis		FI: DFA: 1 Malfunction: 24 malfunction: 11 physical tampering: 2 SCA: DPA: 6 Leak-Inherent: 21 Physical Probing: 4 Physical probing: 2 SPA: 4 physical probing: 9 side-channel: 3 timing attacks: 1 other: reverse engineering: 5
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id		BSI: AIS 20: 1 AIS 31: 2 AIS20: 3 AIS31: 2 FIPS: FIPS 197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata		/Author: KyungSuk YI (Bryant) /CreationDate: D:20090901195327+09'00' /Creator: PScript5.dll Version 5.2.2 /Keywords: Security Target of S3CC9PF 16-bit RISC Microcontroller For Smart Cards, CC EAL5+, Samsung Electroncis, SmartCard IC, Common Criteria version 3.1 /ModDate: D:20090904171734+09'00' /Producer: Acrobat Distiller 6.0.1 (Windows) /Subject: S3CC9PF Common Criteria(version 3.1) EAL5+ Evaluation /Title: Security Target Lite of S3CC9PF 16-bit RISC Microcontroller For Smart Cards pdf_file_size_bytes: 843064 pdf_hyperlinks: {} pdf_is_encrypted: True pdf_number_of_pages: 64
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	False
state/cert/download_ok	False	False
state/cert/extract_ok	False	False
state/cert/pdf_hash	Equal	Equal
state/cert/txt_hash	Equal	Equal
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	False	True
state/st/download_ok	False	True
state/st/extract_ok	False	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different