This page was not yet optimized for use on mobile devices.
Comparing certificates Experimental feature
You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.
Canon iR4570/iR3570/iR2870/iR2270 Series iR Security Kit-B2 Version 2.03 JISEC-CC-CRP-C0036 |
ST Engineering Data Diode Model 328X CSA_CC_20002 |
|
---|---|---|
name | Canon iR4570/iR3570/iR2870/iR2270 Series iR Security Kit-B2 Version 2.03 | ST Engineering Data Diode Model 328X |
category | Other Devices and Systems | Boundary Protection Devices and Systems |
scheme | JP | SG |
status | archived | active |
not_valid_after | 07.10.2013 | 09.06.2025 |
not_valid_before | 09.09.2005 | 10.06.2020 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC%20Certificate%20ST%20Data%20Diode%20328X.pdf | |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0036_ecvr.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Data%20Diode%20328X%20Certification%20Report%20v1.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/STEng%20Data%20Diode%20328X%20Security%20Target_v2.pdf | |
manufacturer | Canon Inc. | ST Engineering Electronics |
manufacturer_web | https://www.canon.com/ | https://www.stengg.com |
security_level | EAL3 | EAL4+, AVA_VAN.5 |
dgst | 0b61e662b1de9f6c | 5ccf6e9e3b708da3 |
heuristics/cert_id | JISEC-CC-CRP-C0036 | CSA_CC_20002 |
heuristics/extracted_sars | {} | ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 |
heuristics/extracted_versions | 2.03 | - |
heuristics/scheme_data |
|
|
pdf_data/cert_filename | CC Certificate ST Data Diode 328X.pdf | |
pdf_data/cert_keywords/cc_cert_id |
|
|
pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
|
|
pdf_data/cert_keywords/cc_sar |
|
|
pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
|
|
pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
|
|
pdf_data/report_filename | c0036_ecvr.pdf | ST Data Diode 328X Certification Report v1.pdf |
pdf_data/report_keywords/cc_cert_id |
|
|
pdf_data/report_keywords/cc_security_level |
|
|
pdf_data/report_keywords/cc_sar |
|
|
pdf_data/report_keywords/cc_claims |
|
|
pdf_data/report_keywords/eval_facility |
|
|
pdf_data/report_keywords/standard_id |
|
|
pdf_data/report_metadata |
|
|
pdf_data/st_filename | STEng Data Diode 328X Security Target_v2.pdf | |
pdf_data/st_keywords/cc_cert_id | ||
pdf_data/st_keywords/cc_protection_profile_id | ||
pdf_data/st_keywords/cc_security_level |
|
|
pdf_data/st_keywords/cc_sar |
|
|
pdf_data/st_keywords/cc_sfr |
|
|
pdf_data/st_keywords/cc_claims |
|
|
pdf_data/st_keywords/vendor | ||
pdf_data/st_keywords/eval_facility | ||
pdf_data/st_keywords/symmetric_crypto | ||
pdf_data/st_keywords/asymmetric_crypto | ||
pdf_data/st_keywords/pq_crypto | ||
pdf_data/st_keywords/hash_function | ||
pdf_data/st_keywords/crypto_scheme | ||
pdf_data/st_keywords/crypto_protocol | ||
pdf_data/st_keywords/randomness | ||
pdf_data/st_keywords/cipher_mode | ||
pdf_data/st_keywords/ecc_curve | ||
pdf_data/st_keywords/crypto_engine | ||
pdf_data/st_keywords/tls_cipher_suite | ||
pdf_data/st_keywords/crypto_library | ||
pdf_data/st_keywords/vulnerability | ||
pdf_data/st_keywords/side_channel_analysis | ||
pdf_data/st_keywords/technical_report_id | ||
pdf_data/st_keywords/device_model | ||
pdf_data/st_keywords/tee_name | ||
pdf_data/st_keywords/os_name | ||
pdf_data/st_keywords/cplc_data | ||
pdf_data/st_keywords/ic_data_group | ||
pdf_data/st_keywords/standard_id | ||
pdf_data/st_keywords/javacard_version | ||
pdf_data/st_keywords/javacard_api_const | ||
pdf_data/st_keywords/javacard_packages | ||
pdf_data/st_keywords/certification_process | ||
pdf_data/st_metadata |
|
|
state/cert/convert_garbage | False | True |
state/cert/convert_ok | False | True |
state/cert/download_ok | False | True |
state/cert/extract_ok | False | True |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/convert_ok | False | True |
state/st/download_ok | False | True |
state/st/extract_ok | False | True |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |